Loren Data's SAM Daily™

FBO DAILY ISSUE OF JULY 27, 2003 FBO #0605
SOLICITATION NOTICE

66 -- Scanning Electron Microscope

Notice Date

7/25/2003
 

Notice Type

Solicitation Notice
 

Contracting Office

Department of Commerce, National Institute of Standards and Technology (NIST), Acquisition and Logistics Division, 100 Bureau Drive, Building 301, Room B129, Mail Stop 3571, Gaithersburg, MD, 20899-3571
 

ZIP Code

20899-3571
 

Solicitation Number

SB1341-03-Q-0707
 

Response Due

8/13/2003
 

Archive Date

8/28/2003
 

Point of Contact

Carol Wood, Contract Specialist, Phone 301-975-8172, Fax 301-975-8884, - Patrick Staines, Contract Specialist, Phone (301)975-6335, Fax (301)975-8884,
 

E-Mail Address

carol.wood@nist.gov, Patrick.Staines@nist.gov
 

Description

THIS IS A COMBINED SYNOPSIS/SOLICITATION FOR COMMERCIAL ITEMS UNDER THE AUTHORITY OF THE FEDERAL ACQUISITION REGULATION (FAR) SUBPART 13.5 TEST PROGRAM FOR CERTAIN COMMERCIAL ITEMS, AND IS PREPARED IN ACCORDANCE WITH THE FORMAT IN FAR SUBPART 12.6-STREAMLINED PROCEDURES FOR EVALUATION AND SOLICITATION FOR COMMERCIAL ITEMS-AS SUPPLEMENTED WITH ADDITIONAL INFORMATION INCLUDED IN THIS NOTICE. THIS ANNOUNCEMENT CONSTITUTES THE ONLY SOLICITATION; QUOTATIONS ARE BEING REQUESTED, AND A WRITTEN SOLICITATION DOCUMENT WILL NOT BE ISSUED. THIS SOLICITATION IS BEING ISSUED USING SIMPLIFIED ACQUISITION PROCEDURES. This solicitation is a Request for Quotation (RFQ). The solicitation document and incorporated provisions and clauses are those in effect through Federal Acquisition Circular 2001-14. *** The associated North American Industrial Classification System (NAICS) code for this procurement is 334516 with a small business size standard of 500 employees. This acquisition is unrestricted and all responsible offerors may submit a quote. ***The National Institute of Standards and Technology (NIST), has a requirement for (1) each Scanning Electron Microscope with X-ray microanalysis and imaging for materials that is equipped with secondary and backscattered electron detectors and is able to operate in high vacuum, low vacuum, and wet modes to enable dynamic experiments involving wetting and drying of hydraulic cements and building stone. This microscope shall be integrated with the x-ray microanalysis and imaging system described in line item 0002 below. ***All interested quoters shall provide a quote for the following line items. The quote shall include the price of the microscope, the microanalysis and imaging system, installation, verification of performance specifications, training and warranty as described below. LINE ITEM 0001: Quantity (1) each Scanning Electron Microscope meeting all of the following required specifications: (1) Operation modes ranging from high vacuum to low-vacuum (133 Pa), and wet mode (665 Pa); (2) Operator-controllable means to introduce and maintain 100% RH water vapor into the SEM chamber during imaging; (3) Peltier stage that is operator-controllable to alter RH as desired by the operator to maintain a sample in a moist state; (4) Secondary and backscattered electron detectors that shall each be used in high vacuum, low vacuum and wet modes with secondary electron resolution of 3.5 nm or better in all imaging modes at 30 kV and 15 nm or better resolution at 5 kV. Solid state backscattered electron detector with a Z resolution of 0.1 or better with low kV operation capability (down to 3 kV); (5) Secondary electron detector suitable for use with low accelerating voltages and able to operate at pressures up to 1300 Pa; (6) Infrared chamber camera system to allow viewing specimen location with respect to microscope chamber instruments. This camera must provide live imaging with at least one of the electron imaging detectors simultaneously; (7) Stage travel and automation in the x and y directions of 150 mm or greater, Z at 65 mm or greater, tilt range of 70 degrees or greater, and full 360 degree rotation. All operator controllable through a PC; (8) The system must be able to have a field of view at least 6mm when the sample is in focus at the analytical working distance and a field of view of at least 500 micrometers when imaging in the wet mode; (9) Accelerating voltage range from 200 v to 30 kV and probe currents to 2 microamps; (10) The system must reach operating vacuum in 3.5 minutes or less when vacuum system is activated; (11) Image and acquisition capabilities for at least a 3000 x 3000 pixel, 16 bit image and storage options for