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FBO DAILY ISSUE OF JUNE 13, 2009 FBO #2756
SOLICITATION NOTICE

66 -- The National Institute of Standards and Technology (NIST) has a requirement for an Electrical Scanning Probe to be used in Center for Nanoscale Science & Technology at NIST, Gaithersburg, MD.

Notice Date
6/11/2009
 
Notice Type
Combined Synopsis/Solicitation
 
NAICS
334515 — Instrument Manufacturing for Measuring and Testing Electricity and Electrical Signals
 
Contracting Office
Department of Commerce, National Institute of Standards and Technology (NIST), Acquisition Management Division, 100 Bureau Drive, Building 301, Room B129, Mail Stop 1640, Gaithersburg, Maryland, 20899-1640
 
ZIP Code
20899-1640
 
Solicitation Number
NB162030-9-05205
 
Archive Date
7/15/2009
 
Point of Contact
Janet M. Lamb, Phone: 3019756205, Todd D Hill, Phone: 301-975-8802
 
E-Mail Address
janet.lamb@nist.gov, todd.hill@nist.gov
(janet.lamb@nist.gov, todd.hill@nist.gov)
 
Small Business Set-Aside
Total Small Business
 
Description
THIS IS A COMBINED SYNOPSIS/SOLICITATION FOR COMMERCIAL ITEMS PREPARED IN ACCORDANCE WITH THE FORMAT IN FAR SUBPART 12.6 – STREAMLINED PROCEDURES FOR EVALUATION AND SOLICITATION FOR COMMERCIAL ITEMS-AS SUPPLEMENTED WITH ADDITIONAL INFORMATION INCLUDED IN THIS NOTICE. SIMPLIFIED ACQUISITION PROCEDURES ARE UTILIZED IN THIS PROCUREMENT. THIS ANNOUNCEMENT CONSTITUTES THE ONLY SOLICITATION; QUOTATIONS ARE BEING REQUESTED, AND A WRITTEN SOLICITATION DOCUMENT WILL NOT BE ISSUED. This solicitation is a Request for Quotation (RFQ). The solicitation document and incorporated provisions and clauses are those in effect through Federal Acquisition Circular (FAC) 2005-32 *** The associated North American Industrial Classification System (NAICS) code for this procurement is 334515 with a small business size standard of 500 employees. This acquisition is 100% small business set-aside. In accordance with the Non-Manufacturer Rule, to qualify under a small business set-aside, the distributor and the manufacturer must qualify as a Small Business under the NAICS code identified above. ***The National Institute of Standards and Technology (NIST) has a requirement for an Electrical Scanning Probe to be used in Center for Nanoscale Science & Technology at NIST, Gaithersburg, MD. *** Development of instrumentation for the nanoscale characterization of processes related to energy conversion, storage and transport is one of the main thrusts of Center for Nanoscale Science & Technology. The proposed new acquisition of an Electrical Scanning Probe compatible with the existing multi-probe system will enable a comprehensive electro-optical nanoscale analysis of photovoltaic materials and solar cells. The Electrical Scanning Probe is intended for nanoscale electrical measurements and has to be compatible with the existing Multiview 400 multi-probe NSOM/AFM system. The current multi-probe system has completely free vertical optical axis (both above and below the sample) and two optical microscopes (upright and inverted, respectively). With the addition of the new scanning electrical probe, the multi-probe system will be used for advanced electro-optical characterization of photovoltaic materials. ***All interested Offerors shall provide a quote for the following line item(s): Line Item 0001: Quantity One (1) Each, Electrical Scanning Probe. The contractor shall meet or exceed the following specifications: Minimum Specifications 1.The electrical scanning probe shall be compatible with the open vertical optical axis and with multi-probe operation of the existing system. It shall fit within the environmental chamber enclosure. a.In the working position, the probe shall occupy a sector with angle less than 30 deg within 20 mm distance from the optical axis and a sector with angle less than 75 deg for the rest of the probe length. b.In the working position, the probe height shall be less than 45 mm within 20 mm from the optical axis and less than 80 mm for the rest of the probe length. c.Hardware required for mounting the probe to the base plate and electrical feedthroughs shall be provided. 