SOLICITATION NOTICE
66 -- Vacuum Cryogenic Probe Station
- Notice Date
- 2/2/2006
- Notice Type
- Solicitation Notice
- NAICS
- 334516
— Analytical Laboratory Instrument Manufacturing
- Contracting Office
- Department of Commerce, National Institute of Standards and Technology (NIST), Acquisition Management Division, 100 Bureau Drive, Building 301, Room B129, Mail Stop 1640, Gaithersburg, MD, 20899-1640
- ZIP Code
- 20899-1640
- Solicitation Number
- SB1341-06-Q-0188
- Response Due
- 2/17/2006
- Archive Date
- 3/4/2006
- Description
- THIS IS A COMBINED SYNOPSIS/SOLICITATION FOR COMMERCIAL ITEMS PREPARED IN ACCORDANCE WITH THE FORMAT IN FAR SUBPART 12.6-STREAMLINED PROCEDURES FOR EVALUATION AND SOLICITATION FOR COMMERCIAL ITEMS-AS SUPPLEMENTED WITH ADDITIONAL INFORMATION INCLUDED IN THIS NOTICE. THIS SOLICITATION IS BEING ISSUED USING SIMPLIFIED ACQUISITION PROCEDURES UNDER THE AUTHORITY OF FAR SUBPART 13.5 TEST PROGRAM FOR CERTAIN COMMERCIAL ITEMS-AS SUPPLEMENTED WITH ADDITIONAL INFORMATION INCLUDED IN THIS NOTICE. THIS ANNOUNCEMENT CONSTITUTES THE ONLY SOLICITATION; QUOTATIONS ARE BEING REQUESTED, AND A WRITTEN SOLICITATION DOCUMENT WILL NOT BE ISSUED. This solicitation is a Request for Quotation (RFQ). The solicitation document and incorporated provisions and clauses are those in effect through Federal Acquisition Circular 2005-08. *** The associated North American Industrial Classification System (NAICS) code for this procurement is 334516 with a small business size standard of 500 employees. This requirement is 100% set aside for small businesses. Only interested small businesses may submit a quote. *** ***The National Institute of Standards and Technology (NIST) has a requirement for one (1) each, Vacuum Cryogenic Probe Station to be used in the Semiconductor Electronics Division at NIST in Gaithersburg, Maryland. *** Vacuum Cryogenic Probe Station The Semiconductor Electronics Division, EEEL has a requirement for a vacuum cryogenic probe station for charge injection and transport measurements on novel and organic semiconductor materials and devices (part of EEEL?s Competence effort). 1. Background Information: Using a conventional probe-station for electrical/electrical-optical characterization of novel semiconductor devices at the sub-millimeter to nanometer scale is nearly impossible as a vacuum chamber is needed for this cryogenic operation with helium supply for the cooling. In addition, the probes shall be maintained at the same temperature as the sample to minimize thermal voltage and to reduce the background electrical noise in the measurement system. Low noise operation is crucial for this type of low-level current-voltage measurements (~10-13 Amps, ~10-6 Volts). Thus, to perform successful electrical/electrical-optical measurements a vacuum cryogenic probe station is needed with multiple electrical probes (6 total including substrate biasing) and an optical probe (1 total), and which can provide for a wide sample temperature range (less than 5 K to 450 K). Such a system would permit diverse measurement methods to be employed in characterizing novel semiconductor materials and devices. Importantly, beyond the need for high vacuum to provide thermal insulation at low temperature the high vacuum environment reduces extrinsic variables that may affect the characterization of the intrinsic material/device properties. The minimum requirements for the system are specified as follows: 2. Minimum Specification Sheet: 2.1 Basic System Requirements 1. A minimum of five micro-manipulated probes allowing electrical measurements on 1 inch x 1 inch square samples with arbitrarily located contacts. 2. A minimum of one optical fiber probe (UV) allowing optical measurements on 1 inch x 1 inch square samples with arbitrarily located features. 3. All probes must be maintained at the same temperature as the sample to minimize the thermal voltage (for example, through thermal anchoring on the stage). 4. Each probe must be capable of minimum travel distances of 2 inch in-sample plane along probe axis, of 1 inch in-sample plane perpendicular to probe axis, and 0.5 inch normal to sample plane. 5. The chamber must have at least 1 unutilized vacuum port (KF/QF/NW 25) located on the baseplate. 6. The chamber must have a top view-port through which the sample can be observed. 7. The view-port must have IR-absorbing window to minimize external radiative heating. 8. System must come with complete optics system (including full color display) able to resolve features of 3 um in size and allowing viewing of any part of the 1inch square sample as well as digital image transfer capability. 9. Sample stage shall open to air to permit mounting of specimens. 