TIFF, BMP, and JPG formats; (12) Image database for archiving and cataloging images collected with the system; (13) Able to generate and store digital videos .AVI files of dynamic experiments; (14) PC computer to drive all automated functions using Windows 2000 operating system with true 32 bit software, at least a 2 GHz Pentium 4 processor, 512 MB of memory or greater, 40 GB high speed hard drive, 17 inch or greater LCD monitor, keyboard and optical mouse, CD writer to archive data, printer with ink cartridges and photo paper, image archive and retrieval database accessible through the network by authorized users, Ethernet card to allow systems to be accessed via NIST's network; 15) Picoampmeter to accurately monitor probe current and spare Wehnelt assembly with filament cartridges; (16) specimen holders for mounting polished sections and tilted specimen holder; (17) Installation, demonstration of performance specifications, training for two staff as defined below. LINE ITEM 0002: Quantity 1 each X-Ray Microanalysis and Imaging System meeting all of the following required specifications: (1) System shall be fully integrated into the microscope for image collection, x-ray microanalysis and imaging, image processing and analysis; (2) Utilize an energy-dispersive x-ray detector with a lithium-drifted silicon crystal of 30 mm^2 crystal area and resolution of 138 eV full-width at half minimum at 5.9 KeV or better. This detector must be temperature cycle-able without degradation of resolution or efficiency as it will operate in high RH environment; (3) Automating x, y, and z, tilt and rotate axes of the microscope stage, providing the maximum travel of the stage as allowed by the scanning electron microscope; (4) Automating control of microscope operation, including high voltage off/on and setting, probe current, magnification, scan rate, stage axes control, and image collection; (5) Collect, store, and display backscattered electron, secondary electron, and x-ray images individually or in sets of up to 15 simultaneous images of at least 512 x 400 pixel resolution with associated backscattered electron or secondary electron image, as selected by the operator; (6) Automatic dead time correction for all x-ray analysis processes spectra, line scanning, and x-ray imaging; (7) Database for storing images, x-ray spectra, and microanalysis results; (8) Microsoft Office Professional with CD-ROM media for storing data in spreadsheets, databases, and in text documents; (9) Software to facilitate calculation of x-ray take-off angle for the specific microscope given knowledge of detector position and microscope chamber configuration; (10) Automatic detector efficiency calculation for x-ray microanalysis; (11) Able to read and write Sun raster file image format (8 and 16 bit), including composite Sun raster files (8 and 16 bit) so NIST can continue to use existing data sets; (12) Image processing software to manipulate single or combinations of images from the electron microscope using mathematical and logical operators defined by the user to extract features, measure feature attributes, and drive the electron beam to specified regions to collect x-ray spectra for phase identification purposes; (13) Utilize a periodic table for selecting elements for qualitative and quantitative analysis; (14) User interface via a PC with at least 2.2 GhZ processor speed, 512 MB memory, 40 gigabyte high-speed hard drive, CD read/writer, 19 inch monitor, inkjet printer with full system documentation (users manuals); (15) Installation, demonstration of specifications, training as defined below. LINE ITEM 0003: Warranty: The Contractor shall provide, at a minimum, an on-site (1) year warranty. The warranty shall cover parts, labor, travel, and software updates. Installation shall include, at a minimum, unpackaging of all equipment, removal of trash, set-up and hook up of all equipment, turn-key operation and demonstration of all performance specifications. Training - The price quoted shall include training for two NIST personnel at the Contractor's user school. The price quoted shall also include initial on-site training upon installation for two NIST personnel ***Delivery shall be FOB DESTINATION and shall be completed in accordance with the Contractor's commercial schedule. ***FOB DESTINATION means: The Contractor shall pack and mark the shipment in conformance with carrier requirements, deliver the shipment in good order and condition to the point of delivery specified