SOLICITATION NOTICE
66 -- FEI Polara Tecnai G2 Electron Microscope and Maintenance
- Notice Date
- 2/20/2009
- Notice Type
- Combined Synopsis/Solicitation
- NAICS
- 334516
— Analytical Laboratory Instrument Manufacturing
- Contracting Office
- Department of Health and Human Services, National Institutes of Health, National Cancer Institute, Office of Acquisitions, 6120 Executive Blvd., EPS Suite 600, Rockville, Maryland, 20852
- ZIP Code
- 20852
- Solicitation Number
- RFQ-NCI-90060-MM
- Archive Date
- 3/21/2009
- Point of Contact
- Melissa P Marino, Phone: 301-402-4509, Caren N Rasmussen,, Phone: (301) 402-4509
- E-Mail Address
-
marinome@mail.nih.gov, cr214i@nih.gov
- Small Business Set-Aside
- N/A
- Description
- The National Cancer Institute requires the following instrument and preventive maintenance. This is a combined synopsis/solicitation for commercial items, prepared in accordance with format in FAR 12.6 as supplemented with additional information included in this notice. This announcement constitutes the only solicitation and a separate written solicitation will not be issued. This solicitation: No. RFQ-NCI-90060-MM includes all applicable provisions and clauses in effect through FAR FAC 2005-27 (September 2008) simplified procedures for commercial items. The North American Industry Classification Code is 334516 and the business size standard is 500 employees. I. Requirement: The contractor shall provide to NCI a pre-owned brand name FEI Polara Tecnai G2 electron microscope to accelerate the collection of high resolution structural data from a wide range of biological specimens. The contractor shall provide pricing on the following option: The pre-owned Polara shall meet the following salient characteristics: 1. Declaration of Conformity: Declaration stating that the microscope complies with a specific set of CE directives, signed by the quality assurance officer. 2. X-Ray Shielding: Test sheet with measured X-ray intensities under worst case conditions (at prescribed positions, specific illumination conditions, and specific aperture and specimen positions). Specification: 1μSv/hour at a distance of 10 cm from the surface of the microscope. 3. Earth Connection Tests: Test report on the earth connection resistances throughout the system as measured during the final assembly. Specification: resistance < 0.1 Ω. 4. Earth Leakage Current Measurements: Test report on the earth leakage current, as measured during the final assembly. Specification: < 17mA (double earth). 5. FEG Tip Data: Test report on the FEG tip properties and the emission current at several extraction voltages. 6. FEG Vacuum: Record of the FEG vacuum levels, used as a reference during the on-site installation. 7. Spot Drift: Displacement of the spot measured over a period of ten minutes. Specification: < 1nm/minute. 8. Probe Current and Spot Diameter: Measurement of the current in a small probe. Specification: > 3 nA in a spot of 2.5 nm diameter (full width at half maximum). 9. Point Resolution: Determination of the point resolution at Scherzer focus using diffractograms. Specification: 0.236 nm. 10. Cartridge Temperature: Calibration of the specimen cartridge temperature when cooled by liquid helium. This test is done by mounting a silicon diode thermometer on a special cartridge while the column is open. This test will not be repeated after installation. Specification: < 15 kelvin. 11. Specimen Drift: CCD images showing the cross correlation of subsequent high magnification images taken 1 minute apart, as well as the calculated drift rate. 11.1 Drift Rate 15 minutes after specimen insertion: Drift rate monitoring during the first 15 minutes after specimen transfer, demonstrating the relaxation time of the system. Specification after 15 minutes: < 1.5 nm/min. 11.2 Drift Rate 60 minutes after specimen insertion: Equilibrium drift rate, monitored over 5 minutes, at least 1 hour after specimen transfer. Specification: < 0.5 nm/min. 11.3 Drift Rate after Movement: The drift rate is recorded after moving 5 grid squares. Specification: < 1.5 nm/min within 1 minute after moving. 11.4 Drift Rate after Tilt: The drift rate is recorded after tilting within the 0 - 45° tilt range. Specification: < 1.5 nm/min within 1 minute after tilting. [ Y] 12. Information Limit: CCD images taken at high magnification while the image is shifted half way the exposure. The power spectra show the line resolution as well as the information limit by means of Young's fringes. 12.1 Information Limit at -70° Tilt Specification: 0.34 nm. 12.2 Information Limit at -45° Tilt Specification: 0.23 nm. 12.3 Information Limit at 0° Tilt Specification: 0.16 nm, line resolution 0.14 nm. 12.4. Information Limit at +45° Tilt Specification: 0.23 nm. 12.5 Information Limit at +70° Tilt Specification: 0.34 nm. 13. High Resolution at Low Magnification: Information limit measurement using the low dose software at 59 kX magnification on film plate. Specification: 0.20 nm as shown by means of Young's fringes, made by laser diffraction on photo paper. 14. Contrast at High Defocus: Image of a Pt/Ir specimen, taken at 59 kX magnification and 2 μm defocus, which shows 20 Thon rings in its power spectrum, as shown by means of laser diffraction on photo paper or by post-column magnification and a CCD camera. 15. SpotScan: Demonstration of the SpotScan functionality, showing both the speed with which the beam is displaced from spot to spot, as well as the resolution performance. 15.1 SpotScan Speed: SpotScan image made on the CCD. Specification: the intensity between the spots is less than 1% of the average intensity inside the spots. 