SOLICITATION NOTICE
66 -- Scanning Electron Beam Microscope Upgrades
- Notice Date
- 5/30/2006
- Notice Type
- Solicitation Notice
- NAICS
- 334516
— Analytical Laboratory Instrument Manufacturing
- Contracting Office
- Department of Commerce, National Institute of Standards and Technology (NIST), Acquisition Management Division, 100 Bureau Drive, Building 301, Room B129, Mail Stop 1640, Gaithersburg, MD, 20899-1640
- ZIP Code
- 20899-1640
- Solicitation Number
- Reference-Number-06-821-3619
- Response Due
- 6/12/2006
- Archive Date
- 6/27/2006
- Description
- The National Institute of Standards and Technology (NIST), Acquisition Management Division (AMD) of the National Institute of Standards and Technology(NIST) on behalf of the Nanoscale Metrology Group, Scanning Electron Laboratory, intends to negotiate, on a sole source basis, with FEI Company of Hillsboro, OR, for the following equipment: 1. Plantinum Deposition ? FEI Part #FP3400/30 2. Uninterruptible Power Supply ? FEI Part #FP3550/90 3. 6 Channel Detector Amplifier ? FEI Part #FP6843/50 4. Solid State 16 STEM Detector Type II ? FEI Part #6930/xx 5. SDB Cryo-Transfer System This requirement is for the purchase of the equipment listed above, which are upgrades to the NIST owned Dual Electron Beam Scanning Electron Microscope. The activity of the Scanning Electron Microscope (SEM) Laboratory of the Nanoscale Metrology Group has moved into new territories, which include work on nano-particles. There is a currently running Competence Project, which is titled: ?Metrology for the ?Fate? of Nanoparticles in Biosystems.? The work in this project calls for biological sample preparation for imaging and dimensional measurements of samples at the nano-scale. Fresh biological specimens are typically incompatible with SEM because of the vacuum necessary for instrument operation. Purchase Order Number SB1341-03-N-1895 was awarded in September 2003 to FEI Company under full and open competition, for the purchase of a NOVA 600 NanoLab No Charge (LoVac) Dual Beam System. This instrument incorporated advanced laser interferometry in the specimen stage to accurately track the X and Y motion of the stage. A standard accessory to the FEI instrument is a customized cryo-sample preparation instrument and cryo-sample stage combination. Referred to by FEI as the SDB Cryo-Transfer System, this system is only available from FEI and it is made specifically for the existing dual beam SEM. The platinum (Pt) deposition attachment will allow for sample preparation with well-defined edges, which is required for many types of work essential to the mission of the Nanoscale Metrology Group. Adding a new electron detector that could collect transmitted electrons will give different, and, in many cases, the best resolution images. These images carry and provide additional information, depend on different contrast mechanism. This new information is crucial for many nano-metrology applications. Adding an uninterruptible power supply (UPS) to SEMs will provide safety and security for these expensive instruments in the case of power failures. These are fully integrated with their instrumentation, which provides reliability and data integrity that cannot be achieved with other, third party solutions. Sole source determination is based on the following: The existing equipment and the upgrade are commercial items. FEI has developed the technology and has proprietary rights to that technology. The upgrade must be hardware and software compatible with the existing equipment. The existing equipment and technology are proprietary to FEI. FEI has no distributors, therefore, they are the only source who can provide this upgrade. The North American Industry Classification System (NAICS) code for this acquisition is 334516 and the size standard is 500 employees. No solicitation package will be issued. This notice of intent is not a request for competitive quotations, however, responses received by June 12, 2006, will be considered by the Government. A determination by the Government not to compete the proposed acquisition based upon responses to this notice is solely within the discretion of the Government. Information received will normally be considered solely for the purpose of determining whether to conduct a competitive procurement.
- Place of Performance
- Address: Contractor's Site
- Record
- SN01058894-W 20060601/060530220231 (fbodaily.com)
- Source
-
FedBizOpps Link to This Notice
(may not be valid after Archive Date)
| FSG Index | This Issue's Index | Today's FBO Daily Index Page |