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FBO DAILY ISSUE OF SEPTEMBER 07, 2008 FBO #2477
SOLICITATION NOTICE

66 -- ARL Quant'X EDXRF Sectrometer

Notice Date
9/5/2008
 
Notice Type
Combined Synopsis/Solicitation
 
NAICS
334516 — Analytical Laboratory Instrument Manufacturing
 
Contracting Office
Department of Health and Human Services, Food and Drug Administration, Office of Field Finance & Acquisition Services, HFT-320, 3900 NCTR Road, Jefferson, Arkansas, 72079-9502
 
ZIP Code
72079-9502
 
Solicitation Number
FDA-SOL-08-1048847
 
Archive Date
9/27/2008
 
Point of Contact
Karen L Conroy,, Phone: 781-596-7715, Sandra K. Davis,, Phone: (870) 543-7469
 
E-Mail Address
kconroy@ora.fda.gov, sandra.davis@fda.hhs.gov
 
Small Business Set-Aside
N/A
 
Description
: This is a combined synopsis/solicitation for commercial items prepared in accordance with the format in FAR 12.6, simplified acquisition procedures and the resultant purchase order will include all applicable provisions and clauses in effect through the Federal Acquisition Circular 2005-25, effective April 22, 2008. This announcement constitutes the only solicitation and a written solicitation will not be issued. The Solicitation number is fDA-SOL-08-1048847This synopsis, NAICS code334516, is to notify contractors that the government intends to issue a Purchase Order in accordance with FAR Part 13.106 for the following statement of work, under the simplified acquisition procedures. This is a total small business set-aside. Prospective offerors are responsible for downloading the solicitation and any amendments. It is the offeror's responsibility to monitor the FedBizOpps website for the release of any amendments to this solicitation. The Government reserves the right to award a contract without discussions if the Contracting Officer determines that the initial offer(s) is/are providing the Best Value and discussions are not necessary. This solicitation is issued as a Request for Quote (RFQ) The Food and Drug Administration (FDA) intends to award a purchase order for the equipment listed below. Product Description: EDXRF Technical Specifications Important specifications are highlighted in italics. General Description •The spectrometer shall be based on Energy-Dispersive X-ray Fluorescence (EDXRF). •The spectrometer shall be capable of performing quantitative elemental analysis of Na - U. •The spectrometer shall be capable of analyzing samples in solid, powder, and liquid states. •The spectrometer shall be capable of analyzing samples of any shape and size up to the dimensions of the sample chamber. •The spectrometer shall be designed for bench-top operation and, when installed with all accessories connected, shall have a compact footprint not to exceed 90 cm x 90 cm. Performance •The spectrometer shall achieve minimum detection limits (3-sigma) of < 3 ppm for Iron (Fe) and <4 ppm for Lead (Pb), when measured using Conostan Standard S-21, 100 ppm. •The spectrometer shall show counting stability of better than 0.3% RSD (relative standard deviation) during an 8-hour testing period under typical analytical conditions in a controlled laboratory environment. Site Requirements •The spectrometer shall operate from a standard electrical outlet and accept power from 110-240 VAC. •The spectrometer shall not use cooling water or require any external connections or utilities, such as gas or water, other than electrical power. X-ray Excitation •The spectrometer shall be equipped with an X-ray tube and Rh target for optimal excitation of all energy lines from Na-U. •The X-ray tube shall be air-cooled, with no external liquid cooling or pump systems allowed. •The X-ray tube shall use an end-window design with a thin 76-micron Be window for maximum flux and optimal low-keV excitation. •The X-ray tube and high-voltage generator shall produce at least 50W of power and operate over a voltage range of 4 to 50 kV, adjustable in steps 1 kV or less, and a filament current range of 0.02-1.98 mA, adjustable in steps 0.02 mA or less. •The X-ray tube shall be powered only during sample analysis and automatically turn-off after analysis completion. •The spectrometer shall not employ any shutter mechanism. •All voltage and current settings shall be selectable by user and fully software-controlled. •The X-ray generation system shall be fully protected against voltage, current and power overloads with fuse protection. •The spectrometer shall be equipped with an interlock system to protect the operator from accidental exposure to X-rays in case of electrical or mechanical malfunction. X-ray Filters and Collimators •The spectrometer shall employ primary X-ray beam filters for optimal excitation intensity, sample throughput and control over background scatter. •The spectrometer shall allow for at least seven (7) primary X-ray beam filters for selective control over peak-to-background across the periodic table. •The X-ray beam filters shall be selectable by user and fully software-controlled. •The spectrometer shall have available