15.2 SpotScan Resolution: SpotScan image of a cross grating specimen, taken at 1 μm defocus. Approximate conditions: 100 nm beam diameter (extraction voltage = 4500 V, gun lens 3, spot 1, C2 = 20 μm), 59 kX magnification, a 20 x 25 array of spots on film plate, and an exposure time of 15 ms/spot. Specification: 0.23 nm lattice is resolved as shown by means of laser diffraction on photo paper. 16. Diffraction: CCD image of an undistorted diffraction pattern obtained on molybdenum oxide, without significant streaks or ghost spots at spot sizes 6-9. Approximate conditions: extraction voltage = 3950 V, gun lens = 3, C2 = 50 μm, C1 = 50 μm. 17. Eucentricity: Residual movement of the image when tilting over the entire 140° tilt range. Proven by means of individual measurements or using the holder calibration of the tomography software. Specification: <1 μm up to +/- 45° tilt and < 2 μm up to +/- 70° tilt. 18. Field of View at 70° Tilt: Measurement of the visible part of the specimen near the center of the grid. Specification: > 200 μm measured perpendicular to the tilt axis at 70° tilt. 19. Tomography: Holder calibration files, showing the absolute displacement of the specimen as a function of tilt angle from -70° to +70° tilt, as well as the reproducibility of this movement. Specification: reproducibility <200 nm. 20. Cryo Transfer: Temperature recording of the specimen parking block during a complete cryo loading and airlock procedure. 21. Frozen Hydrated Specimen: One or more images of a frozen hydrated specimen in the microscope, demonstrating the specimen cleanliness and the amorphous ice state. 22. Ice Growth Rate: The ice contamination rate, as measured using the standard FEI ice growth measurement procedure. At helium temperature the result of this measurement will be higher due to additional growth of solid nitrogen. Also, the thickness of the condensed layer will be expressed in "ice equivalent units", so the calculation is done assuming all condensed material is ice. 22.1 Ice Growth Rate at Nitrogen Temperature Specification: < 0.3 nm/hr. 23. Dewar Hold Time: The contents of the helium dewar will be monitored versus time by means of the level meter. Specification: the dewar should not become empty within 6 hours after the last liquid helium transfer. In case a different vendor provides the microscope, it must meet the same performance criteria and warranty coverage on all components as if it were being provided directly by the manufacturer. The characteristics that must apply to the Polara preventive maintenance contract are: •Contractor shall guarantee 85% system uptime as measured on a 7x24 basis for the base year and all option years, if exercised. The uptime does not include time required for regular column bake out (estimated at 12 hours, twice a month) or other routine maintenance procedures such as column alignment, stage adjustment or detector optimization. - On-site NCI based FEI manufactured spare parts inventory to be kept by the contractor at NCI - Parts and labor as are covered. •If the contractor fails to meet the 85% uptime requirement NCI shall be compensated. •Downtime is measured and starts from the time the contractor is officially notified by NCI that the system is malfunctioning and considered down until the time the contractor confirms the reported failure is repaired. Officially notified is defined as NCI placing a telephone call to a contractor defined telephone number to report the system as not performing as specified or as down. - Downtime is defined as the time during which the system is not able to collect data. This includes reasons that fall within the system meeting or not meeting "original system specifications" and any upgrades inserted by the manufacturer.  - The system will not be presented to NCI as ready to resume uptime use until a mutually agreed to checklist/Sample run has been completed and the system passes the system tests on the checklist - For example, the completion of a tilt series checklist test that does not meet the specification of 200nm displacement will be counted as grounds for considering the system as still down. The 200nm test for example can also be grounds for placing a service call, and will initiate the down time clock. This may be possible as an automated procedure using a computerized measurement. The problem will be considered fixed when a tilt series from a mutually agreed upon test specimen meeting the 200 nm specification is successfully completed. •Downtime does not include: - Problems/interruptions with power, utilities, and room environment control conditions as provided by NCI that negatively effect the system's performance. - Problems caused by operator error - Time required for scheduled system preventative maintenance routines and upgrades. A proactive approach to preventing failures will be incorporated into this program and will include, but not be limited to, FEG tip replacement prior to failure, valve replacement prior to failure, for example. [Scheduled times to be in agreement with NCI designated responsible person or personnel]  - System use for training or applications development purposes - Repair time for third party items [e.g. Gatan parts] that do not have parts on-site at NIH at the time it is determined the downtime problem source is a third party item. The downtime clock is reinstated after the third party part is received in the TEM system room. - Downtime/uptime figures will be calculated and documented