2.The scanning probe (hereafter referred to as “SP”) shall be able to act both as an Electrical Probe (EP) with force feedback and as an atomic-force-microscope (AFM). In addition to the fine scanning capabilities necessary for EP and contact AFM operation and non-contact AFM operation, coarse positioning capabilities are also required for the SP. a.SP fine scanning should be achieved via a piezoelectric positioning in both lateral (x and y) and vertical (z) directions. SP fine scan range should be at least 30 microns in all three directions (x, y, and z). SP fine scan resolution over the entire scan volume should be less than 0.05nm in z, as well as less than 0.15nm in both x and y. b.In order to eliminate possibility of optical interference with photonic signals on samples under test, feedback mechanism for monitoring and setting distance between SP tip and sample should not be based on beam-bounce or other optical techniques involving light from a laser or other light source; a non-optical feedback technique is required, such as, for example, tuning-fork feedback or piezoresistive sensor. c.SP motorized coarse positioning in x, y, and z should be provided. SP coarse-positioning range should be at least 5mm in both x and y, as well at least 10mm in z. SP coarse-positioning resolution should be less than 0.25 microns in both x and y, as well as less than 0.1 microns in z. d.Imaging resolution in AFM modes shall be 0.1 nm or better in vertical direction. e.Electrical Probe shall be able to stay in continuous contact with 50 nm by 50 nm metal pads longer than 1 min. Electrical Probe shall be able to perform spreading resistance measurements. f.Vendor must offer a variety of exchangeable, cantilevered, exposed probe tips which are compatible with the SP. At least ten vendor-supplied probe tips capable of operating both as Electrical tip and AFM tip should be included. 3.Probe controller (including hardware and software) should allow for implementation of various scanned imaging modes, including but not limited to: a.Contact-mode AFM imaging (phase and error signals). b.Non-contact-mode AFM imaging (phase and error signals). c.Electrical Measurements controlling contact force d.The system controller hardware should have at least 16-bit resolution image signal acquisition. The maximum displayed image size should be no less than 1024 x 1024 pixels. e.User operation of the Electrical Probe should be enabled via a vendor-supplied Window XP workstation and user-friendly software, allowing real-time image display. 4.A minimum of two working days of onsite installation and training should be provided. ****The Government will evaluate information based on the following evaluation criteria: 1) Technical Capability factor "Meeting or Exceeding the Requirement," 2) Past Performance, 3) Relevant Experience, and Price. Technical Capability, Past Performance, and Relevant Experience, when combined, are more important than Price. Award shall be made on a best value basis. ****Evaluation of Technical Capability shall be based on the information provided in the quotation. Quotations shall include the make and model of the products, manufacturer sales literature or other product literature, which CLEARLY DOCUMENTS that the offered product(s) meet or exceed the specifications stated above. ****Past Performance will be evaluated to determine the overall quality of the product and service, provided by the Contractor. Evaluation of Past Performance shall be based on the references provided IAW FAR 52.212-1(b)(10) and/ or information provided by NIST or its’ affiliates. Quoters shall provide a list of at least three (3) references to whom the same or similar products have been sold. The list of references shall include, at a minimum: The name of the reference contact person and the company or organization; the telephone number of the reference contact person; the contract or grant number; the amount of the contract and the address and the telephone number of the Contracting Officer if applicable; and the date of delivery or the date services were completed. ****Relevant Experience shall be evaluated to determine the extent of the Contractor's experience and knowledge in providing similar Electrical Scanning Probes. Evaluation of relevant experience may be based on contacts used for past performance; however, the vendor should provide additional references relating to its relevant experience information, if necessary. ***Delivery shall be FOB Destination and completed in accordance with the Contractor’s commercial schedule. FOB Destination means: The contractor shall pack and mark the shipment in conformance with carrier requirements, deliver the shipment in good order and condition to the point of delivery specified in the purchase order, be responsible for any loss of and/or damage to the goods occurring before receipt and acceptance of the shipment by the consignee at the delivery point specified in the purchase order; and pay all charges to the specified point of delivery. The contractor shall deliver all line items to NIST, Building 301, Shipping and Receiving, Gaithersburg, MD 20899. *** *** The Contractor shall state the warranty period and coverage provided. *** *** Inspection and Acceptance Criteria 1. Visual-Physical check at NIST laboratory for adherence to design specifications. 