in the purchase order, be responsible for loss of and/or damage to the goods occurring before receipt and acceptance of the shipment by the consignee at the delivery point specified in the purchase order; and pay all charges to the specified point of delivery. ***The Contractor shall deliver the equipment to NIST, Shipping & Receiving, 100 Bureau Drive, Gaithersburg, MD. ***Award shall be made to the party whose quote offers the best value to the Government, technical, price, and other factors considered. The Government will evaluate quotations based on the following evaluation criteria: 1) Technical Capability factor "Meeting or Exceeding the Requirement," 2) Past Performance, and 3) Price. Technical and Past Performance, when combined, are more important than price. Evaluation of Technical Capability shall be based on the information provided in the quotation. Quoters shall include the manufacturer, make and model of the products, manufacturer sales literature or other product literature which addresses all specifications, and clearly documents that the offered products meet or exceed the specifications stated above. Evaluation of Past Performance shall be based on the references provided IAW FAR 52.212-1(b)(10). Offerors shall provide a list of at least three (3) references to whom the same or similar equipment has been provided. The list of references shall include, at a minimum: The name of the company or organization and the reference contact person; the telephone number of the reference contact person; the contract or grant number; the amount of the contract; the address and telephone number of the Contracting Officer if applicable; and the date of delivery or the date services were completed. ***The following provisions and clauses apply to this acquistion: PROVISIONS: 52.204-6 Data Universal Numbering System (DUNS) Number; 52.212-1 Instructions to Offerors-Commercial Items; 52.212-3 Offeror Representations and Certifications-Commercial Items; 52.219-22 Small Disadvantaged Business Status. CLAUSES: 52.212-4 Contract Terms and Conditions-Commercial Items; 52.212-5 Contract Terms and Conditions Required to Implement Statutes or Executive Orders-Commercial Items including subparagraphs: (1) 52.203-6, Restrictions on Subcontractor Sales to the Government, with Alternate I; (3) 52.219-4, Notice of Price Evaluation Preference for HUBZone Small Business Concerns (if the offeror elects to waive the preference, it shall so indicate in its' offer); (7) 52.219-8, Utilization of Small Business Concerns; (10) 52.219-23, Notice of Price Evaluation Adjustment for Small Disadvantaged Business Concerns (if the offeror elects to waive the preference, it shall so indicate in its' offer); (13) 52.222-3, Convict Labor; (14) 52.222-19, Child Labor-Cooperation with Authorities and Remedies; (15) 52.222-21, Prohibition of Segregated Facilities; (16) 52.222-26, Equal Opportunity; (17) 52.222-35, Equal Opportunity for Special Disabled Veterans, Veterans of the Vietnam Era, and Other Eligible Veterans; (18) 52.222-36, Affirmative Action for Workers with Disabilities; (19) 52.222-37, Employment Reports on Special Disabled Veterans, Veterans of the Vietnam Era, and Other Eligible Veterans; (23) 52.225-5, Trade Agreements; (24) 52.225-13 Restriction on Certain Foreign Purchases (E.O. 12722, 12724, 13059, 13067, 13121, and 13129; and (30) 52.232-34, Payment by Electronic Funds Transfer--Other than Central Contractor Registration. Department of Commerce Agency-Level Protest Procedures Level above the Contracting Officer is also incorporated. It can be downloaded at www.nist.gov/admin/od/contract/agency.htm. All quotes shall be sent to the National Institute of Standards and Technology, Acquisition and Logistics Division, Attn: Carol A. Wood, Building 301, Room B129, 100 Bureau Drive, Stop 3571, Gaithersburg, MD 20899-3571. All offerors shall ensure the RFQ number is visible on the outermost packaging.***Submission shall be received by 3:00 p.m. local time on August 13, 2003. FAX & E-MAIL QUOTES SHALL NOT BE ACCEPTED.
 

Web Link

Link to FedBizOpps document.
(http://www.eps.gov/spg/DOC/NIST/AcAsD/SB1341-03-Q-0707/listing.html)
 

Place of Performance

Address: NIST Shipping & Receiving 100 Bureau Drive Gaithersburg, MD

Zip Code: 20899

Country: USA
 

Record

SN00383828-F 20030727/030726131110 (fbodaily.com)
 

Source

FedBizOpps.gov Link to This Notice
(may not be valid after Archive Date)

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