SOLICITATION NOTICE
66 -- Time-of-Flight Secondary Ion Mass Spectrometer
- Notice Date
- 8/1/2007
- Notice Type
- Solicitation Notice
- NAICS
- 339111
— Laboratory Apparatus and Furniture Manufacturing
- Contracting Office
- Department of Energy, Sandia Corp. (DOE Contractor), Sandia National Laboratories, PO Box 5800 MS: 0115, Albuquerque, NM, 87185, UNITED STATES
- ZIP Code
- 00000
- Solicitation Number
- Reference-Number-SNL701611
- Response Due
- 8/13/2007
- Archive Date
- 8/28/2007
- Description
- CONTACT INFORMATION: All QUESTIONS AND PROPOSAL RESPONSES MUST BE DIRECTED IN WRITING OR BY EMAIL TO MELANIE TAPIA, mtapia@sandia.gov. DO NOT DIRECT ANY QUESTIONS OR RESPONSES TO MR. ROSEBOROUGH. Description: Sandia National Laboratories (SNL) has a critical need for the purchase of a Time-of-Flight Secondary Ion Mass Spectrometer (ToF-SIMS). The ToF-SIMS is required replace an old and outdated system currently in use in the Surface Analytical Laboratory at the Albuquerque, NM facility. ToF-SIMS is a surface analysis tool which will be used to acquire surface image, depth profile and 3D profile information from a wide variety of materials in support of many projects and programs at SNL. The fully integrated and PC controlled system will fill the need of a state-of-the-art ToF-SIMS tool capable of <100nm spatial resolution with a cluster ion source and integrated Cs and electron impact sources for depth profiling. LINE ITEM 0001: All responses shall provide a quotation for a quantity of one (1) each Time-of-Flight Secondary Ion Mass Spectrometer (ToF-SIMS) which meets or exceeds all of the following required specifications. All equipment must be new. General System 1) All equipment, connections, power supplies, electrical cords, etc., shall meet all applicable United States electrical and associated safety and health code requirements relative to the described equipment; 2) The system shall be provided with two complete copies of all schematics, installation requirements and instructions, as well as operating and maintenance manuals. All documentation shall be provided in English; 3) The system shall be tested and inspected at the seller?s site to ensure that all technical requirements of this specification have been met. All test/inspection activities shall be documented and provided (in person, via mail, or via e-mail) to the SNL Technical Contact (To be identified upon award) prior to shipment of the system. This documentation shall be reviewed to ensure that all minimum specifications have been successfully met. 4) System shall be powered using common voltages and frequencies found in the United States. 5) Must have PC-based acquisition and analysis utilizing a supplied high end PC running Microsoft Windows XP or later with flat screen monitor. 6) PC must be supplied with a 10/100 base T Ethernet port for LAN access. 7) Must have full computer control of electronics, ion sources, analyzer and vacuum hardware. 8) Must contain software that is capable of: a. Acquiring secondary ion spectrum images, depth profiles, and imaged depth profiles b. Processing data fully (spectral interpretation, profile analysis, image manipulation, 3D visualization) c. Saving raw data files that include information about all secondary ion events for an acquisition. 9) Must have an integrated self-adjusting sample charge compensation system 10) Must have a computer controlled gas flood source including gas bottle, automated leak valve and nozzle directed at the sample surface. 11) Must have a secondary electron detector for acquisition of secondary electron images during ion bombardment. Vacuum System 1) Must contain an ultra-high vacuum (UHV) system with pumping, viewports and enough ports to accommodate viewports, ion sources, analyzer, gas flood, SED detector, light source, optical camera, and sample transfer. 2) Must be designed, built upon and supplied with a vibration isolation support system 3) System must have a base pressure below 5E-10 torr. 12) System must be pumped with dry (oil less) pumps such as ion pumps, scroll pumps and turbomolecular pumps. 13) Vacuum system must be bakeable to 150C (supply hardware needed for complete vacuum system bakeout) 14) Vacuum system must contain standard copper gasket knife edge conflat seals and no materials known to contaminate UHV systems such as Silicones, Cadmium, Zinc, Mercury and Lead. 15) Bidder must supply CAD drawings for vacuum system. Sample Handling and Transfer 1) System must contain a sample entry load lock for the introduction of samples into the chamber without loss of main system vacuum. 2) Must be supplied with sample holder capable of handling samples as large as 80x80x20mm in size. 3) Must include computer controlled sample positioning in an analysis configuration that provides 5-axes of freedom: x, y, z, rotation and tilt 4) Must include optical camera(s) for viewing and aligning sample in the system. 5) Must include light source for analysis chamber. Ion Sources 1) Must provide 3 primary ion sources for sputtering and/or data acquisition. All ion sources must be capable of both pulsed and DC mode and are fully computer controlled. a. Liquid metal Bi cluster ion source capable of selecting Bi clusters (Bi1,Bi3,Bi5) and with a spatial resolution <100nm. b. Electron impact ion source capable of handling Ar, Xe, O gases. c. Cs ion source with at least 20nA of current. Time-of-Flight Analyzer 1) Must contain first order energy focusing 2) Must contain an einzel lens for secondary ion beam transportation 3) Must contain beam deflection for alignment and dynamic emittance matching 4) Must contain at least 10kV post-accelerateion optics 5) Must contain detector for collecting and reporting secondary ion events 6) Must contain a multi-stop time-to-digital converter (TDC) with at least 100ps time resolution. LINE ITEM 0002: INSTALLATION: The Contractor shall install the system. Installation shall include, at a minimum, uncrating/unpackaging of all equipment, set-up and hook-up of all equipment, start-up, and demonstration of all minimum specifications. Qualified personnel shall install the system and perform all activities necessary to ensure the system is fully functional and meets all required specifications. LINE ITEM 0003: TRAINING: The Contractor shall provide training on-site at SNL Albuquerque for SNL personnel. This training may commence immediately upon completion of installation and demonstration of specifications. Training shall include, at a minimum, a thorough demonstration of all equipment functions, equipment operation which will allow SNL personnel to operate the system to its full capabilities, and basic troubleshooting. Installation and training must be scheduled, in advance, with the SNL Technical Contact, (to be identified upon award.) LINE ITEM 0004: WARRANTY: The Contractor shall provide, at a minimum, a one year warranty on installation and equipment. The warranty shall be on-site, or return to Contractor, as determined by the Contractor. All parts and labor shall be included. DELIVERY Delivery terms shall be FOB DESTINATION. Delivery, installation and training must be completed not later than 180 days after receipt of purchase order. FOB DESTINATION means: The Contractor shall pack and mark the shipment in conformance with carrier requirements, deliver the shipment in good order and condition to the point of delivery specified in the purchase order, be responsible for loss of and/or damage to the goods occurring before receipt and acceptance of the shipment by the consignee at the delivery point specified in the purchase order; and pay all charges to the specified point of delivery. ACCEPTANCE SNL will accept the system only upon successful completion of delivery, installation, training and demonstration of all minimum specifications.
- Place of Performance
- Address: SANDIA NATIONAL LABORATORIES, PO BOX 5800, MAIL STOP 1085, Bldg. 858EL, Rm.L2168, Albuquerque, NM 87185
- Zip Code: 87185
- Country: UNITED STATES
- Zip Code: 87185
- Record
- SN01358558-W 20070803/070801220632 (fbodaily.com)
- Source
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