user-selectable collimators or apertures down to 1 mm to reduce X-ray spot size for analysis of small features or samples. X-ray Detection •The X-ray detector shall be capable of detecting elements from Sodium (Na) to Uranium (U). •The spectrometer shall use a Li-drifted Silicon Si(Li) X-ray Detector with energy resolution <155 eV as measured at 5.9 keV (Mn). •The X-ray detector shall not use Liquid Nitrogen (LN-free). •The X-ray detector shall have an active crystal area of at least 15 mm2 for highest sensitivity to low intensities. •The X-ray detector shall have an ion pump for the purpose of maintaining cryostat vacuum under He purge conditions. Signal Processing •The spectrometer shall employ Digital Pulse Processing that features: oSoftware-adjustable peak-shaping times (2-40 μs) for optimal analytical flexibility oProcessing of up to 100,000 counts per second (live) for optimal throughput. oX-ray processing and spectral range from 400 eV to 40960 eV. Sample Chamber •The sample chamber shall operate in air, vacuum or helium environments. The chamber environment must be software-controlled and user-selectable. For vacuum operation, an external vacuum pump shall be supplied by vendor. •The spectrometer shall include a sample stage or holder that accepts samples of any shape or size, up to chamber dimensions. •The spectrometer shall include a sample spinner to rotate the sample during analysis. •The spectrometer shall include an automated sample changer with capacity for at least 10 samples up to 47 mm in diameter or 20 samples up to 32 mm in diameter. •The spectrometer shall be equipped with a sample chamber that accommodates samples up to 30 cm x 30 cm x 5 cm Sample IMAGING •The spectrometer shall be equipped with an on-board High-Resolution Digital Camera. Facilitates identification, positioning and analysis of small samples or features •Spatial resolution of < 0.5 mm meets all practical needs •CCD Sensor with 510 x 492 pixels for VGA quality images •All-digital design, USB connectivity and dedicated light source •Operates in air, vacuum or helium atmospheres Computer Data System •The spectrometer shall be connected to the personal computer without the use of interface or pc boards. An ethernet connection would be preferred. •The spectrometer shall be capable of interfacing with any modern personal computer, including laptop pc’s, even when not supplied by the vendor. •Desktop PC 1.The spectrometer shall be controlled by an external desktop personal computer (PC) with the following minimum configuration: o3.0 GHz processor, 512 Mb RAM, 40 Gb hard drive o19” LCD flat-panel display oMicrosoft Windows XP Operating System oDVD/CDRW drive Operating Software General: •The operating software shall control all spectrometer operations, including X-ray source output, filter selection, sample positioning, chamber atmosphere, and data processing. •The operating software shall be capable of analyzing the entire elemental range via automated collection of multiple spectra at different excitation conditions. •The operating software shall automatically adjust the X-ray source output to achieve optimal count rate regardless of variations in sample shape, size or composition. •The operating software shall run under the Microsoft Windows XP operating system and support multiple simultaneous windows in a multi-tasking environment. •The operating software shall include hardware diagnostics with a pass-fail determination of spectrometer performance. •The operating software shall include a standardless analysis package for EDXRF to account for a variety in X-ray excitation and peak overlaps. Special Software Requirements: •The operating software shall correct for all possible overlap and background effects as well as sample-specific physical properties, such as sample area, height, and mass, any of which can affect the results. •The operating software shall scan each sample using 8 excitation conditions; obtain a complete elemental profile of the sample across multiple emission series to determine the presence or the absence of target elements without any prior knowledge of the material. •The operating software shall be delivered, pre-calibrated. The major features must include: 1.. Thorough analysis for all possible elements between Sodium and Uranium 2.. Fully pre-calibrated on the spectrometer and ready to analyze out of the box 3.. Iterative compositional analysis and spectrum deconvolution reduce false positives 4.. Clear, intuitive reporting of major, minor and trace components 5.. Correction for beam size and physical sample properties • Methods must be adjustable for specific applications. User Interface •The operating software shall support customizable desktop operating environments. •The operating software shall include password-protection for critical files to prevent inadvertent or intentional changes to analytical methods and operating parameters. •The operating software shall be capable of full analytical operation and data processing on a stand-alone computer