SOLICITATION NOTICE
66 -- SEQUENTIAL WAVELENGTH DISPERSIVE X-RAY FLUORESCENCE (WDXRF) SPECTROMETER
- Notice Date
- 9/1/2005
- Notice Type
- Solicitation Notice
- Contracting Office
- 3610 Collins Ferry Road (MS-I07) P.O. Box 880 Morgantown, WV 26507-0880
- ZIP Code
- 26507-0880
- Solicitation Number
- DE-RQ26-05NT500909
- Response Due
- 9/20/2005
- Archive Date
- 10/20/2005
- Small Business Set-Aside
- N/A
- Description
- SUBJECT: SEQUENTIAL WAVELENGTH DISPERSIVE X-RAY FLUORESCENCE (WDXRF) SPECTROMETER This is a combined synopsis/solicitation for commercial items prepared in accordance with the format in FAR Part 13, Simplified Acquisitions, as supplemented with additional information included in this notice. QUOTES ARE BEING REQUESTED. Responses shall reference Request for Quotations No. DE-RQ26-05NT500909 The U.S. Department of Energy, National Energy Technology Laboratory (NETL), Pittsburgh, PA (for delivery to the Albany Research Center, Albany, OR) intends to purchase the following: A fully automated sequential wavelength dispersive X-ray flurorescence (WDXRF) spectrometer system that is capable of analyzing from Be to U when equipped with the proper analyzing crystals. The system must be capable of performing qualitative, ???standardless??? semi-quantitative, and quantitative analyses by calibrated and Fundamental Parameter methods. Additionally the system will include a micro area and mapping analysis capability to allow the viewing and analysis of small samples, or small areas on larger samples, at a spot size down to 500 microns. The system will include the ability to determine the uniformity and/or thickness of coatings or thin films on a substrate. The WDXRF system must be capable of analyzing solids (metals and ceramics), liquids, glass disks, and powers without dissolution of samples. The following specifications are required: Purchase Specifications for a Wavelength Dispersive X-ray Fluorescence Spectrometer Description/Specifications/Work Statement: The U.S. Department of Energy???s (DOE) Albany Research Center (ARC) has a need for a fully automated sequential wavelength dispersive x-ray fluorescence (WDXRF) spectrometer that is capable of analyzing from Be4 to U92 when equipped with the proper crystals. The WDXRF will have maximum flexibility for supporting a wide range of DOE and ARC research projects. The following specification is intended for use in research analyses using calibrated analytical programs, as well as, analyses on a wide range of materials for which certified standards are not available. It should be capable of performing qualitative, ???standardless??? semi-quantitative, and quantitative analyses by calibrated and Fundamental Parameter methods. Additionally, a micro area and mapping analysis system will provide the ability to view and analyze small samples or small areas on large samples at a spot size down to 500 microns. It can also be used to determine the uniformity or thickness of coatings or thin films on a substrate. Solids (metals), liquids, glass disks, and powders can be analyzed with the specified WDXRF, ensuring a non-destructive and environmentally safe analytical method which does not require the dissolution of samples or the disposal of hazardous waste solvents. X-ray Generator: ??? The spectrometer must be a sequential, 4kW unit. ??? Light, ultra-light, and low intensity heavy elements will be analyzed on this system. The high frequency 4kW x-ray tube should be of end-window design with a Be window thickness of no more than 30??m in order to deliver as much flux to the sample surface, producing a high intensity response from the elements. ??? The tube should have a Rh target and be of micro focus design. ??? To reduce maintenance and guarantee a constantly clear optics path, the WDXRF system must have tube and optics above the sample. This design will help protect and keep the x-ray tube clean from spills or sample degradation. X-ray Voltage & Current: upper limits of at least 60kV, 150mA 20kV-60kV (1kV increments) 2mA-150mA currents (1mA increments) Output Power Rating: 4000 Watts Output Stability: at least ??0.005% at ??10% input variation for both voltage and current Protective Features: Indicator of abnormal temperature of secondary cooling water Abnormal conductivity of secondary cooling water Water failure relay Tube voltage leakage X-ray indication lamp problem Over-voltage limit Under-voltage limit Tube current problem Supply voltage problem Spectrometer Characteristics: For efficiency of space, a system with a small footprint is preferred. The total area footprint includes instrument, chiller, vacuum pumps, x-ray generator, computer workstation, etc. Sample Compartment ??? X-ray irradiation from above the sample. ??? Sample spin capability. Primary Beam Filters Filters must be included for the function of background reduction or interfering line elimination. The spectrometer must contain a programmable primary beam filter system of at least five positions with a filter configuration optimized for Rh radiation to include at least four filters. Slit Exchanger (Collimator) Mechanism Divergent Slits: Fine High Resolution Slit (for heavy elements) Standard Resolution Slit (for light elements) Extra Course Slit (high sensitivity for light elements) Receiving Slits: High Resolution Receiving Slit for Scintillation Counter Standard Resolution Slit for Proportional Counter Diaphragm Exchanger (Collimator Mask) System A