SOLICITATION NOTICE
66 -- Electronic Backscatter Diffraction Unit
- Notice Date
- 9/21/2006
- Notice Type
- Solicitation Notice
- NAICS
- 334513
— Instruments and Related Products Manufacturing for Measuring, Displaying, and Controlling Industrial Process Variables
- Contracting Office
- Department of the Air Force, Direct Reporting Units, USAF Academy - 10 MSG/LGC, 8110 Industrial Drive Suite 200, USAF Academy, CO, 80840-2315
- ZIP Code
- 80840-2315
- Solicitation Number
- FA7000-06-R-0051
- Response Due
- 9/25/2006
- Archive Date
- 10/10/2006
- Description
- Electronic Backscatter Diffraction System The Government intends to make a direct award to Oxford Instruments. Supplies and/or services are available from only one responsible source. No other type of supply or service will satisfy agency requirements. This Notice of Intent is NOT a request for competitive proposals. Interested persons may identify their interest and capability to meet this requirement no later than 10:00am, MST, 25 Sep 2006, stating that comparable supplies and/or services are available and would be more advantageous to the Government. Technical specifications, cut sheets, or similar must be submitted with responses for evaluation by the Government technical team. 10 MSG/LGCB has a requirement for an Electronic Backscatter Diffraction System with salient characteristics defined as follows: Electron Backscatter Diffraction Unit: needed to interface with an existing scanning electron microscope. Currently in use is a Scanning Electron Microscope (SEM) made by JEOL (Model JSM 4680) and an elemental analysis tool made by Oxford Instruments which attaches to this SEM. With the new EBSD mentioned above, the center will enhance the capability of the microscope to study microstructural details. This new tool?s hardware and software are from the same manufacturer of the SEM and EDAX systems currently used in DFEM. Both hardware and software are designed to integrate into these currently-operational systems. No additional training will be required and no integration/data conversion issues will slow down the conduct of research. Standardizing control configurations and system software minimizes test specimen loss. Multiple configurations and differing software are expected to result in lost specimens and additional costs in specimen preparation. Part No: HKLEBSD Basic - HKL Basic System for Mapping, Texture and Phase ID. Provides hardware and osftware for acquisition and indexing of Electron Backscatter Diffraction Patterns (EBSP) with SEM beam control. H1-604 Forescatter Detector System with four diodes for Nordlys II (requires an available auxillary SEM input should SEM imaging be required.) H1-102 Channel 5 ICDD PDF-2 Database for Industry (for users with existing license to this database). H1-023 Channel 5 Stage Control Software (requires SEM motorized stage and SEM external control software for RS232 or TCP/IP) H1-071 Channel 5 Advanced Texture (Salsa ODF) Software (Add. License) INSHKL HKL EDSB installation and software familiarization. Contractors must be registered in the Central Contractor Registration (CCR) database (located at www.ccr.gov) to be considered for award of a federal contract. Delivery for this requirement is FOB Destination. Delivery time is 120 days after date of award. Delivery to be make to USAF Academy, CO 80840. Point of Contact Michella Hill, 10 MSG/LGCB, 8110 Industrial Dr. USAF Academy, CO 80840-2315, (719) 333-3200, Michella.Hill@usafa.af.mil or the contracting officer Russ Jordan, 10 MSG/LGCB, 8110 Industrial Dr. USAF Academy, CO 80840-2315, (719) 333-6224, Russ.Jordan@usafa.af.mil.
- Place of Performance
- Address: USAF Academy, CO,
- Zip Code: 80840
- Country: UNITED STATES
- Zip Code: 80840
- Record
- SN01150887-W 20060923/060921221145 (fbodaily.com)
- Source
-
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