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FBO DAILY ISSUE OF OCTOBER 29, 2005 FBO #1433
SOLICITATION NOTICE

66 -- Low Energy Ellectron Microscope

Notice Date

10/27/2005
 

Notice Type

Solicitation Notice
 

NAICS

339111 — Laboratory Apparatus and Furniture Manufacturing
 

Contracting Office

Department of Energy, Brookhaven National Laboratory (DOE Contractor), Brookhaven, PO Box 5000 Bldg. No. 355, Upton, NY, 11973
 

ZIP Code

11973
 

Solicitation Number

LEEMRFP103694
 

Response Due

11/15/2005
 

Archive Date

11/30/2005
 

Description

This is a combined synopsis/solicitation. This solicitation is being issued as a Request for Proposals (RFP) for an ultrahigh-vacuum (UHV) low-energy electron microscope (LEEM) designed for imaging of conducting surfaces with high spatial and temporal resolution Under this RFP Brookhaven Science Associates (BSA), operator of the Department of Energy?s Brookhaven National Laboratory (BNL), will award a firm fixed price contract for a LEEM. The LEEM, shall be, a dedicated UHV systems for high-resolution dynamic microscopy at surfaces. It shall consist of several UHV subsystems, which are independently pumped and interconnected via UHV valves, including: a UHV main chamber, a UHV LEEM optics manifold, a sample preparation chamber, and a fast-entry load lock chamber. It shall include a complete electron optical system enabling all imaging and diffraction modes, such as low-energy electron microscopy (LEEM), photoelectron emission microscopy (PEEM), mirror electron microscopy (MEM), secondary electron emission microscopy (SEEM), low-energy electron diffraction (LEED), and selected area LEED. In addition, the microscope shall include all necessary peripheral instrumentation, including controllers for the high-voltage and lens systems, electron source controller, multichannelplate (MCP) power supply, closed-loop controlled sample heater power supplies, vacuum pumps and pump power supplies, vacuum gauges, sample transfer rods, bakeout controller and hardware, backup power for the entire systems, image intensified video camera, sample cartridges. The entire microscope operation as well as the image and video acquisition processes shall be computer controlled. An appropriate computer workstation shall be included. In addition to the manufacturer?s specification for a state-of-the-art LEEM system, the instrument shall also be designed to meet BNL?s special requirements as delineated in the specification. The LEEM system shall be configured to accept future upgrades, e.g., including a spin-polarized electron source, an imaging energy filter or aberration correction system, and at least one customer-supplied add-on UHV chamber, e.g., for in-situ scanning tunneling microscopy imaging, connected to the main UHV chamber. The LEEM system configuration shall permit retrofit of future upgrades on site at BNL. The sample transfer system shall be designed to permit transfer of samples into the additional add-on chamber. This, acquisition, is a, ?Best Value?, procurement. The utilization of this procedure is expected to provide the greatest overall benefit to BSA/BNL. ?Best Value? employs a trade off process that permits award to other than the lowest priced offeror or to the highest technically rated offeror. The tradeoff process, associated with Best Value involves a comparative weighing of the evaluation factors and sub-factors identified in the Request for Proposals (RFP). Specifically, the trade off process involves selecting the most advantageous offer based upon an integrated assessment of both non-cost/price factors, taken in their assigned relative importance. The following factors, in their relative order of weighting, will be utilized to evaluate the offers: - General Technical Specifications: Submit operating specifications for the proposed LEEM system utilizing the same format (Section and Sub-Section numbering) presented by the specifications contained in the solicitation. - Compatibility/Upgradeability: Discuss/demonstrate compatibility of the proposed LEEM with the existing BNL LEEM III from ELMITEC. Discuss existing, developed and planned retrofit upgrades and expansions for the proposed LEEM (an anticipated availability date should be given for upgrades planned for the future). - Performance Risk: Submit references, points of contact and telephone numbers for all installations of LEEM or similar systems for the last 3 years. Proposals are due May 25, 2005, by 4:00 PM, EDT, and shall be submitted to Brookhaven Science Associates, Brookhaven National Laboratory, Attention: D. Paveglio, Bldg. 355, Upton, NY 11973, by US mail This RFP has been sent to the following known manufacturers: ELMITEC Elektronenmikroskopie GmbH Albrecht-von-Groddeck-Str.3 D-38678 Clausthal-Zellerfeld, Germany SPECS Scientific Instruments, Inc. 635 South Orange Avenue Sarasota, Florida 34236 Other interested manufacturers may download the attached RFP. Questions concerning this RFP should be forwarded to David J. Paveglio.
 

Place of Performance

Address: Brookhaven National Laboratory, Upton, NY

Zip Code: 11973

Country: USA
 

Record

SN00922212-W 20051029/051027211732 (fbodaily.com)
 

Source

FedBizOpps.gov Link to This Notice
(may not be valid after Archive Date)

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