programmable limiting area diaphragm system with a minimum of six positions is required. Diaphragm settings shall include (or be reasonably similar to) 30mm, 20mm, 10mm, 5mm, 1mm, and 0.5mm. There must be an automatic attenuator (1/10 of x-ray intensity) that sits in front of the detector. Automatic Mask Size Detection System Since samples of different sizes will need to be analyzed through qualitative routines using a standardless Fundamental Parameter calculation, a system for sensing sample cup masks of varying sizes in the same analysis run is required. This would allow a standard routine to be created without specifying the mask size, thus reducing the overall number of programs needed for the same analytical routine. Detectors The system must have a minimum of two detectors: 1. Scintillation Counter (SC) 2. Flow Proportional Counter (F-PC) ??? The flow proportional detector must have an auto center wire clean feature to lessen down time due to center wire replacement. This feature will assist in maintaining a reproducible, long term response from those elements analyzed by this detector through the ability to clean the detector center wire as its response ability degrades through particulate matter build up. ??? The flow rate of P-10 gas should be no more than 10mL/min. Crystal Exchanger, Crystals, and Multilayer Materials The spectrometer shall include at least a ten position crystal exchanger. The system must have the capability of analyzing from Be4 to U92. The crystal exchanger must be minimally fitted with the following ten crystals and multilayer materials (or the equivalent): Standard crystals: LiF200 (Ti-U) LiF220 (Cr-U) PET (Al-Ti) Ge (P-Ca) Specialty crystals required to accomplish desired elemental range: Specific analysis of O to Mg (prefer synthetic multilayer over TAP crystal) Specific analysis of N Specific analysis of C with filter to eliminate O overlap Specific analysis of B Specific analysis of Be Specific analysis of Si Goniometer Drive Type: Pulse motor (2-axis ??-2?? independent driving) Scanning Range: Scintillation Counter 5?? to 118?? (2??) Flow Proportional Counter 13?? to 148?? (2??) Scanning Speed: Minimum 1400??/min (2??) Stepping Angles: 0.001??, 0.01??, 0.02??, 0.05??, and 0.1?? (or reasonably similar) Continuous Scan: 0.1?? through 240??/min Reproducibility: Within ??0.0005?? Overall Temperature Stabilization The spectrometer must have a thermostatic mechanism to control temperature inside the spectrometer cabinet and inside the sample chamber. Temperature control should be within (or equivalent to): Spectrometer Interior: 36.5??C ?? 0.5??C Sample Chamber Interior: 36.5??C ?? 0.1??C Maintenance ??? Self Diagnosis Function ??? Automatic Pulse Height Adjusting ??? Automatic Center Wire Cleaning ??? Remote Diagnosis Sample Accommodations: Automatic Sample Changer An automatic and programmable sample changer of X-Y design is necessary. The sample changer must have a minimum of 48 positions with 48 sample cups (enough cups to fill the sample changer). The design should offer sample trays that can be removed for loading while the spectrometer is running. The sample cups should come with the following sample masks (or be reasonably similar) that match the size of the collimator masks: 10 of the 5mm masks 28 of the10mm masks 10 of the 20 mm masks 20 of the 30mm masks Sample Stage for General Purpose Analysis, Mapping, and Small Spot Size Analysis ??? The sample stage shall be an R-?? stage that can rotate the sample around ?? and move along its radius in order to position the sample for accurate programmed mapping and point analysis. The R-?? sample stage must be able to position the sample so the spectrometer can perform measurements at the maximum x-ray intensity position while not being affected by uneven x-ray intensity of the x-ray tube or by uneven reflection in the crystal, even with small diameter spot sizes down to 0.5mm. ??? The sample chamber must have a two position turret with sample detection that holds the sample horizontal for top surface irradiation. ??? A sample holder for point analysis with a 10mm mask is also to be included. Liquid and Loose Powder Samples ??? A helium gas flush attachment with a He Seal is required for the analysis of liquids or loose powder samples. ??? Standards A package of certified reference standard samples needs to be included with the system. They should cover the analysis range of: Cr: 2-25% Ni: 1-74% Co: 0.05-20% Mo: 0.05-4.5% W: 0.05-2.5% Nb: 0.001-5% Ti: 0.001-3% Fe: 1-85.5% Mapping/Microanalysis System: The system needs to provide the ability to view and analyze small samples or small areas on large samples at a spot size down to 500 microns. The system must be complete with a mapping feature utilizing an imaging camera within the system so that analysis areas can be selected from a displayed 'picture'. A method of enhancing any area on the image for a more detailed view must be available. Some method of aligning the sample within the instrument for user specified analysis areas must be available (such as an R-theta sample stage). Multiple or single spot analysis areas must be user determined in location and size. Vacuum System: Since light and ultra light element analysis is required, vacuum stability is very important. The spectrometer must use a stable and rapid dual pump vacuum system. (One pump should be for the analysis chamber and one pump should be for the loading port.) It must maintain a stable vacuum during analysis, while facilitating efficient sample exchange. All detectors must be inside the vacuum chamber. The vacuum chamber must also employ an automatic pressure control device for ultimate stability when measuring light elements. Dust Collection Device A powder trap attachment is required. Cooling System: The spectrometer must have a cooling system that can cool the 4000 Watt x-ray tube while keeping it safe from overheating. The spectrometer should include two heat exchangers: 1. Internal Heat Exchanger (Pure deionized water circulation that assures specific resistance in water using ion exchange resin must be provided.) 