SOLICITATION NOTICE
66 -- Energy Dispersive X-Ray Fluorescence Spectrometer
- Notice Date
- 6/9/2008
- Notice Type
- Presolicitation
- NAICS
- 334516
— Analytical Laboratory Instrument Manufacturing
- Contracting Office
- Environmental Protection Agency, Office of Acquisition Management, EPA/Ohio, Cincinnati Procurement Operations Division 26 W. Martin Luther King Drive Cincinnati, OH 45268
- ZIP Code
- 45268
- Solicitation Number
- PR-CI-08-10934
- Response Due
- 6/24/2008
- Archive Date
- 7/24/2008
- Point of Contact
- COURTNEY R. WHITING, Contract Specialist, Phone: (513)487-2002, E-Mail: whiting.courtney@epa.gov; SANDRA V. SAVAGE, Placement Contracting Officer, Phone: (513)487-2042, E-Mail: savage.sandra@epa.gov
- Small Business Set-Aside
- N/A
- Description
- The US Environmental Protection Agency (EPA), Office of Research and Development (ORD), intends to negotiate, on a sole source basis, under the authority of FAR 13.106-1(b)(1), with Panalytical Instruments for the purchase of an Energy Dispersive X-Ray Fluorescence (EDXRF) Spectrometer. US EPA requires this instrument for the quantitative analysis of air particulate samples on thin film media in support of air pollution research, source apportionment, and human exposure programs.The EDXRF instrument must be capable of precise, accurate, and non-destructive analysis of air filters with detection limits ranging from ng/cm2 to 10 ng/cm2 for most elements heavier than Na including heavy metals. Data obtained from the EDXRF analyses will be applied in source apportionment, exposure, health effects, visibility, and other environmental studies. The EDXRF system will provide elemental concentration data to quantify local and regional air pollutant source impacts on ambient air samples. In addition, the non-destructive nature of EDXRF analyses means that delicate foils and filters can be archived indefinitely or analyzed by other methods. The above applications require an EDXRF spectrometer that meets the critical performance specifications listed below:Elemental rangeThe instrument should be capable of analyzing elements in the periodic table at least between Na and U.X-ray SourceThe instrument must be equipped with an X-ray tube capable of providing 100kV and up to 24mA to insure efficient excitation of heavy element K-lines up to Hf in the periodic table. The total power should not be less than 600W and not require an external water chiller to cool the tube. The instrument must also have the option of being fitted with either a Gd anode tube or a dual target Sc-W tube.OpticsThe instrument must have a polarizing optical path for reduction of spectral background. The optical path must also have the capability to fit up to 15 secondary scattering fluorescence targets for optimal excitation of key elements across the periodic table. The choice of available secondary targets that can be fitted to the instrument should include at least the following: Al, CaF2, Fe, Ge, Zr, Mo, Ag, Ce2O3, Al2O3, KBr, W, and Sn.DetectorThe instrument shall be fitted with a high resolution solid state Ge detector capable of a resolution of at least 135eV @Mn. The detector should have an energy range of 0.7 to 100keV. The detector should be liquid nitrogen cooled for highest resolution and be fitted with a safety sensor to automatically turn off HT to the detector in case LN2 levels fall below operating levels.Sample ChangerThe instrument should be fitted with an integral high-capacity sample changer. The sample changer should accommodate at least forty-eight 47-mm air filters in individual sample cups. The sample changer must also be capable of being continually added to during a batch analysis for a complete uninterrupted and continuous analysis.Analysis mediumsThe instrument must have the option of analyzing air filters in a vacuum environment or a helium environment.Instrument cabinet and power requirementsThe instrument should be of robust design with removable panels for easy access for service and be mounted on wheels for mobility. The instrument should be capable of being powered from a standard 100V wall outlet.SoftwareThe software should be Windows-based and be compatible with Windows 2000 and XP. The software should be designed for easy sample analysis and data retrieval as well as allow for the flexibility of application development by the user. The software should include at least the following capabilities and functionalities:? Capability of graphically comparing multiple spectra? User control of deconvolution parameters? Blank subtraction capabilities for analysis of particulate air filters? Full array of matrix correction possibilities including Alphas and Compton correction? Manual and automatic spectral line overlap correction Panalytical is the only known source able to satisfy the Government?s requirements. However, any firm believing itself capable of meeting EPA?s requirement may submit technical documentation to establish the potential of complying with the specifications. Such documentation must be submitted to the point of contact within 15 days of the posting of this notice. A determination not to compete the proposed requirement based upon responses to this notice is solely within the discretion of the Government. Information received will normally be considered only for the purpose of determining whether to conduct a competitive procurement or to proceed on a sole source basis. The applicable NAICS code is 334516. Please submit your request in writing to Courtney Whiting by e-mail to whiting.courtney@epa.gov. No telephone requests or request by fax will be honored.
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