SOURCES SOUGHT
66 -- Focused Ion Beam System
- Notice Date
- 8/16/2006
- Notice Type
- Sources Sought
- NAICS
- 339111
— Laboratory Apparatus and Furniture Manufacturing
- Contracting Office
- Department of Energy, Brookhaven National Laboratory (DOE Contractor), Brookhaven, PO Box 5000 Bldg. No. 355, Upton, NY, 11973
- ZIP Code
- 11973
- Solicitation Number
- FIB106699
- Response Due
- 9/13/2006
- Archive Date
- 9/28/2006
- Description
- Brookhaven Science Associates plans to acquire a Focused Ion Beam (FIB) system for the Nanopatterning Laboratory of the Center for Functional Nanomaterials (CFN) at Brookhaven National Laboratory The FIB system shall utilize a liquid metal ion source to produce ions for both lithography and nanoscale surface modification. The tool shall have a dual-beam option for high resolution imaging, as well. In addition to lithography, the FIB system will be used for various surface modification techniques such as localized ion milling; structural nanofabrication, ion implantation, or gas assisted chemical etching. The FIB must contain both a 30 kV electron beam column and 30 kV ion beam column that can form focused probes of electrons or Ga ions a few nanometers in diameter. Both the electron beam and the ion beam must scan over nanoscale areas of a chosen sample and can be used for imaging, nanofabrication, and determination of chemical composition depending on detector choice. 1. Equipment: Vendors must supply detailed descriptions and dimensioned layout drawings of the focused ion beam tool, the materials used in its construction, failure rate data and, where applicable, manufacturer?s specifications of subsystems such as vacuum pumps, gas flow controllers, and micromanipulators. The vendors proposed system will be evaluated for operational reliability, quality of construction, and cost. 2. Equipment Evaluation Criteria 2.1 Electron Optics: 2.2 Ion Optics: 2.3 Chamber and Specimen Stage 2.4 Vacuum System 2.5 Detectors, Display & Image Processing 2.6. Gas Injection System 2.7 Nanomanipulator 3. Process Criteria 3.1 For each process described below, vendors must describe how their process approaches, meets, or exceeds the listed criteria. 3.1.1 High Resolution Imaging 3.1.2 Ion Beam Fabrication 3.1.3 Transmission Electron Microscopy (TEM) Sample Preparation 4. Performance Risk 4.1 FIB production and installations 4.1.1 Relevant Experience 4.1.2 Quality of Work 4.1.3 Timeliness of Performance 5. Other Requirements 5.1 Operating Manuals 5.2 Warranty 5.3 Service Contract 5.4 Spare Parts List 5.5 Training Proposals are due September 13, 2006, by 4:00 PM, EDT, and shall be submitted to Brookhaven Science Associates, Brookhaven National Laboratory, Attention: D. Paveglio, Bldg. 355, Upton, NY 11973, by US mail This RFP has been sent to the following known manufacturers: FEI Company, 257 Loring Ave, Salem, MA 01970 Carl Zeiss SMT Inc. One Zeiss Drive, Thornwood, NY 10594 All other interested vendors may down load Request for Proposal FIB106699 from this website or contact David J. Paveglio.
- Place of Performance
- Address: Brookhaven National Laboratory, Upton, NY
- Zip Code: 11973
- Country: UNITED STATES
- Zip Code: 11973
- Record
- SN01116463-W 20060818/060816220515 (fbodaily.com)
- Source
-
FedBizOpps Link to This Notice
(may not be valid after Archive Date)
| FSG Index | This Issue's Index | Today's FBO Daily Index Page |