2. External Heat Exchanger (A backup, external heat exchanger that is refrigerated-water cooled and is sufficient to cool the 4000 Watt x-ray tube must be provided.) 3. Safety: ??? It is the manufacture???s responsibility to meet all federal, state, and local x-ray safety regulations. The radiation that escapes the instrument can be no greater than ambient levels. ??? The spectrometer must be protected by integrated circuitry to monitor the status of the instrument and shut it down if the limits if any of its components are exceeded. ??? An x-ray ???ON??? light must be included and be visible from all directions surrounding the spectrometer cabinet. The power to the x-ray tube will shut down if the lamp fails to operate. ??? A safety interlock system shall be provided to protect the user. The interlocking system shall shut down power to the x-ray tube if access is attempted. ??? A complete safety protection system and an x-ray path isolated from the operator shall exist. ??? Instrument must be fully protected against power line failure and voltage drops (brown out). ??? Instrument must be fully protected against cooling water failure. ??? Software Package: Operating system: Microsoft Windows XP Qualitative/Semi-Quantitative Analysis: The ability to run a quick and easy qualitative measurement on a completely unknown sample without the need to set up a detailed qualitative procedure is required. This simple set-up should only require input of basic information such as elemental range, diaphragm size, oxide or element output, variable scan time, and atmosphere selection through a pre-programmed routine. Semi-Quantitative Software additions: Must incorporate ???standardless??? semi-quantitative analysis where qualitative scan analysis is carried out and then the detected elements are quantified by a Fundamental Parameters method. The software must incorporate corrections for the photoelectric effect, line overlapping, chamber atmosphere, film for liquid cells, and impurities. Semi-quantitative measurements must be able to be completed by scan based and/or a combination of both scan based and fixed peak-background based. Matrix Matching Database: The ability to use an automatic matrix matching reference or a general database for semi-quantitative calculations is required. Quantitative Analysis: The quantitative program shall include methods for 150 components for bulk analysis and 10 layers / 150 components for thin film analysis. Calibration shall be able to be done by empirical regression analysis, standardless Fundamental Parameters, or Fundamental Parameter analysis with standards. The ability to combine two or all three methods in a single calibration routine is required. For empirical calibration, matrix correction coefficients must be able to be calculated theoretically based on the Fundamental Parameter method. The program should include a matrix correction of analyzed elements from none determined loss on ignition. Element measurement conditions should be able to be optimized and directly saved through 2theta-scan and PHA-scan results in quantitative analysis setting routine. Theoretical Overlapping: Line overlapping corrections must be performed automatically using theoretical intensities from the Fundamental Parameter qualitative routines, which can reduce analytical errors compared to using measured intensities. Programmable Operation: The software must include programmable selections such as batch runs that can be set up to run overnight, preset analysis, auto power off. Mapping Software: The software must be able to control the R-theta sample stage to do programmed mapping routines on samples. It should allow a single sample to be analyzed at selected and multiple R-theta coordinates anywhere on the sample surface, through the use of a CCD imaging system, down to spot size of 0.5 mm. All results should be able to be displayed in 2D or 3D graphics for every element. Remote Diagnostics: Information on the instrument condition should be able to be sent to the service department via modem or the company can have access to the instrument via remote control software. Password: The software must be password controlled allowing various levels of access to protect sensitive information. Instrument Controller: (equivalent or better) ??? The system must be capable of connecting to the ARC computer network for transfer of data and images. ??? 3.4 GHz Pentium 4 processor, 2 MB L2, 800MHz ??? (two) 160GB SATA hard drives ??? 2GB RAM ECC (2 DIMMS) ??? Precision 380 MT64 ??? 3.5??? 1.44 MB Diskette Drive ??? 48x/32x CD-RW/DVD Combo with CyberLink Power DVD software ??? 56K v.92 Data/Fax PCI modem ??? Dell three piece stereo system ??? Microsoft Windows XP Professional, x64 Edition with media ??? Microsoft Office 2003 Pro with media ??? Norton Ghost Back-up Software ??? PC Anywhere (Symantec) ??? Remote Diagnostics Software ??? (two) 20??? 