10. Specimen chamber must be able to be evacuated to 5x10-5 Torr or better at room temperature in 1 hr. 11. Pumping and venting ports shall be KF/QF/NW 40 or larger. 12. System must include a turbo molecular pumping station (with diaphragm backing pump, i.e. oil free) with vacuum gauge, display/controller, vacuum valve(s) and required plumbing. Pump inlet pumping speed for N2 must be greater than 200 l/s (non aperture limited) with an ISO 100 inlet flange. 13. The system shall come with its own table and with a fully functional vibration isolation system. 14. The system shall come with a liquid Helium transfer line and control valve. 15. The system shall come with a liquid Nitrogen dewar with fitting(s) for use with the liquid Helium transfer line. 16. A temperature measurement diode must be furnished with the delivered system to calibrate the sample temperature. 2.2 Operating Temperature Requirements 1. The system shall operate down to 5 K or below with a measurement accuracy of ? 0.1 K. This lower limit of temperature operation has to be guaranteed and verified in on-site demonstration. 2. The system must be able to operate up to at least 450 K. 3. The system must be configured to permit independent temperature control (heating or cooling) of the sample from that of the shielding, i.e. split flow cryostat. 4. The system must come with all the necessary controllers and power supplies for independent control and measurement of the sample and shielding temperatures. 2.3 Electrical Measurement Requirements 1. The delivered system must be configured for electrical measurements from DC to 50 MHz (minimum) and be re-configurable for measurements up to at least 50 GHz without major modification (replacement of probe arms permitted). 2. The company must manufacture probes compatible with this system over a range of sizes (with tip radius ranging from at most 5 ?m up to at least 25 ?m) made of W, BeCu or similar durable alloys (for compatibility with future needs). 3. System must be configured to permit an external voltage to be applied directly to the sample stage or holder for back-gate type measurements without using one of the five probes for this purpose. 4. All electrical connectors for connecting the probes and substrate to external test and measurement equipment must be triax and configured for guarded low-level measurements. 5. The system must have current leakage of less than 100 fA at 10 V on all cabling and feedthroughs (probe and substrate) 2.4 Installation/Training Company shall install system at NIST, demonstrate all capabilities, and train users on operating procedures. ***Delivery shall be FOB DESTINATION and be completed in accordance with the Contractor?s commercial schedule. *** ***The contractor shall pack and mark the shipment in conformance with carrier requirements, deliver the shipment in good order and condition to the point of delivery specified in the purchase order, be responsible for any loss of and/or damage to the goods occurring before receipt and acceptance of the shipment by the consignee at the delivery point specified in the purchase order; and pay all charges to the specified point of delivery. The contractor shall deliver all line items to NIST, Building 301, Shipping and Receiving, Gaithersburg, MD 20899-0001. *** ****The Government will evaluate information based on the following evaluation criteria: 1) Technical Capability factor "Meeting or Exceeding the Requirement," 2) Past Performance, and 3) Price. Technical Capability and Past Performance, when combined, are more important than Price. Award shall be made based on best value. ****Evaluation of Technical Capability shall be based on the information provided in the quotation. Quotations shall include the make and model of the products, manufacturer sales literature or other product literature, which CLEARLY DOCUMENTS that the offered product(s) meet or exceed the specifications stated above. ****Past Performance will be evaluated to determine the overall quality of the product and service, provided by the Contractor. Evaluation of Past Performance shall be based on the references provided IAW FAR 52.212-1(b)(10) and/ or information provided by NIST or its? affiliates. Quoters shall provide a list of at least THREE (3) REFERENCES to whom the same or similar products have been sold. The list of references shall include, at a minimum: The name of the reference contact person and the company or organization; the telephone number of the reference contact person; the contract or grant number; the amount of the contract and the address and the telephone number of the Contracting Officer if applicable; and the date of delivery or the date services were completed. ***The following provisions and clauses apply to this acquisition: Provisions: 52.212-1, Instructions to Offerors-Commercial Items; and 52.212-3 Offeror Representations and Certifications-Commercial Items. ***Offerors must complete annual representations and certifications on-line at http://orca.bpn.gov in accordance with FAR 52.212-3 Offerors Representations and Certifications- Commercial Items. If paragraph (j) of the provision is applicable, a written submission is required. *** Clauses: 52.204-7, Central Contractor Registration (Oct 2003); 52.212-4 Contract Terms and Conditions?Commercial Items; 52.212-5 Contract Terms and Conditions Required to Implement Statutes or Executive Orders?Commercial Items including subparagraphs: (1) 52.203-6, Restrictions on Subcontractor Sales to the Government, with Alternate I; (3) 52.219-4 Notice of Price Evaluation Preference for HUB-Zone Small Business concerns; (7) 52.219-8, Utilization of Small Business Concerns; 52.212-4, Contract Terms and Conditions?Commercial Items; (18)(i) 52.219-23 Notice of Price Evaluation Adjustment for Small Disadvantaged Business Concerns with Alternate I; 52.212-5, Contract Terms and Conditions Required to Implement Statutes or Executive Orders--Commercial Items, including subparagraphs: (14) 52.212-3 Convict Labor; (15) 52.222-19 Child Labor ? Cooperation With Authorities And Remedies; (16) 52.222-21, Prohibition of Segregated Facilities; (17) 52.222-26, Equal Opportunity; (18) 52.222-35, Equal Opportunity for Special Disabled Veterans, Veterans of the Vietnam Era, and Other Eligible Veterans; (19) 52.222-36, Affirmative Action for Workers with Disabilities; (20) 52.222-37, Employment Reports on Special Disabled Veterans, Veterans of the Vietnam Era, and Other Eligible Veterans; (24) (i) 52.225-3, Buy American Act?Free Trade Agreements?Israeli Trade Act (Jan 2004); (26) 52.225-13, Restrictions on Certain Foreign Purchases; (29) 52.225-15, Sanctioned European Union Country End Products (FEB 2000)(E.O. 12849); (31) 52.232-33, Payment by Electronic Funds Transfer? Central Contractor Registration (May 1999)(31 U.S.C. 3332); 52.237-2, Protection of Government Buildings, Equipment, and Vegetation (APR 1984); and Department of Commerce Agency-Level Protest Procedures Level Above the Contracting Officer, which can be downloaded at www.nist.gov/admin/od/contract/agency.htm. ****All Parties shall submit the following: 1) Two (2) copies of a quotation which addresses all Line Items; 2) Technical description and/or product literature; 3) Description of commercial warranty; and 4) One (1) copy of the most recent published price list(s). ****All quotes should be sent to the National Institute of Standards and Technology, Acquisition Management Division, Attn: Jennifer Roderick, Building 301, Room B175, 100 Bureau Drive, Stop 1640, Gaithersburg, MD 20899-1640. SECURITY REQUIREMENTS Because of heightened security, FED-EX, UPS or similar delivery methods are the preferred method of delivery of proposals. If proposals are hand delivered, delivery must be made through Gate A, and a 48 hour (excluding weekends and holidays) prior notice must be made to the Contracts Office at 301-975-4959. Notice must include the company name, name of the individual making the delivery, and the country of citizenship of the individual. For non-US citizens, the following additional information will be required: title, employer/sponsor, and address. Please ensure that the individual making the delivery brings photo identification, or they will be denied access to the facility. NIST IS NOT RESPONSIBLE FOR LATE DELIVERY DUE TO THE ADDED SECURITY MEASURES. In addition, Offerors who do not provide a 48-hour notification in order to coordinate entrance to the NIST campus assume the risk of not being able to deliver offers on time. The Government is not responsible for the amount of time required to clear unannounced visitors, visitors without proper identification and without complete information that would allow delivery (i.e. point of contact, telephone POC, building, room number, etc.) If 48 hour notification was not provided, it is suggested that your company representative or your courier service arrive at NIST at least 90 minutes prior to the closing time in order to process entry to the campus through the visitor?s center and complete delivery. ****Submission must be received by 3:30:00 p.m. local time on February 17, 2006. FAXED QUOTATIONS SHALL NOT BE ACCEPTED. ***Numbered Notes 1.***
- Place of Performance
- Address: 100 Bureau Drive, Shipping & Receiving, Building 301, Gaithersburg, Maryland
- Zip Code: 20899-0001
- Country: USA
- Zip Code: 20899-0001
- Record
- SN00978790-W 20060204/060202211738 (fbodaily.com)
- Source
-
FedBizOpps Link to This Notice
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