on a weekly basis. •NCI responsible for: - Notifying the contractor that the system is considered as being down, as stated above. This defines the start of the downtime clock. - Supplying a secure on-site location for housing the spare FEI parts - Preparing, loading, and running all samples; and system operation - Providing operator(s) to be available on site, to support the Contractor's Field Service Engineers [FSE], as needed. - Providing 24 hour access passes to the NIH Bethesda, MD campus, the TEM system building, TEM system room, and spare parts inventory location - Providing external high speed internet access to the TEM system computer for contractor FSE for remote monitoring and diagnosis - Providing an on site cubicle or administrative facility with internet access from which the contractor personnel can conduct daily activities. •Contractor responsible for: - Maintaining on-site spare parts inventory of FEI manufactured parts - Evaluating the need to change inventory items. - Installation of software upgrades and working with NCI personnel to schedule said upgrades such that it is confirmed as a time not considered as TEM system downtime - Operator training of NCI personnel - Weekly evaluation of the instrument for performance checks including a detailed instrument performance report. •The contractor personnel on site must be thoroughly familiar with the use of the Polara for cryoelectron tomography as well as the types of samples and sample routines being used in the specific application. Note however, that NCI is solely responsible for specimen preparation and data analysis, and will play an important role in the microscopy, but the application engineer will need to play a key role in supervising the microscopy, and being alert for factors that lead to adverse performance. FEI personnel must also be thoroughly familiar with the software and hardware workings of the TEM system and to suggest, implement fixes for system operational or process shortcomings, and to maintain the microscope in top condition. II. Delivery: Contractor(s) shall deliver the item within three (3) weeks after award to: NIH/NCI Bethesda, Maryland 20892. The Contractor that receives the award will be provided with the complete mailing address and point of contact. Upon delivery, contractor must notify the NCI Project Officer to schedule the installation date and time. III. Installation: To be carried out by the manufacturer and shall occur within approximately two weeks of delivery of the Polara Tecnai. IV. Period of Performance: Performance shall be from April 1, 2009, or upon installation whichever is later, for one year with two one year option periods. V. Payment: Payment shall be made after delivery and installation of equipment. Maintenance shall be paid quarterly in arrears. Payment authorization requires submission and approval of invoice to the address stated in block 18 of the purchase order and one copy to the NCI Project Officer. QUOTATIONS ARE DUE: March 6, 2009 at 11:00 am EST. PROVISIONS AND CLAUSES: The following FAR provisions and clauses apply to this acquisition: FAR clause 52.212-1 INSTRUCTIONS TO OFFERORS-COMMERCIAL ITEMS (April 2008); FAR clause 52.212-3 OFFEROR REPRESENTATIONS AND CERTIFICATIONS-COMMERCIAL ITEMS- (November 2007) WITH DUNS NUMBER ADDENDUM {52.204-6 (April 2008)}; FAR Clause 52.212-4 CONTRACT TERMS AND CONDITIONS - COMMERCIAL ITEMS (February 2007); FAR Clause 52.212-5: CONTRACT TERMS AND CONDITIONS REQUIRED TO IMPLEMENT STATUTES OR EXECUTIVE ORDERS-COMMERCIAL ITEMS (June 2008). The following FAR clauses cited in paragraph (b) of the clause at FAR 52.212-5 are also applicable to this acquisition; Far Clause 52.222-3 Convict Labor Far Clause 52.222-19 Child Labor-Cooperation with Authorities and Remedies Far Clause 52.222-21 Prohibition of Segregated Facilities Far Clause 52.222-26 Equal Opportunity Far Clause 52.222-35 Equal Opportunity for Special Disabled Veterans, Veterans of the Vietnam Era, and Other Eligible Veterans Far Clause 52.222-36 Affirmative Action for Workers with Disabilities Far Clause 52.222-37 Employment Reports of Special Disabled Veterans, Veterans of the Vietnam Era, and Other Eligible Veterans Far Clause 52.225-1 Buy-American Act Supplies Far Clause 52.232-33 Payment by Electronic Funds Transfer- Other than Central Contractor Registration Full text copies of the representations and certifications for other cited provisions and clauses may be obtained on line at the NCI website at http://amb.nci.nih.gov or from Melissa Marino, Contract Specialist at marinome@mail.nih.gov. OFFERORS: Offers must be submitted on an SF-1449 with a completed 52.212-3 Offeror Representations and Certifications-Commercial Items-with Duns Number Addendum, signed by an authorized representative of the offeror OR provide a copy of the valid certification registrations of the offeror's Central Contractor Registration (CCR) and Online Representations and Certifications Applications (ORCA). PLEASE NOTE: In order to receive an award, contractor must be registered in and have valid certifications in the Central Contractor Registration (CCR) (http://www.ccr.gov) and the Online Representations and Certifications Application (ORCA) (http://orca.bpn.gov). Quotations must be received in the NCI-OA contracting office by 11:00 a.m. EST on March 6, 2009. Please refer to solicitation number RFQ-NCI-90060-MM on all correspondence. No collect calls will be accepted. Faxed or electronic mail quotations will NOT be accepted.
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