SOLICITATION NOTICE
66 -- Plasma Cleaner
- Notice Date
- 8/15/2005
- Notice Type
- Solicitation Notice
- NAICS
- 334516
— Analytical Laboratory Instrument Manufacturing
- Contracting Office
- Department of Commerce, National Institute of Standards and Technology (NIST), Acquisition Management Division, 100 Bureau Drive, Building 301, Room B129, Mail Stop 1640, Gaithersburg, MD, 20899-1640
- ZIP Code
- 20899-1640
- Solicitation Number
- Reference-Number-05-821-6883
- Response Due
- 8/22/2005
- Archive Date
- 9/6/2005
- Description
- The National Institute of Standards and Technology (NIST) has a requirement for a plasma cleaner for the Precision Engineering Division at its Gaithersburg, Maryland campus. Due to NIST?s requirement for sample preparation for imaging and dimensional measurements of sample at the nano-scale, it is required that NIST ensure that the surface of the sample is clean. In the research and development work performed at NIST, a suitable sample preparation is required for the highest resolution work for samples of the end-of-the-roadmap integrated circuit technology and for imaging and dimensional metrology of various nano-technology samples, including biological samples. NIST?s Hitachi S-4800 field emission scanning electron microscope (FESEM) is capable of resolving details down to 1 nm, but it is necessary to use clean samples to achieve this excellent resolution. The unit NIST proposes to procure, works with a high frequency oscillating power supply generating ion energies of less than 15 eV in a quartz plasma chamber. The vacuum system is oil-free and includes a Pirani gauge to sense vacuum level. The instrument is a self-contained unit, 23? wide x 22.25? deep x 20.25? high. The user interface is through a single control panel, which is used to initiate the vacuum, plasma, and the timer. Cleaning is accomplished in either AUTO or MANUAL mode and a process timer allows for automatic termination. The Multiple Specimen Holder and Stand for 3 mm TEM Specimens and Multiple Specimen Holder and Port, 0.125" SEM Stubs are necessary to work with all sample holders that are in use at the SEM laboratory of the Nanoscale Metrology group. This is a relatively new and innovative concept for cleaning samples that preserves the details of fine structures and it works with samples for various applications in electron microscopy, especially for FESEMs. As a result of the above, NIST intends to enter into a sole source purchase order with E.A. Fischione Instruments, Inc., Export, Pennsylvania, under the authority of 41 U.S.C. 253 ( c) (1) ? only one responsible source. The Government anticipates the award of a fixed price purchase order. The Government intends to solicit and negotiate with only one source under the authority of FAR 13.5 ? Test Program for Certain Commercial Items. Interested firms may identify their interest and capability to respond to the requirement. This notice of intent is not a request for competitive quotations. However, responses received by August 22, 2005, will be considered by the Government. A determination not to compete this requirement, based upon responses to this notice, is solely within the discretion of the Government. Information received will be considered solely for the purposes of determining whether to conduct a noncompetitive procurement. Written responses to this synopsis are required to contain sufficient documentation to establish a bona fide capability to fulfill this requirement. A request for quote will not be issued.
- Place of Performance
- Address: National Institute of Standards and Technology, Gaithersburg, Maryland
- Zip Code: 20899
- Country: US
- Zip Code: 20899
- Record
- SN00870339-W 20050817/050815211641 (fbodaily.com)
- Source
-
FedBizOpps.gov Link to This Notice
(may not be valid after Archive Date)
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