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FBO DAILY ISSUE OF SEPTEMBER 22, 2005 FBO #1396
SOURCES SOUGHT

66 -- Single Tilt TEM-STM System

Notice Date
9/20/2005
 
Notice Type
Sources Sought
 
NAICS
339111 — Laboratory Apparatus and Furniture Manufacturing
 
Contracting Office
Department of Energy, Brookhaven National Laboratory (DOE Contractor), Brookhaven, PO Box 5000 Bldg. No. 355, Upton, NY, 11973
 
ZIP Code
11973
 
Solicitation Number
Reference-Number-102330TEM
 
Response Due
9/27/2005
 
Archive Date
10/12/2005
 
Description
Brookhaven National Laboratory has a requirement, and is seeking, sources for a holder system is to be used in 3 JEOL electron microscopes. It must provide nanomanipulation capabilities while the specimen is mounted and observed in the Transmission Electron Microscope. The system must accept standard 3 mm diameter TEM grids to be compatible with current samples. Nanomanipulation is required over a range of a few hundred microns at coarse resolution and at Angstrom resolution for fine positioning over at least 2 microns. The holder must have Scanning Tunneling Microscopy (STM) capabilities to locally probe the structure of the sample under investigation. The system must be capable of collecting I-V curves of nanoscale materials in an easy and integrated with the operations fashion. A user interface that is easy to understand and operate is necessary to make this tool available to most microscope users. Brookhaven National Laboratory has identified the Gatan Model ST1000 as compliant with its requirements. It includes a single-tilt TEM specimen holder, fitted with in-situ STM including 3-D approach mechanism, control system, field emission module, 3 additional wires attached to TEM-STM holder, software for control and data acquisition.. The probe scanner is integrated with a 3 dimensional approach mechanism providing a very wide range of motion ( from picometer to millimeter ), to enable the probe to be positioned accurately at the region of interest indicated by TEM imaging. In addition to acquiring STM images, the probe may be used for measuring electrical properties at specific locations on the specimen. This enables, studies of the conductance of nanoscale structures, identified in the TEM. All interested manufacturers whose products meet or exceed Brookhaven?s requirements and the capabilities of the Gatan Model ST1000 Single Tilt TEM-STM system should contact David J. Paveglio
 
Place of Performance
Address: Brookhaven National Laboratory, Upton, NY
Zip Code: 11973
Country: USA
 
Record
SN00899219-W 20050922/050920211704 (fbodaily.com)
 
Source
FedBizOpps.gov Link to This Notice
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