SOURCES SOUGHT
66 -- RECOVERY-HIGH RESOLUTION AND HIGH PERFORMANCE LINESCALE COMPARATOR
- Notice Date
- 3/26/2009
- Notice Type
- Sources Sought
- NAICS
- 334516
— Analytical Laboratory Instrument Manufacturing
- Contracting Office
- Department of Commerce, National Institute of Standards and Technology (NIST), Acquisition Management Division, 100 Bureau Drive, Building 301, Room B129, Mail Stop 1640, Gaithersburg, Maryland, 20899-1640
- ZIP Code
- 20899-1640
- Solicitation Number
- AMD-09-SS25
- Archive Date
- 4/25/2009
- Point of Contact
- Todd D Hill, Phone: 301-975-8802
- E-Mail Address
-
todd.hill@nist.gov
- Small Business Set-Aside
- N/A
- Description
- The National Institute of Standards & Technology (NIST) seeks information on commercial vendors that are capable of providing a high resolution and high performance linescale comparator, also called a Linescale Interferometer (LSI), to calibrate the lengths between lines on dimensional standards and artifacts. After results of this market research are obtained and analyzed and specifications are developed for a linescale comparator that can meet NIST's minimum requirements, NIST may conduct a competitive procurement and subsequently award a Purchase Order. If at least two qualified small businesses are identified during this market research stage, then any competitive procurement that resulted would be conducted as a small business set-aside. This contemplated procurement is anticipated to utilize Recovery Act Funding if it is determined that responsible sources can satisfy the requirement. NIST has need for a linescale comparator that would meet the following requirements: 1.The linescale comparator (system) must measure the spacing between lines on the surface of length standards and artifacts such as meter bars or grid plates. The maximum spacing between lines to be measured will be at least 1m for one dimensional artifacts, and 300 mm for two dimensional artifacts. Only measurement along one axis is required. Two dimensional (2D) artifacts may be aligned manually to bring lines to be measured into proper alignment for the instrument, and the instrument must be capable of measuring lines offset from the central axis of a 2D artifact by ± 75 mm. 2.The system must include facilities to mount artifacts for minimum sag, align artifacts to the measurement axis, detect lines with an optical microscope, and measure the spacing between lines using optical interferometry with evacuated beam paths. During operation the instrument must maintain the artifact at a constant temperature of 20° ± 0.003° C, and in a clean environment at the level of class 10 or better. 3.The system must accept artifacts with maximum dimensions at least 1050 mm long, 300 mm wide, and 75 mm tall. The artifact may be constructed from a variety of materials, including glass, fused quartz, Zerodur, Invar, or steel, and the maximum artifact mass shall be at least 6 kg. The minimum line width for lines to be measured shall be greater than or equal to 100 nm, and the minimum line spacing greater than or equal to 500 nm. The lines may appear bright or dark relative to background in a reflectance microscope. 4.The instrument must be able to measure the spacing between two lines separated by approximately 1000 mm, with an uncertainty less than 35 nm with a 95% confidence level. NIST is seeking responses from all responsible sources, including large, foreign, and small businesses. Small businesses are defined under the associated NAICS code for this effort, 334516, as those domestic sources having 500 employees or less. Please include your company’s size classification in any response to this notice. Companies that manufacture these systems are requested to email a detailed report describing their abilities to todd.hill@nist.gov no later than the response date for this sources sought notice. The report should include achievable specifications and any other information relevant to your product or capabilities. Also, the following information is requested to be provided as part of the response to this sources sought notice: 1. Name of the company that manufactures the system components for which specifications are provided. 2. Name of company(ies) that are authorized to sell the system components, their addresses, and a point of contact for the company (name, phone number, fax number and email address). 3. Indication of number of days, after receipt of order that is typical for delivery of such systems. 4. Indication of whether each instrument for which specifications are sent to todd.hill@nist.gov are currently on one or more GSA Federal Supply Schedule contracts and, if so, the GSA FSS contract number(s). 5. Any other relevant information that is not listed above which the Government should consider in developing its minimum specifications and finalizing its market research.
- Web Link
-
FedBizOpps Complete View
(https://www.fbo.gov/?s=opportunity&mode=form&id=d79b2732c84b2ac64988ea09820e6bb0&tab=core&_cview=1)
- Place of Performance
- Address: NIST, Gaithersburg, Maryland, 20899, United States
- Zip Code: 20899
- Zip Code: 20899
- Record
- SN01778991-W 20090328/090326220846-d79b2732c84b2ac64988ea09820e6bb0 (fbodaily.com)
- Source
-
FedBizOpps Link to This Notice
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