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FBO DAILY ISSUE OF APRIL 11, 2009 FBO #2693
SOURCES SOUGHT

66 -- RECOVERY: Low temperature scanning probe microscope (LT SPM)

Notice Date
4/9/2009
 
Notice Type
Sources Sought
 
NAICS
423490 — Other Professional Equipment and Supplies Merchant Wholesalers
 
Contracting Office
Department of Energy, Pacific Northwest National Laboratory - Battelle (DOE Contractor), PNNL Contracts, PO Box 999, Richland, Washington, 99352
 
ZIP Code
99352
 
Solicitation Number
EMSL_ARRA_12_1
 
Archive Date
5/8/2009
 
Point of Contact
(Ms.) Mauri Tionko,, Phone: 509-375-5973, Susan M Turner,, Phone: 509-375-3810
 
E-Mail Address
mauri.tionko@pnl.gov, susan.turner@pnl.gov
 
Small Business Set-Aside
N/A
 
Description
Battelle, Pacific Northwest Division, Management & Operating Contractor of the U.S. Department of Energy's Pacific Northwest National Laboratory (PNNL), is requesting information from prospective offers to provide: Low Temperature STM/AFM The low temperature scanning probe microscope (LT SPM) incorporates dedicated cryo-temperature scanning tunneling microscope (STM) and a new generation (Q-plus) non-contact atomic force microscope (NC AFM) in the temperature range down to 5 K under ultra-high vacuum (UHV) conditions. LT SPM is fully integrated into dual chamber multi-technique UHV system that consists of a LT SPM main chamber and a combined analysis/preparation chamber (contain imaging chamber for low temperature scanning probe microscopy and analysis chambers for multi-technique surface analysis and sample preparation) allowing for various surface analysis techniques: XPS, UPS, ISS, LEED, AES, as well as preparation techniques such as thin film evaporation, ion sputtering, and heating. This capability will be combined with hyperthermal molecular beam apparatus and high-pressure reaction cell and the complete system will be a truly unique system for fundamental studies of single site catalytic reactivity. Both imaging and analysis chambers should be independently pumped by a combination of ion, titanium sublimation, and turbo-molecular pumps, so that the both systems can operate under pressure less than 110-10 Torr. LT STM/AFM operation modes should include STM, Non-Contact (NC) AFM, Scanning Tunneling Spectroscopy (STS), Inelastic Tunneling Spectroscopy (IETS), and Force Spectroscopy. Instrument should provide or be upgradeable for Electrostatic Force Microscope, Magnetic Force Microscopy, Lateral Force Microscopy, Scanning Kelvin Probe Microscopy, Scanning Thermoelectric Microscopy, and Nanolitography (atom manipulation). Both STM and NC AFM should operate in variable temperature range of 3 - 400 K with an atomic resolution (STM on metal) in a full temperature range and vertical resolution of 0.01 nm. Analysis chamber should be equipped with following surface analysis techniques: X-rays Photoelectron Spectroscopy (XPS), Ultra-Violet Photoelectron Spectroscopy (UPS), Auger Electron Spectroscopy (AES), Ion Scattering Spectroscopy (ISS), and Low Energy Electron Diffraction (LEED). Analysis chamber should be able to accommodate an additional instrumentation for molecular beam exposure of sample: 2 or 3 effusion cells, gas doser, quartz microballance and sample shutter, and mass-spectrometer for Thermal Programmed desorption. Analysis chamber should include a sample manipulator with x, y, and z translations, as well as azimuthal rotation. Contractor must specify the x, y, and z translation range. Manipulator should provide sample heating and cooling capabilities in the temperature range of 50 - 1300 K or wider. This chamber should consist of at least 125 mm mean radius hemispherical analyzer for XPS and UPS, XPS and UPS sources, and Ion beam and plasma cleaning capabilities. Interested firms shall also provide information in the following areas as available: 1) A description of current experience, knowledge and capabilities directly applicable to the performance of the scope identified. 2) Brochures providing descriptions of equipment, maintenance and standard warranty, along with a current published commercial pricelist. This Request for Information (RFI) is part of a market research effort that will best address PNNL's needs. This RFI is issued for information and planning purposes only and does not constitute a solicitation. Battelle does not intend to award a contract on the basis of this RFI, or to otherwise pay for information received in response to this RFI. Please provide your expression of interest to the attention of the points of contact. If you have questions or need additional information, they must also be submitted in writing to the points of contact.
 
Web Link
FedBizOpps Complete View
(https://www.fbo.gov/?s=opportunity&mode=form&id=f6e8bd067eafdff37bd4ca4cec7f31b0&tab=core&_cview=1)
 
Place of Performance
Address: Richland, Washington, 99352, United States
Zip Code: 99352
 
Record
SN01789096-W 20090411/090409215216-f6e8bd067eafdff37bd4ca4cec7f31b0 (fbodaily.com)
 
Source
FedBizOpps Link to This Notice
(may not be valid after Archive Date)

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