SOLICITATION NOTICE
66 -- Dektak 8- Advanced Development Profiler
- Notice Date
- 12/1/2004
- Notice Type
- Solicitation Notice
- Contracting Office
- N68936 Naval Air Warfare Center Weapons Division Dept.1 429 E. Bowen Rd - Stop 4015 China Lake, CA
- ZIP Code
- 00000
- Solicitation Number
- N6893605T0023
- Response Due
- 12/15/2004
- Archive Date
- 2/15/2005
- Description
- The Naval Air Warfare Center Weapons Division (NAWCWD), China Lake, CA intends to enter into negotiations for a firm fixed price contract, on an other than full and open competition basis with Veeco Tucson, Inc, 2650 E. Elvira Rd, Tucson, AZ 85706-7123 for a quantity of one (1) Dektak 8 Advanced Development Profiler. The Dektak 8- ADP is a contact-stylus profiler that measures film thickness, surface roughness, stress and defects on samples as large as 200 mm in diameter. Advanced tip geometries and low stylus force allow users to characterize challenging features and materials. The Dektak 8-ADP is the only contact-stylus profiler that can measure three-inch-thick samples with a stylus force from 0.03 to 15 mg. The Dektak 8-ADP has specifications that include: a programmable 200mm x 200mm XY stage, programmable theta and motorized leveling, vacuum compatible 150 to 200mm wafer chuck, dual field of view optics, N-Lite low force LIS3 sensor for a stylus force range! between 0.03 to 15 mg, extended sample height adjustment to 3 inches, vibration isolation table, Vision32 3D image and analysis software, step detection software, and computer hardware consisting of a controller with 512 MB RAM, 40 GB hard drive, CD-RW, 3.5-inch floppy, 17-inch LCD monitor and the latest version of Window XP operating system. Delivery of the items is FOB destination to the Naval Air Warfare Center Weapons Division China Lake, CA 3 months after receipt of order. Award will be issued under the authority of the test program for commercial items (FAR13.5). The requirement is limited to Veeco Tucson Inc. because the Dektak 8 ADP is the only contact-stylus profiler that can measure samples that are 3-inches thick and 200mm in diameter with a wide variety of styli from sub-micron styli to high aspect ratio styli and using very low stylus force of 0.03mg. In addition, the Dektak 8- ADP is the only profiler that uses Window XP for data acquisition and analysis. W! indow XP can store and access the very large amounts of data needed for the 3-dimensional-surface maps required by the government. Any firm believing they can provide a contact-stylus profiler that can measure 3-inch-thick, 200mm-diameter samples using a wide variety of styli from sub-micron styli to high aspect ratio styli and a very low stylus force of 0.03mg may submit a written response to be received at the Contracting Office no later than ten (10) days after this notification is published. Responses shall provide documentation to include brochures and/or literature that shows they can meet the requirements stated in the synopsis. All requests must reference RFQ Number N68936-05-T-0023. These responses shall be submitted in writing to Naval Air Warfare Center Weapons Division, Code 254100D. Attn: Gayle Cline, 429 E. Bowen Rd - STOP 4015 China Lake, Ca 93555-6108. Questions may be addressed to Gayle Cline (760) 939-8109 Place of Performance = N/A Set Aside Default is = N/A
- Record
- SN00715317-W 20041203/041201212048 (fbodaily.com)
- Source
-
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