SOLICITATION NOTICE
66 -- X-RAY DIFFRACTION SYSTEM
- Notice Date
- 9/5/2006
- Notice Type
- Solicitation Notice
- Contracting Office
- 3610 Collins Ferry Road (MS-I07) P.O. Box 880 Morgantown, WV
- ZIP Code
- 00000
- Solicitation Number
- DE-RQ26-06NT00915
- Response Due
- 9/20/2006
- Archive Date
- 3/20/2007
- Small Business Set-Aside
- N/A
- Description
- SUBJECT: X-RAY DIFFRACTION SYSTEM DESCRIPTION: This is a combined synopsis/solicitation for commercial items prepared in accordance with the format in FAR Subpart 13.5, as supplemented with additional information included in this notice. Proposals are being requested. This solicitation number DE-RQ26-06NT00915 is issued as a Request for Quote (RFQ). This requirement is being issued as a Request for Quotation using Simplified Acquisition Procedures. The following item is being purchased by the U.S. Department of Energy, National Energy Technology Laboraotry (NETL), Pittsburgh, PA and to be delivered to our site in Albany, OR. Award will be made to the low priced, technically acceptable (equal) offeror. REQUEST PRICING FOR A X-RAY DIFFRACTION SYSTEM AS DESCRIBED: The NETL in Albany, OR, has immediate need for a research-grade X-ray Diffraction (XRD) System for analysis of a wide range of materials, including, but not limited to, metal alloys, ceramics, intermetallics, composites, and minerals. The XRD system must have maximum flexibility to address a wide variety of research questions of interest to the NETL. Specifically, the XRD system must be able to accommodate samples in either solid or powder forms, and must include the capability to accurately analyze inhomogeneous and/or oriented materials, as well as surface films and coatings. The XRD system must also be flexible enough to analyze samples with a wide range of sizes, shapes, and quantities. In addition to standard phase identification, the XRD system must also be capable of phase quantification, texture analysis, stress/strain analysis, non-ambient temperature characterization (to 1500?? C), and small angle X-ray scattering. The following system characteristics are specifically required. Deletion or substitution for any of these items must be clearly indicated and explained in the response to this solicitation, with the NETL retaining the sole right to determine if the resulting system configuration will meet its technical requirements. 1) X-ray console to house x-ray generator and provide surface for one goniometer system; capable of both computer-controlled and manual operation. 2) Vertical ???/?????? (theta/theta) goniometer (sample lies horizontal and stationary), with a minimum step size of 0.0001 2?? or less. 3) Bragg-Brentano Para-Focusing (BB) optics for high resolution. Optics will include variable computer-controlled divergence and variable computer-controlled anti-scatter slits that may be operated in either a fixed slit or variable slit mode with angle by software. 4) Cu and Co sealed X-ray tubes, including incident beam mirror for generation of a parallel beam (PB) for both radiations, as well as diffracted beam monochromators for both BB and PB for both radiations. 5) High resolution parallel beam (PB) optics for high-quality non-destructive analyses of flat/smooth materials, non-flat/smooth materials, and thin film samples. Changing from BB to PB optics must be quick and easily accomplished without the need for instrument realignment or removal of the X-ray mirror. Mirror(s) used in PB optics must be acceptable for both Cu and Co x-ray tubes with no compromise in results. The theta and two theta drives must decouple to enable PB grazing incidence diffraction measurements to be performed with fixed incident angle and a detector scan for depth profiling of thin films. 6) The following sample stages will be included with the system: a) Capillary stage for suspension, small quantity powder/granule, or air-sensitive sample analyses within a capillary holder. b) Open Eulerian cradle for texture analysis. c) Multiple collimators for steps of beam reduction to as small as 500 microns. Computer-controlled high-magnification camera for precision computer-controlled pre-scan setting of positions to be scanned, and automatic x-y position adjustment during data collection. d) Non-ambient temperature analysis stage (capable of achieving temperatures of at least 1500?? C). e) Automatic sample changer capable of computer-controlled handling of at least 6 samples. 