2. Performance check at NIST laboratory for adherence to performance specifications. The tests will be performed as soon as the instrument is ready, as determined by the contractor, and may be witnessed by the contractor. *** ***The contractor shall pack and mark the shipment in conformance with carrier requirements, deliver the shipment in good order and condition to the point of delivery specified in the purchase order, be responsible for any loss of and/or damage to the goods occurring before receipt and acceptance of the shipment by the consignee at the delivery point specified in the purchase order; and pay all charges to the specified point of delivery. The contractor shall deliver all line items to NIST, Building 301, Shipping and Receiving, Gaithersburg, MD 20899-0001. *** The full text of a FAR provision or clause may be accessed electronically at http://acquisition.gov/comp/far/index.html. The following provisions apply to this acquisition: 52.212-1 Instructions to Offerors-Commercial Items; 52.212-3 Offerors Representations and Certifications- Commercial Items. Offerors must complete annual representations and certifications on-line at http://orca.bpn.gov in accordance with FAR 52.212-3 Offerors Representations and Certifications- Commercial Items. If paragraph (j) of the provision is applicable, a written submission is required. The following clauses apply to this acquisition: 52.204-7 Central Contractor Registration; 52.212-4 Contract Terms and Conditions—Commercial Items; 52.212-5 Contract Terms and Conditions Required to Implement Statutes or Executive Orders— Commercial Items including subparagraphs: 52.219-6, Notice to Total Small Business Set Aside; 52.222-3, Convict Labor; 52.222-19, Child Labor – Cooperation with Authorities And Remedies; 52.222-21, Prohibition of Segregated Facilities; 52-222-26, Equal Opportunity; 52.222-35, Equal Opportunity for Special Disabled Veterans; 52.222-36, Affirmative Action for Workers with Disabilities; 52.222-37, Employment Reports on Special Disabled Veterans; 52.225-3, Buy American Act –NAFTA; 52.225-13, Restriction on Certain Foreign Purchases; and 52.232-33, Payment by Electronic Funds Transfer-Central Contractor Registration. Department of Commerce Agency-Level Protest Procedures Level above the Contracting Officer is also incorporated. It can be downloaded at www.nist.gov/admin/od/contract/agency.htm. ***All vendors shall submit the following: 1) An original and one (1) copy of a quotation which addresses all Line Items; 2) One (1) Technical description and/or product literature; 3) at least three (3) references for Past Performance/Relevant Experience; 4) Description of commercial warranty; and 5) One (1) copy of the most recent published price list. *** Faxed quotes will NOT be accepted. Emailed quotes will be accepted. *** ***All quotes shall be received not later than 1:00 PM local time, on June 30, 2009 at the National Institute of Standards & Technology, Acquisition Management Division, 100 Bureau Drive, Building 301, Room B125, Mail Stop 1640, Gaithersburg, MD 20899-1640, Attn: Janet Lamb. If quotes are hand delivered, delivery shall be made on the actual due date through Gate A, and a 48 hour (excluding weekends and holidays) prior notice shall be made to the Contracts Office at 301-975-4959. NIST is not responsible for late delivery due to the added security measures. In addition, Offerors who do not provide 24-hour notification in order to coordinate entrance to the NIST campus shall assume the risk of not being able to deliver offers/quotes on time. The Government is not responsible for the amount of time required to clear unannounced visitors, visitors without proper identification and without complete information that would allow delivery (i.e. point of contact, telephone POC, bldg., room number, etc.). If 24 hour notification was not provided, it is suggested your company representative or your courier service arrive at NIST at least 90 minutes prior to the closing time in order to process entry to the campus through the visitor center and complete delivery. Notice shall include the company name, name of the individual making the delivery, and the country of citizenship of the individual. For non-US citizens, the following additional information will be required: title, employer/sponsor, and address. Please ensure that the individual making the delivery brings photo identification, or they will be denied access to the facility.
 
Web Link
FBO.gov Permalink
(https://www.fbo.gov/spg/DOC/NIST/AcAsD/NB162030-9-05205/listing.html)
 
Place of Performance
Address: 100 Bureau Drive, Gaithersburg, Maryland, 20899, United States
Zip Code: 20899
 
Record
SN01842564-W 20090613/090611235715-89c9c335832ae062460851cecf32a7e7 (fbodaily.com)
 
Source
FedBizOpps Link to This Notice
(may not be valid after Archive Date)

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