SOLICITATION NOTICE
66 -- XRAY POWDER DIFFRACTION SYSTEM
- Notice Date
- 9/5/2006
- Notice Type
- Solicitation Notice
- Contracting Office
- N00178 17320 Dahlgren Road Dahlgren, VA
- ZIP Code
- 00000
- Solicitation Number
- N0017806Q3056
- Response Due
- 9/8/2006
- Archive Date
- 12/30/2006
- Description
- This synopsis is being posted to both the Federal Business Opportunities (FBO) page located at http://www.eps.gov and the Navy Electronic Commerce On Line (NECO) site located at http://www.neco.navy.mil. While it is understood that FBO is the single point of entry for posting of synopsis and solicitations to the internet, NECO is the alternative in case FBO is unavailable. Please feel free to use either site to access information posted by the Naval Sea Systems Command. DESCRIPTION: The Naval Surface Warfare Center Dahlgren Division (NSWCDD), Dahlgren, VA intends to acquire one (1) Each, Xray Powder Diffraction System, Model D8 Advance Diffractometer System, on a sole source basis from Bruker AXS, Inc., 5465 East Cheryl Parkway, Madison, WI 53711, . FAR 6.302-1 applies. A comprehensive Chemical, Biological and Radiological Material Effects Database is being developed as a result of DOD Section 1053 of the National Defense Authorization Act and a multi-functional, single, integrated platform, Xray Powder Diffraction System is required to support NSWCDD CBR S&T?s material characterization for incorporation into the database which will allow combat developers of all defense systems to address contamination survivability early in the acquisition process. Bruker AXS, model D8 Advance Diffractometer System is the only source that meets the Navy?s minimum requirements for a multi-functional system that enables characterization of a broad array of materials (alloys, coatings, composites, thermoplastics, etc), that enables automated sample changing capability for over 60 samples at a time, that enables real time corrosion analysis, that enables rapid characterization of compositional variations in alloys, composites and nanocomposites including particle size/grain size analysis, lattice parameter refinement, stress and strain detection and Rietveld refinements, that enables thin film characterization of novel, epitaxial samples , that enables structure determination of novel polycrystalline materials such as ceramics, alloys, intermetallic compounds and organometallic compounds, that enables functionality with precision to the atomic resolution level in a single, integrated platform, that enables immediate plug and play capability for components during system use without the need for recalibration, that provides a sample changer that permits a minimum of 60 samples to process without the need for human intervention and that has Goebel mirror fittings for epitaxial thin film analys is.. Required Delivery is 120 days after date of contract under F.O.B. Destination terms. Any interested parties should reference N00178-06-Q-3056 and must demonstrate in writing their capability to satisfy all the above stated minimum requirements. All responsible sources may submit their capability statements that will be considered by the Agency. Capability statements should be submitted no later than 2:00 P.M., 8 Sept 2006 to DLGR_NSWC_XDS13@navy.mil, phone 540-653-7765. See Note 22.
- Record
- SN01134239-W 20060907/060905221058 (fbodaily.com)
- Source
-
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