SOURCES SOUGHT
66 -- Low Energy Electron Microscope Imaging Energy Analyzer
- Notice Date
- 3/30/2005
- Notice Type
- Sources Sought
- NAICS
- 339111
— Laboratory Apparatus and Furniture Manufacturing
- Contracting Office
- Department of Energy, Brookhaven National Laboratory (DOE Contractor), Brookhaven, PO Box 5000 Bldg. No. 355, Upton, NY, 11973
- ZIP Code
- 11973
- Solicitation Number
- Reference-Number-CFN95230
- Response Due
- 4/14/2005
- Archive Date
- 4/29/2005
- Description
- In an effort to promote full and open competition Brookhaven Science Associates, operator of Brookhaven National Laboratory, is seeking sources for an Imaging Energy Analyzer for use with an ELMITEC Low Energy Electron Microscope (LEEM) III. Imaging Energy Analyzer for LEEM III Microscope: A complete and fully functional 180 degree deflecting imaging energy analyzer, fully compatible with the ELMITEC LEEM III microscope, consisting of: - a combined retarding and imaging lens system at the entrance, - a hemispherical analyzer, - a combined accelerating and imaging lens system at the exit, - adjustable slit(s) for energy selected imaging, - all electronics, cables, mounting hardware, etc. required to operate the analyzer to its specifications (as stated elsewhere), - installation on the existing LEEM III microscope, comprehensive operator training, and successful demonstration of all stated specifications. To ensure compatibility with the LEEM III microscope, the retarding and accelerating lenses are required to change the beam energy between 20 keV in the LEEM III electron optics to the analyzer pass energy of approximately 1.8 keV. The analyzer must be operable in three modes: in imaging mode (to obtain energy filtered images), in energy dispersive mode (to acquire, in a parallel fashion, photoelectron spectra averaged over small sample areas), and in photoelectron diffraction mode (to observe the LEED pattern or photoelectron angular distribution). When mounted on the LEEM III system, the analyzer has to match the LEEM III electron optics as follows: - In imaging mode: LEEM III intermediate lens and projector lens 1 transfer the image and the objective lens back focal plane into two entrance planes (EP1, EP2) of the analyzer. The analyzer images EP2 into the energy-dispersive plane, and EP1 with magnification 1 into an image plane behind the dispersive plane. With a suitable slit in place in the analyzer?s dispersive plane, this double imaging, results in energy-filtered images, if the LEEM III projector lenses are excited to image the image plane onto the screen. The imaging kinetic energy is changed by changing the sample potential, and the only correction necessary is a slight change of objective lens focus, with no adjustments at the analyzer required. - In dispersive mode: with the slit fully open, the dispersive plane is imaged on the screen, and photoelectron energy spectra are obtained. - In photoelectron diffraction mode: when the focal plane is imaged onto the screen, photoelectron emission angular distribution patterns can be observed. In this mode, the sample surface is imaged into the dispersive plane of the analyzer, and the back-focal plane into its image plane. The Imaging Energy Analyzer must be fully compatible with the ELMITEC LEEM III and meet or exceed the following minimum requirements: Spectroscopic imaging mode 1) spatial resolution: <25nm 2) energy resolution: <0.5eV 3) isochromatism: <0.7eV/10?m Directly imaging of energy dispersion 1) energy resolution: <1eV 2) directly imaged energy range: >10eV 3) deviation from linearity: <5% Interested suppliers should contact David J. Paveglio
- Place of Performance
- Address: Brookhaven National Laboratory, Upton, NY
- Zip Code: 11973
- Country: USA
- Zip Code: 11973
- Record
- SN00778456-W 20050401/050330211753 (fbodaily.com)
- Source
-
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