2001FP flat panel color monitors, VGA/DVI ??? Keyboard, scroll mouse, and pad ??? NTFS File System ??? Hyper-Threading turned ON. ??? Non-RAID ??? 128MB PCIe x16 nVidia Quadro FX 1400 ??? Color laser printer with minimum output of 15 ppm black and 15 ppm color ??? UPS Back-up Battery Unit for computer ??? Additional Accessories: Acrylic Sample to monitor background (target decay) 4 Reference Samples (Ti, Mg, Al, Brass) Spare Flow Proportional Counter Window (1 Set) Instruction Manual in English (Paper & CD) Tool Box with Basic Tools NBS Handbook 111 Periodic Table of Elements Casters for Ease of Movement Ion Exchange Cartridge Assembly He gas regulator P-10 gas regulator Equipment Performance Test: When the installation is completed, the installation engineer will perform a series of electrical and mechanical tests that duplicate the quality and performance tests done in the factory prior to shipment. The following performance tests shall be conducted at the Albany Research Center upon delivery and installation of the system: 1. Using the CCD camera and multi-directional sample stage, demonstrate how the instrument performs a homogeneity test using a 500??m spot size, ensuring the mapping application is working. 2. The instrument shall be required to perform a series of quantitative measurements and prove reproducibility of a sample with known, certified values. Both the SC and F-PC detectors will be used as well as the correct crystals needed to analyze a standard with higher atomic number elements (W, Fe, Ni, etc.) and lower atomic number elements (C, O, Al, etc.) 3. Demonstrate overnight run with preset analysis. 4. The system shall prove its ability to transfer data and pictures to ARC computers via the existing computer network for incorporation into presentations, reports, and publications. Results will be directly importable into ARC supplied office suites such as Microsoft Office. Note: All samples needed to complete the performance tests will be provided by Albany Research Center. Training and Support: Training Three day minimum of basic applications/software and maintenance training at customer site is required at the time of installation. Contractor shall also provide one individual basic XRF theory and applications support training which can be done on-site or at a scheduled XRF course off-site. This will include tuition, books, and all relevant materials on operation and operator maintenance of the system. Support The successful bidder will have an established Service Department in the United States with extensive experience installing and servicing wavelength dispersive x-ray fluorescence spectrometers. Installation and Warranty: Installation All pre-installation documentation and requirements of the bidder must be submitted with the bid. Installation shall be accomplished by the Contractor, including calibration, testing, and operation to the satisfaction of the Albany Research Center staff. Spectrometer Warranty A twenty four (24) month warranty on the spectrometer is to be included as part of the purchase. All warranty service shall include replacement parts (excluding consumables), labor, travel, and living expenses at the Contractor???s expense. The warranty shall also include periodic (at least once annually) routine inspection, testing, and calibration of the system. Support for hardware and software upgrades must also be included. X-ray Tube Warranty The x-ray tube must be fully warranted for at least a twenty four (24) month period after acceptance. If the X-ray tube fails during the warranty period, it shall be replaced at no cost. DELIVERY: FOB Destination is required (all freight included). The provisions at 52.212-2 Evaluation ??? Commercial Items (JAN 1999) does not apply to this acquisition. Instead, the following information will be used for evaluation of offerors: An award shall be made to the responsible offeror submitting a technically acceptable quote and offering the lowest evaluated price. Evaluation is based on best value including cost and ability to meet stated requirements above. Offerors shall submit descriptive literature and drawings detailing features, technical capabilities and warranty data. Technical acceptability will be determined solely on the content and merit of the information submitted response to this provision as it compares to the minimum characteristics provided above. Therefore, it is essential that offerors provide sufficient technical literature, documentation, etc., in order for the Government evaluation team to make an adequate technical assessment of the quote as meeting technical acceptability. Price shall be the deciding factor among technically acceptable quotes. The North American Industry Classification (NIAC) is 334519. ALL INTERESTED PARTIES SHALL SUBMIT OFFERS WITH THE FOLLOWING INFORMATION: Federal Tax Identification (TIN); Dun & Bradstreet Number (DUNS); and remit to address if different. A Firm Fixed Priced Purchase Order shall be issued using the Simplified Acquisition Procedures FAR Part 13. Responses/offers are due no later than 5:30 p.m. Eastern Time Zone on September 20, 2005. Quotes may be faxed to Mr. Robert Mohn, at 412-386-5770 or E-mailed mohn@netl.doe.gov. Technical Representative for this above item is Mr. Keith Collins, 541-967-5808.
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