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FBO DAILY ISSUE OF MARCH 31, 2005 FBO #1221
SOLICITATION NOTICE

66 -- Supply and Install A Custom Configured Scanning Wavelength Illumination System

Notice Date

3/29/2005
 

Notice Type

Solicitation Notice
 

NAICS

541710 — Research and Development in the Physical, Engineering, and Life Sciences
 

Contracting Office

Department of Commerce, National Institute of Standards and Technology (NIST), Acquisition and Logistics Division, 100 Bureau Drive, Building 301, Room B129, Mail Stop 3571, Gaithersburg, MD, 20899-3571
 

ZIP Code

20899-3571
 

Solicitation Number

Reference-Number-05-861-6565
 

Response Due

4/8/2005
 

Archive Date

4/9/2005
 

Description

The National Institute of Standards and Technology (NIST) intends to negotiate, on a sole source basis under the authority of FAR 13.106(b)(1), with Avian Group USA, New London, NH to supply and install a custom-configured scanning wavelength illumination system with motorized slit option to integrate into an existing scatterometer system at the National Institute of Standards and Technology (NIST)Gaithersburg, MD campus. Avian technology is the only known vendor that can integrate the costume configured add-on modulus into the existing light scattering apparatus owned by NIST and make it compatible with the current optical-mechanical layout. The configured system is required to be compatible with the existing NIST light scattering apparatus with the following critical conditions:(1) the proper beam axis and distance to interface with the goniometer;(2) be able to produce the required sample illumination geometry and wavelength content;(3) able to be switched between the existing laser illumination beam with which the system must be co-aligned;(4)new components shall be able to mount on the existing main optical bench, or the breadboard table on it, while avoiding changes or restrictions to the existing goniometer setup;(5) Metric dimensions and hardware shall be specified for all mounting components;(6)The completed system shall be installed and aligned, ready for connection and programming on a personal computer. (7) The system includes hardware components: light source, monochrometer, order sorting filter wheel, source coupling optics, beam conditioning optics, beam steering mirror(s), and opto-mechanical mounts. The wavelength drive, filter wheel, and shutter shall be capable of automated operation. (8) Optical-mechanical design- This system is an "add-on" modulus to the existing light scattering system, so that the system shall be custom configured to integrate into the existing NIST apparatus and to efficiently transform the beam geometry. The essential design tasks includes: (a) The Optical-mechanical design of this system is required to be shared with the current laser illumination beam and accommodate the current and future optical elements- a polarizer prism and beam chopper, and a reference channel beam-splitter for future inclusion. (b) selection of source, monochrometer, slit parameters, grating and filter selection to optimize the system performance; (c) beam matching optics and conduct ray-trace modeling to qualify key performance parameters;(d) be able to conduct alignment tolerance analysis and develop alignment plan and fixtures. (e) the selection of optical mounts having appropriate adjustment provisions and mechanical design and fabrication of custom adaptors, structures, and fixtures; (f) be able to optimize the flux throughput of the System within the constraints of the beam geometry, uniformity, and the other specifications. (9)documentation shall include: CAD drawings of Optical-mechanical layouts, assembly notes, alignment plan, and any vendor component manuals; 10)The parametric specifications (a) wavelength scan-monochrometer type: Plane grating, ? Meter spherical mirrors standard; (b)scan Range: 360 to 800 nm minimum scan, automated Accuracy:?0.35 nm or less; (c)precision:?0.1 nm repeatability and reproducibility/days;(d)wavelength Drive: At least 175 nm/sec, in 5 nm BW mode, automated scanning through PC interface; (e)primary Band Width: 5 nm ?0.3 nm over scan range with static slits, triangular bandpass function; (f) secondary BandWidth:10 nm triangular nominal, via automated Grating changeover, no slit changeover;(g)Slits, Dispersions and Gratings: shall be selected for compatibility with spectral range, focal length(s), beam geometry and stray light requirements; optimum throughput at 5nm BW mode;(h) Light Source - Lamp Type: DC Xenon Arc, low ozone, 200 Watt maximum;(i)Lamp Size: Arc size and wattage compatible with monochrometer F/# and Slit widths for optimum flux throughput; (j)lamp Stability: Output noise and ripple <0.5% RMS, DC regulation better than 0.2%; (k) Heat Filter: Cutoff wavelength ~850 nm, placed permanently between Lamp and monochrometer; (l) Condenser optics: Selection shall be compatible with Lamp, Wavelength Range, to efficiently match monochrometer F/# and Slit widths to achieve uniformity requirements; (m) Lamp Housing: Selected shall be compatible with above requirements, the inter light path to monochrometer shall be covered; (n) Stray Light -Broadband rejection: <10-3 cumulative at 400nm, in 5 nm BW mode with Xenon source and Silicon detector; 0) Near-band rejection:<10-4 at 3 bandwidths off center;(p)Order Sorting: PC controllable Filter Wheel to be included having 2 or more order-sorting filters, with spaces for additional filters;(q) Shutter: PC controllable for automated dark readings, Beam apertures: Stops and critical baffles are to be included in the System, configured to generate proper beam geometry, and located to accommodate all the required beam path components; as needed to minimize stray geometry; (r)Illumination Beam Geometry ? Illumination Region: 25mm maximum extent, circular or rectangular, on the sample Reference Plane at normal to the Illumination Axis. Non-uniformity: Contribution by relay optics <5% over 95% of Illumination Region width & height. Stray Geometry: < 0.1% of total projected flux outside of Illumination Region with 1 mm margin, Divergence Limit: 1? maximum any ray from the Illumination Axis at the sample Reference Plane; < 0.1% of total projected flux outside the Divergence Limit. Chief Rays: Parallel ?0.05? to Illumination Axis for all points on the Illumination Region. Pupil Uniformity: The center of the exit pupil distribution shall not depart from the chief ray by more than 0.1? at any point in the Illumination Region. ****** The period of performance is required within sixteen (16) weeks after receipt of order. *****The North American Industry Classification System (NAICS) code for this requirement is 541710 and the size standard is 500 employees. The Government anticipates the award of a fixed price purchase order. This notice of intent is not a request for competitive quotations and no solicitation package will be issued. A determination by the Government not to compete this proposed requirement based upon responses to this notice is solely within the discretion of the government. Information received will normally be considered solely for the purpose of determining whether to conduct a competitive procurement. Written responses to this synopsis shall contain sufficient documentation to establish a bona fide capability to fulfill the requirement. A solicitation will not be issued. See note 26.
 

Place of Performance

Address: 100 Bureau Drive, Gaithersburg, MD

Zip Code: 20899

Country: USA
 

Record

SN00777616-W 20050331/050329211756 (fbodaily.com)
 

Source

FedBizOpps.gov Link to This Notice
(may not be valid after Archive Date)

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