SOLICITATION NOTICE
66 -- Scanning Electron Microscope (SEM) and X-Ray Microanalysis System (EDX)
- Notice Date
- 12/23/2002
- Notice Type
- Solicitation Notice
- Contracting Office
- N00253 610 Dowell Street Keyport, WA
- ZIP Code
- 00000
- Solicitation Number
- N0025303R0008
- Archive Date
- 2/21/2003
- Point of Contact
- Melanie Powers (360) 315-3384
- E-Mail Address
-
Email your questions to powersm@kpt.nuwc.navy.mil
(powersm@kpt.nuwc.navy.mil)
- Description
- The Naval Undersea Warfare Center Division Keyport is soliciting 1 each Scanning Electron Microscope (SEM) and 1 each X-Ray Microanalysis System (EDX). The system (both items together) shall be a complete and functional system consisting of an electron source, an electron optical system, a secondary electron detector, a backscattered electron detector, an x-ray detector, a vacuum specimen chamber, a vacuum system, control computer(s), and display monitor(s). A minimum warranty of 12 months shall be provided. The SEM shall have an easily replaceable, pre-centered tungsten filament. The electron source shall be capable of operation at up to 30 kV. The voltage shall be selectable at 100 Volt or less increments below 3 kV, and at 1 kV or less increments from 3 kV to 30 kV. The system shall provide a minimum image resolution of 4.0 nanometers in high vacuum mode and 5.0 nanometer s in variable pressure mode. The vacuum chamber shall be designed to allow for the installation and simultaneous use of a minimum of three detectors and a chamber camera plus additional accessory ports. The following electron detectors shall be supplied with the system: secondary electron (SE), backscattered electron (BSE), and energy dispersive x-ray (EDX). The following chamber ports and accessories shall be supplied with the system: one port shall provide the required geometry and proper take-off angle to be fully compatible with the X-ray detector, one port shall be fitted with an electrical feed-through connection with a minimum of 25 pins, and one port shall be fitted with an integrated camera for full specimen stage imaging. Either a CCD or Infrared (IR) camera is acceptable. The sample chamber shall have internal dimensions sufficient to accommodate samples up to 1 75 mm x 175 mm x 75 mm in size without contacting any internal chamber components. The SEM shall be capable of variable pressure operation without damage to any of the components. The pressure shall cover the minimum range of 10-5 to 2.0 Torr. The computers that control the entire system shall be IBM compatible PCs with integrated mouse and knob control of SEM / EDX functions. The PCs will include the necessary hardware required for networking, color image display, digital storage, read/write capabilities onto compact disks (CD) and floppy disks. All software shall operate within a Microsoft WINDOWS? environment and provide the following: Imaging: The software shall allow for the viewing, digital storage, and printing of digital microscope images along with frame averaging and pixel integration. The software shall also provide frame averaging and pixel integration. Sin gle image memory shall be a minimum of 1024 X 768 pixels. The software shall further include an integrated and calibrated measurement program for quantitative particle image analysis with a minimum of length and angle measurement capabilities. Image adjustments: The software shall provide raster rotation as well as tilt compensation for accurate microscope imaging. Auto-stigmation shall also be provided with the system. Image colorizing capabilities will be provided with the software in addition to brightness and contrast compensation. X-Ray Analysis: The software shall provide full computer control of the SEM / EDX system for X-ray mapping, to acquire X-ray spectra, and to store the data in a permanent data file for later review. Quantitative analysis capabilities shall be provided for a variety of standard industrial X-ray data algorithms, including a least squares da ta fit of standards, plus a standardless semi-quantitative analysis. The SEM shall be supplied with a variety of specimen mounts, including the following: minimum of 10 standard specimen stubs, two vice holders, one for irregular samples up to 1 inch diameter and the second for irregular samples up to 4 inch diameter, and one holder for a mounted metallographic sample (1.5 inch diameter). The SEM shall include electron beam induced current (EBIC) imaging and analysis capabilities, including sufficient signal amplification. The contractor shall provide factory training in all SEM / EDX system operations, functions and maintenance for five instrument operators. The training shall cover all pertinent user functions. The applicable NAICS code for this requirement is 334516 with a size standard of 500 employees. FOB Destination - Place of delivery is Naval Undersea Warfare Cen ter Division Keyport, Keyport, WA 98345-7610. Delivery is required within 60 days after date of contract award. Inspection and acceptance at destination. It is anticipated that the solicitation will be issued by 10 Jan 03. The closing date of the solicitation is anticipated to be 22 Jan 03. This requirement will be procured under FAR Part 12 commercial acquisition procedures utilizing best value evaluation of offers. When issued, the RFQ will be posted electronically on the NUWC Division Keyport, Acquisition Division website. Offerors wishing to submit an offer are responsible for downloading their own copy of the RFQ from this website and to frequently monitor the site for any amendments to the RFQ. No telephone or fax requests for the RFQ package will be accepted; however, an email request for the RFQ package will be accepted in the event an offeror experiences problems dow nloading the RFQ from the NECO website. No bidders list will be maintained by this office. No paper copies of the RFQ / amendments will be mailed. Failure to respond to the electronically posted RFQ and associated amendments prior to the date and time set for receipt of quotes may render your offer nonresponsive and result in rejection of the same. After downloading the solicitation, firms interested in submitting quotes must: (1) complete the pricing, (2) complete all representations and certifications found in the solicitation, (3) identify manufacturer information of proposed items and (4) ensure current registration in the DoD Central Contractor Registration database (http://www.ccr.2000.com/).
- Web Link
-
http://kpt-eco.kpt.nuwc.navy.mil/index.asp
(http://kpt-eco.kpt.nuwc.navy.mil/index.asp)
- Record
- SN00229433-W 20021225/021223213553 (fbodaily.com)
- Source
-
FedBizOpps.gov Link to This Notice
(may not be valid after Archive Date)
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