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FBO DAILY ISSUE OF JULY 24, 2004 FBO #0971
SOURCES SOUGHT

66 -- PRECISION ETCHING COATING SYSTEM

Notice Date
7/22/2004
 
Notice Type
Sources Sought
 
NAICS
334516 — Analytical Laboratory Instrument Manufacturing
 
Contracting Office
Department of Commerce, National Oceanic and Atmospheric Administration (NOAA), Mountain Administrative Support Center, 325 Broadway - MC3, Boulder, CO, 80305-3328
 
ZIP Code
80305-3328
 
Solicitation Number
NB8530405442KAR
 
Response Due
8/10/2004
 
Archive Date
8/16/2004
 
Point of Contact
Kelly Rima, Purchasing Agent, Phone 303-497-3779, Fax 303-497-3163,
 
E-Mail Address
Kelly.Rima@noaa.gov
 
Small Business Set-Aside
Total Small Business
 
Description
The National Institute of Standards and Technology (NIST), Materials Reliability Division has a requirement for an ion-based etching coating system suitable for high resolution scanning electron microscopy with the following specifications: 1. Etching and coating deposition must be achieved within the same specimen chamber, without breaking vacuum. 2. Both inert and reactive ion etching must be possible, including gas sources such as argon or krypton (for inert etching) and iodine (for reactive ion etching). 3. Ion source must be capable of creating beams with energy in the range 1.0 to 10.0 keV. 4. Etched area must have a minimum diameter of 5 mm. 5. System must be capable of depositing coatings using metallic and dielectric targets, especially silicon dioxide (quartz). 6. Coatings must cover uniformly an area with minimum diameter 20 mm. 7. Coating thickness must be measured with a thickness monitor. 8. User must be able to select among more than one target material without breaking vacuum, and non-used targets must be protected from contamination during use of other targets. 9. System must achieve an operating vacuum of 10 millipascals or better. 10. Specimens must be exchanged into and out of the specimen chamber in less than 2 minutes. 11. System must include vacuum gauges for both specimen chamber and backing pressure. 12. Specimen stage must accommodate "standard" SEM specimen stubs. 13. Specimen stage must allow for rotation over a range of 10 to 60 rpm or better. 14. Specimen stage must allow for tilt to a fixed or variable rocking angle (0 to 90 degrees). 15. System must fit on top of a "standard" lab bench. This small purchase (NTE $100K) is being conducted under the authority of FAR Part 12, Acquisition of Commercial Items, as a combined notice/solicitation. NAICS Code: 334516. Business Size Standard: 500 employees. This requirement is set aside for small business unless small business cannot meet the Government's need at a fair and reasonable price. No separate solicitation is available. Written proposals will be accepted until close of business on August 10, 2004. FAR Clauses in full text are available at http://www.ARNET.gov/far/. Any contractors doing business with the Government must now be registered with the Central Contractor Registry. The web site is http://www.ccr.gov/. Agency level protest procedures can be found on web site http://oamweb.osec.doc.gov/conops/reflib/alp1296.htm. Hard copies in full text available from office address and phone number listed in notice. Any questions regarding this notice must be submitted in writing to the attention of Ms. Rima (e-mail preferred). Anticipated award date is August 12, 2004.
 
Place of Performance
Address: 325 BROADWAY, BOULDER, CO
Zip Code: 80305
Country: USA
 
Record
SN00628371-W 20040724/040722211757 (fbodaily.com)
 
Source
FedBizOpps.gov Link to This Notice
(may not be valid after Archive Date)

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