SOURCES SOUGHT
66 -- Ambient Scanning Probe Microscope System
- Notice Date
- 3/27/2007
- Notice Type
- Sources Sought
- NAICS
- 339111
— Laboratory Apparatus and Furniture Manufacturing
- Contracting Office
- Department of Energy, Brookhaven National Laboratory (DOE Contractor), Brookhaven, PO Box 5000 Bldg. No. 355, Upton, NY, 11973, UNITED STATES
- ZIP Code
- 00000
- Solicitation Number
- ACM117417
- Response Due
- 4/13/2007
- Archive Date
- 4/28/2007
- Description
- BSA has a requirement for an Ambient Scanning Probe Microscope System, designed for a number of seamlessly integrated probe operation modes. It shall operate in air or in controlled atmosphere at room temperature, as well as at variable temperatures above and below room temperature. The option of operating in liquid environments will be regarded as a plus. As a future multi-user instrument at BNL??s Center for Functional Nanomaterials, the system shall be simple to operate and reasonably rugged, and allow users to access powerful microscopy and spectro-microscopy modes after minimal training. The system shall be self-contained and include all necessary components for operation in AFM (contact mode with acquisition of vertical force and lateral friction forces, non-contact modes and several related modes as specified later) and STM imaging modes. Switching between these different microscopy modes shall be simple and fast, and shall preferably maintain a small (few ??m) region of interest on the sample in the field of view to allow imaging of the same sample area in different modes. A high resolution CCD video camera shall allow easy sample positioning and thus finding the area of interest. This, acquisition, is a, ??Best Value??, procurement. The utilization of this procedure is expected to provide the greatest overall benefit to BSA/BNL. ??Best Value?? employs a trade off process that permits award to other than the lowest priced offeror or to the highest technically rated offeror. The tradeoff process, associated with Best Value involves a comparative weighing of the evaluation factors and sub-factors identified in the Request for Proposals (RFP). Specifically, the trade off process involves selecting the most advantageous offer based upon an integrated assessment of both non-cost/price factors, taken in their assigned relative importance. The following factors, in their relative order of weighting, will be utilized to evaluate the offers: Scanning Probe Microscope Technical Specification Compliance 1. General 2.0 Scanning Probe Microscope System 2.1 General Instrument Specifications (All Operating Modes) 2.1.1 Instrument built around a high resolution XYZ sample or probe scanning stage. 2.1.2 Standard configuration -measurements possible in air and at ambient temperature. 2.1.3 Integrated stage for sample heating and cooling 2.1.4 High-resolution scientific grade upright research microscope with color video camera system integrated with the scanning stage. 2.1.5 Scan range: 10 ??m x 10 ??m x 2.5 ??m 2.1.6 Sample size 2.1.7 Vibration control 2.2 Specifications - Scanning Tunneling Microscopy (STM) 2.2.1 Tunnel Current Amplifier and Bias Filter/Buffer 2.2.2 Tunnel Spectroscopy Modes and Manipulation Modes 2.3 Specifications - Atomic Force Microscopy (AFM) 2.3.1 Beam-deflection detection (laser or LED) in force microscopy modes 2.3.2 AFM imaging modes 2.3.3 Simple cantilever exchange and alignment 2.3.4 Automatic tuning for all dynamic modes 2.3.5 Automatic tip approach control 2.3.6 Access to monitor and redirect all intermediate signals 2.4 Scanning Probe Microscope: Control Electronics, Computer & Software 2.4.1 Modular digital SPM controller 2.4.2 Controller BNC inputs for XYZ 2.4.3 Host computer/control workstation: 2.4.4 Control and data acquisition software: 3. Future upgrades 4.0 System Support Operating Manuals Warranty (Section 1.9) Training 5. 0 Performance Risk Ambient Scanning Probe Microscope production and installations Relevant Experience Quality of Work Timeliness of Performance Proposals are due April 13, 2007 by 4:00 PM, EDT, and shall be submitted to Brookhaven Science Associates, Brookhaven National Laboratory, Attention: D. Paveglio, Bldg. 355, Upton, NY 11973, by US mail.
- Place of Performance
- Address: Brookhaven National Laboratory, Upron, NY
- Zip Code: 11973
- Country: UNITED STATES
- Zip Code: 11973
- Record
- SN01259753-W 20070329/070327220253 (fbodaily.com)
- Source
-
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