SOLICITATION NOTICE
66 -- FERROELECTRIC DEVICE TEST SYSTEM
- Notice Date
- 5/28/2003
- Notice Type
- Solicitation Notice
- Contracting Office
- NASA/Langley Research Center, Mail Stop 144, Industry Assistance Office, Hampton, VA 23681-0001
- ZIP Code
- 23681-0001
- Solicitation Number
- 1-213-RBG.1321
- Response Due
- 6/6/2003
- Archive Date
- 5/28/2004
- Point of Contact
- Lionel E Nadeau, Contract Specialist, Phone (757) 864-2434, Fax (757) 864-8863, Email l.e.nadeau@larc.nasa.gov - Terri D Williams, Contract Specialist, Phone (757) 864-2254, Fax (757) 864-7709, Email t.d.williams@larc.nasa.gov
- E-Mail Address
-
Email your questions to Lionel E Nadeau
(l.e.nadeau@larc.nasa.gov)
- Description
- NASA/LaRC has a requirement for one (1) each Ferroelectric Device Test System. The test system provides materials analysis capability for piezoelectric, ferroelectric and pyroelectric devices. Measurement capabilities of the test system include hysteresis, leakage current, fatigue, retention and piezoelectric as well as pyroelectric properties. The system is a self-contained, turnkey unit with a power supply with output voltage ranges from -100 volts to +100 volts and a Personal Computer that controls measurement processes for piezoelectric measurements, data analysis and display. The system has continuously variable pulse and hysteresis settings over its entire ranges of frequencies. Minimum specifications for Ferroelectric Device Test System: 1. Allows hysteresis measurements from 0.03Hz with 1 micro-second rise time at 5 Volts, 1 nano Fared 2. Pulse width is variable from 5 micro-seconds to 1 second 3. Measurement error is 0.5% 4. Leakage measurement resolution less than 12pA at =/- 100 Volts for 250 ms integration time 5. Hysteresis test with triangle input of +/- 100 Volts for 400 micro-seconds for samples up to 50 micro Farads. 6. Polarization vs frequency with minimal distortion is 200 Pico-Coulombs to 5 milli-Coulombs within 1 micro second to 30 seconds time frame 7. An object-oriented system that allows the researcher to combine any test procedures from the library in any order for automatic execution. 8. The test system is contained in a single enclosure for different configurations between different types of test measurements. The same attachments and cable connections execute hysteresis, pulse, and leakage type measurements on the sample. 9. The user can create test signal formats independent of Radiant Technologies' format. 10. The task library includes self-contained tests such as Small Signal Capacitance, Current vs Voltage, and Remanent Polarization measurements in addition to the traditional hysteresis and pulse measurements. NASA/LaRC intends to purchase the test system from Radiant Technologies, Inc. Albuquerque, NM on a sole source basis as no other source is capable of satisfying the government's requirement. The authority for this procurement is FAR 6.302-1. The Government intends to acquire a commercial item using FAR Part 12. Interested organizations may submit their capabilities and qualifications to perform the effort in writing to the identified point of contact not later than 4:30 p.m. local time on June 6, 2003. Such capabilities/qualifications will be evaluated solely for the purpose of determining whether or not to conduct this procurement on a competitive basis. A determination by the Government not to compete this proposed effort on a full and open competition basis, based upon responses to this notice, is solely within the discretion of the government. Oral communications are not acceptable in response to this notice. All responsible sources may submit an offer which shall be considered by the agency. An Ombudsman has been appointed. See NASA Specific Note "B". Any referenced notes may be viewed at the following URLs linked below.
- Web Link
-
Click here for the latest information about this notice
(http://prod.nais.nasa.gov/cgi-bin/eps/bizops.cgi?gr=D&pin=23#105990)
- Record
- SN00333726-W 20030530/030528213657 (fbodaily.com)
- Source
-
FedBizOpps.gov Link to This Notice
(may not be valid after Archive Date)
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