SOLICITATION NOTICE
66 -- VARIABLE PRESSURE FIELD EMISSION SCANNING ELECTRON MICROSCOPE
- Notice Date
- 6/22/2005
- Notice Type
- Solicitation Notice
- NAICS
- 334516
— Analytical Laboratory Instrument Manufacturing
- Contracting Office
- NASA/George C. Marshall Space Flight Center, Procurement Office, Marshall Space Flight Center, AL 35812
- ZIP Code
- 35812
- Solicitation Number
- NNM0513913Q
- Response Due
- 7/1/2005
- Archive Date
- 6/22/2006
- Description
- NASA/MSFC has a requirement for one each Variable Pressure Field Emission Scanning Electron Microscope, in support of NASA Marshall Space Flight Center programs. Materials and failure analysis at MSFC requires analyzing various categories of materials that include metallics, ceramics, composites, biologics and meteoritics. To adequately analyze all categories of materials requires a high resolution electron microscope with a large stage movement and wide flexibility in low and high vacuum imaging capabilities. NASA/MSFC intends to purchase the microscope in accordance with the attached minimum Government specifications, from FEI Company, Hillsboro, Oregon, pursuant to FAR 6.302-1 which implements the authority for 10 U.S.C. 2304(c)(1) for acquisition of supplies or services from only one source and no other supplies or services will satisfy Agency requirements. Competition is impractical for the following reasons: 1. FEI Company is the only known manufacturer of a variable pressure field emission scanning electron microscope that can deliver the required feature combination of large stage movement, large magnification range, high resolution, high variable pressure, and secondary and backscattered electron imaging in both high and low vacuum. 2. FEI Company manufactures the only known Field Emission Scanning Electron Microscope that can operate at a chamber vacuum pressure of 30 Torr (4000 Pa). 3. FEI Company is the only known manufacturer of electron microscopes to include a gaseous analytical solid state backscattered electron detector. Standard backscattered electron detectors lose signal strength at chamber pressures above 1 Torr (133 Pa). 4. FEI Company is the only known manufacturer to provide separate low and high magnification environmental secondary electron detectors. The axially-mounted high magnification detector provides significantly better image signal strength and resolution at high chamber pressures because of a short sample to detector gas path and integrated variable pumping aperture. The Government intends to acquire a commercial item using FAR Part 12. Interested organizations may submit their capabilities and qualifications to perform the effort in writing to the identified point of contact not later than 4:30 p.m. local time on July 1, 2005. Such capabilities/qualifications will be evaluated solely for the purpose of determining whether or not to conduct this procurement on a competitive basis. A determination by the Government not to compete this proposed effort on a full and open competition basis, based upon responses to this notice, is solely within the discretion of the government. Oral communications are not acceptable in response to this notice. All responsible sources may submit an offer which shall be considered by the agency. An Ombudsman has been appointed. See NASA Specific Note "B". Any referenced notes may be viewed at the following URLs linked below.
- Web Link
-
Click here for the latest information about this notice
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- Record
- SN00834817-W 20050624/050622212452 (fbodaily.com)
- Source
-
FedBizOpps.gov Link to This Notice
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