Loren Data's SAM Daily™

FBO DAILY ISSUE OF MARCH 02, 2006 FBO #1557
SOURCES SOUGHT

66 -- Ultrahigh Vacuum Variable Temperature Scanning Probe Microscope

Notice Date

2/28/2006
 

Notice Type

Sources Sought
 

NAICS

339111 — Laboratory Apparatus and Furniture Manufacturing
 

Contracting Office

Department of Energy, Brookhaven National Laboratory (DOE Contractor), Brookhaven, PO Box 5000 Bldg. No. 355, Upton, NY, 11973
 

ZIP Code

11973
 

Solicitation Number

VTSPM107157
 

Response Due

3/23/2006
 

Archive Date

4/7/2006
 

Description

BSA has a requirement for a UHV system designed for atomic force microscopy (AFM) and scanning tunneling microscopy (STM) at variable temperatures, and optimized for operation at temperatures from below 50 Kelvin (K) to at least 650 K. Cooling with liquid helium (LHe) or nitrogen (LN2) of at least the sample shall be possible to achieve stable temperatures below room temperature. Adequate heating shall permit stable microscopy above room temperature. In STM and non-contact AFM mode, the instrument shall be capable of microscopy with atomic resolution on conducting and insulating surfaces. A broad range of AFM imaging modes shall be possible, including contact AFM, lateral force microscopy, magnetic force microscopy, etc. The microscope and its control electronics and software shall be capable of state-of-the-art tunneling and force spectroscopy functions with highest spatial, energy, and force resolution. The instrument shall provide optical access to the sample as well as access ports for exposing the sample to gases or atomic/molecular beams. Samples and probe tips shall be exchangeable in-situ. The VT-SPM system shall consist of three interconnected, individually pumped UHV subsystems: i) a main chamber holding the AFM/STM microscope; ii) a preparation and analysis chamber holding a manipulator for sample heating and cooling, one ion sputter gun for sample cleaning, one single-pocket electron beam evaporator, and with several additional ports for attaching optional instrumentation for sample preparation, in particular a set of ports suitable for mounting an optional electron energy analyzer and dual anode X-ray source for photoelectron spectroscopy; and iii) one load-lock chamber for fast loading of samples, AFM cantilevers, and STM tips into the system. In addition it shall include all necessary peripheral systems, such as a vibration damping system, and controllers for all system functions. BNL intends to ultimately use in-house developed STM and AFM control electronics to control all imaging and spectroscopy functions of this system. However, the vendor shall provide a STM/AFM controller capable of all pertinent imaging and spectroscopy functions during system installation, training, and for the acceptance tests and demonstration of the specified system performance. In addition to the manufacturer?s specification for a state-of-the-art VT-SPM system, the instrument shall also be designed to meet BNL?s special requirements delineated herein. This, acquisition, is a, ?Best Value?, procurement. The utilization of this procedure is expected to provide the greatest overall benefit to BSA/BNL. ?Best Value? employs a trade off process that permits award to other than the lowest priced offeror or to the highest technically rated offeror. The tradeoff process, associated with Best Value involves a comparative weighing of the evaluation factors and sub-factors identified in the Request for Proposals (RFP). Specifically, the trade off process involves selecting the most advantageous offer based upon an integrated assessment of both non-cost/price factors, taken in their assigned relative importance. The following factors, in their relative order of weighting, will be utilized to evaluate the offers: - General Technical Specifications: Submit operating specifications for the proposed VT-SPM system utilizing the same format (Section and Sub-Section numbering) presented by the specifications contained in the solicitation. - Upgrades and Expandability: Upgrade components or add-on sub-systems currently existing, under development, or planned for the future should be discussed. - Performance Risk: Submit references, points of contact and telephone numbers for all installations of VT-SPM or similar systems for the last 3 years. Proposals are due March 23, 2006, by 4:00 PM, EDT, and shall be submitted to Brookhaven Science Associates, Brookhaven National Laboratory, Attention: D. Paveglio, Bldg. 355, Upton, NY 11973, by US mail This RFP has been sent to the following known manufacturers: SPECS GmbH Voltastr. 5 13355 Berlin Omicron - NanoTechnology GmbH Limburger Str. 75 65232 Taunusstein RHK Technology, Inc. 1050 East Maple Road Troy, MI 48083 All other interested manufacturers may down load the Request for Proposal attached to this announcement.
 

Place of Performance

Address: BSA/Brookhaven National Laboratory, Upton, NY

Zip Code: 11973

Country: USA
 

Record

SN00995990-W 20060302/060228212042 (fbodaily.com)
 

Source

FedBizOpps Link to This Notice
(may not be valid after Archive Date)

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