7) In-plane attachment for ultra-thin layer phase identification. The goniometer must include a permanently mounted in-plane goniometer arm (2??????) for scanning perpendicular to the ???/??? diffraction plane. This in-plane arm allows the system to perform out-of-plane and in-plane diffraction thin film measurements in alternating sequence with no need for reconfiguration or alignment of the system from one sample to the next. 8) Powder sample holders in sufficient quantity to occupy every position in automatic sample changer quoted. Also a minimum of 2 ???zero??? or ???low??? background single crystal sample holders (may be different styles if available). At least 2 air-sensitive sample holders will also be provided. 9) System will include two detectors. One detector will be a scintillation detector and the other a high speed detector. The high speed detector will be used for applications such as multiple high temperature scans. The detector will collect data in two modes simultaneously; as a high speed solid state position sensitive detector with readout in real time and will have a second mode which is 2-D that provides information on preferred orientation and grain size with 2-D imaging software. 10) Computer with the following characteristics: a) Intel Pentium 4 operating at 2.8 GHz or higher b) Operating System: Windows XP Professional c) 1024 MB DRAM or more d) 10/100 Ethernet ready e) 120 GB or higher hard drive f) Internal CD-RW/DVD drive(s) g) 3.5" 1.44 Mb diskette drive h) 19" flat screen monitor or larger i) Microsoft Office Professional Edition 11) Any system peripherals, such as a water chiller, as required. 12) On-site Applications Training for two operators. 13) Licensing (and hardware if required) to run instrument???s proprietary software and any third party analytical software on at least two (2) computers: a) Proprietary software for phase identification must be based on, and licensed for, International Centre for Diffraction Data (ICDD) PDF-4 use. It must be capable of annual updating to use the most current ICDD data. (However, bid need not include ICDD software since the DOE laboratory currently possesses the license for two users.) 14) At minimum the system must also include software to perform the following analyses: a) Texture analysis. b) Phase identification. c) Profile fitting. d) Stress/strain analyses. e) Rietveld analyses. f) Non-ambient temperature analyses. DELIVERY: FOB Destination is required (all freight included). The provisions at 52.212-2 Evaluation ??? Commercial Items (JAN 1999) does not apply to this acquisition. Instead, the following information will be used for evaluation of offerors: An award shall be made to the responsible offeror submitting a technically acceptable quote and offering the lowest evaluated price. Evaluation is based on best value including cost and ability to meet stated requirements above. Offerors shall submit descriptive literature and drawings detailing features, technical capabilities and warranty data. Technical acceptability will be determined solely on the content and merit of the information submitted response to this provision as it compares to the minimum characteristics provided above. Therefore, it is essential that offerors provide sufficient technical literature, documentation, etc., in order for the Government evaluation team to make an adequate technical assessment of the quote as meeting technical acceptability. Price shall be the deciding factor among technically acceptable quotes. The North American Industry Classification (NIAC) is 334516. ALL INTERESTED PARTIES SHALL SUBMIT OFFERS WITH THE FOLLOWING INFORMATION: Federal Tax Identification (TIN); Dun & Bradstreet Number (DUNS); and remit to address if different. A Firm Fixed Priced Purchase Order shall be issued using the Simplified Acquisition Procedures FAR Part 13. Responses/offers are due no later than 5:00 p.m. Eastern Time Zone on September 20, 2006. Quotes may be faxed to Mr. Robert Mohn, at 412-386-5770 or E-mailed mohn@netl.doe.gov. All technical questions should be directed to the Technical Representative Ms. Cynthia Powell, 541-967-5803.
- Web Link
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(https://e-center.doe.gov/iips/busopor.nsf/UNID/1D24DB71E151F690852571E00082551A?OpenDocument)
- Record
- SN01133673-W 20060907/060905220118 (fbodaily.com)
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