workstation without connection to the spectrometer hardware. •The operating software shall output to a monitor, printer, network location, and any storage medium, such CDRW drive or hard drive. •The operating software shall produce analysis reports in a format compatible with MS Word and Excel applications. Spectrum Processing •The operating software shall include a spectrum display, which will feature at minimum: oSpectrum overlapping of up to 10 spectra oAutomatic spectral peak identification oManual peak identification and labeling oVertical and horizontal scaling oPrint, copy and paste operation into MS Word, Excel, Powerpoint or graphics program. •The operating software shall provide digital background filter removal, gross and net peak intensities, and least-squares empirical peak overlap deconvolution. Calibration •The operating software shall support multiple calibration techniques, including linear, quadratic, peak ratios, empirical and theoretical matrix correction (FP) algorithms. •The operating software shall have no limits or restrictions on the number of elements analyzed at one time. •The operating software shall have no limits or restrictions on the maximum number, composition or type of standards used for calibration of the spectrometer, regardless of the type of calibration technique selected. •The operating software shall display graphical calibration curves for fit evaluation. •The operating software shall allow exclusion or inclusion of any standard or any of its components from the calibration. •The operating software shall store collected spectral data for all standards and unknown samples and allow the analyst to reprocess or review any analysis at any time. Fundamental Parameters •The operating software shall include Fundamental Parameters (FP) algorithms that support standardless, semi-standardless and standard-based calibrations. •The operating software shall include Fundamental Parameters (FP) algorithms for complete multi-element composition and thickness analysis of thin deposits or layered structures, such as sputtered films or filter media. •The Fundamental Parameters algorithm shall be capable of calibration with any combination of pure elements, primary certified standards, secondary standards, and thickness or filter standards. •The Fundamental Parameters algorithm shall allow theoretical calibration and analysis of elements without given standard values by reference to elements with given values. •The Fundamental Parameters algorithm shall include the following factors in the analysis of unknown samples: oComponent stoichiometry as specified by the analyst oUnmeasured components, such as oxygen, carbon and others oAdded compounds, such as binders or grinding agents oKnown concentrations for selected components such as those obtained by other analytical techniques oSample mass loading when analyzing thin deposits or filtered particulate matter Specialized Software Modules: Standardless Analysis with required functions of: •algorithms to correct for all possible spectral overlap •algorithms to correct for background effects •correction factors that are sample-specific for physical properties, such as sample area, height, and mass •Thorough analysis for all possible elements between Sodium and Uranium •Fully pre-calibrated on the spectrometer and ready to analyze out of the box •Iterative compositional analysis and spectrum deconvolution reduce false positives •Clear, intuitive reporting of major, minor and trace components •Correction for beam size and physical sample properties •Methods can be adjusted for specific applications FP Thickness Analysis: •Measures thickness, mass and composition of up to 6 layers containing any number of elements •Corrects for thickness and matrix effects, including inter- and intra-layer absorption, secondary fluorescence, and substrate fluorescence •Calibrations can be performed using single- or multi-element bulk materials, thickness standards, or application-specific type standards •Allows analysis of standardless elements by reference to elements with standard values •Analyzes stoichiometric compounds, including but not limited to oxides, nitrides and hydrides •Allows entry of given or known thickness or composition values for any layer or element •Accounts of unmeasured (organic) components when total sample mass is specified •Intuitive, flexible graphical user interface for definition of layer structure •Analytical range from angstroms to microns and from ng/cm2 to g/cm2. Reference Standards required with instrument: •Aluminum (Al) metal sample for peak profiling and calibration. •Phosphorus (NH4H2PO4) pressed powder sample for peak profiling and calibration. •Sulfur (S) pressed powder sample for peak profiling and calibration. •Titanium (Ti) metal sample for peak profiling and calibration. •Chromium (Cr) metal sample for peak profiling and calibration. •Manganese (MnO) pressed powder sample for peak profiling and calibration. •Iron (Fe) metal sample for peak profiling and calibration. •Cobalt (Co) metal sample for peak profiling and calibration. •Nickel (Ni) metal sample for peak profiling and calibration. •Zinc (Zn) metal sample for peak profiling and calibration. •Selenium (As2O3) pressed powder sample for peak profiling and calibration. •Bromine (KBr) pressed powder sample for peak profiling and calibration. •Molybdenum (Mo) metal sample for peak profiling and calibration. •Tin (Sn) metal sample for peak profiling and calibration. •Barium (BaSO4) pressed powder sample for peak profiling and calibration. •Tungsten (W) metal sample for peak profiling and calibration. •Mercury (HgS) pressed powder sample for peak profiling and calibration. •Lead (Pb) metal sample for peak profiling and calibration. Warranty and Service •Vendor services shall include spectrometer installation and performance verification of the spectrometer and accessories at customer’s site. •Vendor services shall include two (2) days of on-site training covering general operation and maintenance of the spectrometer. One admission to a vendor-sponsored training class shall be included (excluding travel expenses). •The spectrometer shall be installed by factory-certified technicians. •All equipment, including hardware and software, shall be warranted against defective materials, workmanship and failures under normal use for a period of two years (24 months) after acceptance, per vendor’s standard terms and conditions. Delivery to be made to Food & Drug Administration/ ORA 1431 Harbor Bay Alameda California Loading Dock An official authorized to bind the Offeror must sign the terms and condition of the offer. Offerors that fail to finish required representations and certifications or reject the terms And conditions of the solicitation, may be excluded form consideration Contract type: Commercial Item- firm fixed price using Simplified Acquisition Procedures. The provision at FAR 52.212-1 Instructions to Offerors commercial Item applies to this solici- tation. The following addend have bee attached to this provision: None The Government will award a contract resulting from this solicitation to the responsible offeror whose offer conforming to the solicitation will be the most advantageous to the Government. Pricing and other factors considered. Award will be made to the lowest priced technically acceptable proposal. The government reserves the right to make an award without discussion. Offerors shall include technical specifications, descriptive material, literature, brochures and other information corresponding to each minimum required ite, which demonstrates the capabilities of the offerors equipment. A standard commercial warranty on parts and workmanship is required. The Defense Priorities and Allocations System and assigned rating are not applicable to this solicitation notice. CCR: Vendors must be registered in the Central Contractor Register (CCR) prior to the award of a contract. You may register by going to www.ccr.gov. You will need your Dun & Bradstreet number and banking information. Payment Schedule: QUESTIONS DEADLINE: All questions are to be submitted via email to Karen.conroy@fda.hhs.gov no later than September 10, 2008, 2:00pm EST. QUOTATIONS DUE: All quotations are due, via email to: Karen.conroy@fda.hhs.gov, no later than 1 2:00pm, EST on September 12, 2008 PROVISIONS and CLAUSES: The provision at FAR 52.212-1, Instructions to Offerors Commercial Items applies to this solicitation. The following agenda has been attached to this provision: None. Offerors shall include a completed copy of the provision at FAR 52.212-3, Offeror Representations and Certifications Commercial Items. The clause at FAR 52.212-4, Contract Terms and Conditions, Commercial Items applies to this acquisition. The following agenda has been attached to the clause: None. The clause at FAR 52.212-5 Contract Terms and Conditions Required to Implement Statues or Executive Orders, Commercial Items applies to this acquisition. The following FAR clauses cited are applicable: FAR 52.217-8, FAR 52.222-26, FAR 52.222-35, FAR 52.222-36, and FAR 52.232-33. Clauses and provisions are incorporated by reference and apply to this acquisition. Responses to this notice must be sent via email to Karen.conroy@fda.hhs.gov. No phone calls will be accepted. ALL OTHER SOLICITATION REQUIREMENTS REMAIN UNCHANGED. ***************************************************************************************************************** Contracting Office Address: Food & Drug Administration One Montvale Ave. 4th floor Stoneham, Ma
 
Web Link
FedBizOpps Complete View
(https://www.fbo.gov/?s=opportunity&mode=form&id=54d1ca5153b2caf4d1b878424dcead45&tab=core&_cview=1)
 
Place of Performance
Address: Food & Drug Administration, 1431 Harbor Bay, Alameda. cA 94502, Alameda, California, 94502, United States
Zip Code: 94502
 
Record
SN01660892-W 20080907/080905221538-54d1ca5153b2caf4d1b878424dcead45 (fbodaily.com)
 
Source
FedBizOpps Link to This Notice
(may not be valid after Archive Date)

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