FILE | R | Reliability studies for SiC high power devices and the design & fabrication on SiC PiN diodes, BJTs and Thyristors.

FBO DAILY ISSUE OF OCTOBER 29, 2003 FBO #0701
DOCUMENT

R -- Reliability studies for SiC high power devices and the design & fabrication on SiC PiN diodes, BJTs and Thyristors.

Notice Date: 10/27/2003
Notice Type: Document(s)
Contracting Office: Department of Commerce, National Institute of Standards and Technology (NIST), Acquisition and Logistics Division
Solicitation Number: SB1341-04-Q-0020
Point of Contact: Barbara Guise, Purchasing Agent, Phone (301) 975-6310, Fax (301) 975-6319, - Sherri Miller, Purchasing Agent, Phone (301) 975-6320, Fax (301) 975-8884,
E-Mail Address: barbara.guise@nist.gov, sherri.miller@nist.gov
Description: For assistance with broken links contact the Point of Contact in this notice or the FBO Help Desk at 877-472-3779.
Document(s): Solicitation 01; File Name: SOLICITATION DOC; Link: http://www1.eps.gov/EPSData/DOC/Synopses/252/SB1341%2D04%2DQ%2D0020/SB134104Q0020%2Edoc; Bytes: 105,984; File Type: Microsoft Word; File Name: All Files; Link: http://www1.eps.gov/EPSData/DOC/Synopses/252/SB1341%2D04%2DQ%2D0020/20031027104631%2Ezip; Bytes: 25,795; File Type: Zip Compression; Note: If links are broken, refer to Point of Contact above or contact the FBO Help Desk at 877-472-3779.
Record: SN00460115-W 20031029/031027213050 (fbodaily.com)
Source: FedBizOpps.gov Link to This Notice
(may not be valid after Archive Date)

| FSG Index | This Issue's Index | Today's FBO Daily Index Page |