SOURCES SOUGHT
66 -- Atomic Force/Electrochemical Microscope with Raman Spectrometer
- Notice Date
- 2/3/2010
- Notice Type
- Sources Sought
- NAICS
- 334516
— Analytical Laboratory Instrument Manufacturing
- Contracting Office
- Department of Commerce, National Institute of Standards and Technology (NIST), Acquisition Management Division, 100 Bureau Drive, Building 301, Room B129, Mail Stop 1640, Gaithersburg, Maryland, 20899-1640
- ZIP Code
- 20899-1640
- Solicitation Number
- AMD-10-SS45
- Archive Date
- 3/5/2010
- Point of Contact
- Todd D Hill, Phone: 301-975-8802
- E-Mail Address
-
todd.hill@nist.gov
(todd.hill@nist.gov)
- Small Business Set-Aside
- N/A
- Description
- The National Institute of Standards & Technology (NIST) seeks information on commercial vendors that are capable of providing a measurement system combining functionality of Atomic Force Microscope and Scanning Electrochemical Microscope with Raman Spectroscopy System (AFM-SECM-Raman). The measurement system is to be used in the energy research program of the Center for Nanoscale Science and Technology. The main purpose of the system is to enable a comprehensive nanoscale analysis of materials transformations at interfaces with extensive nanoscale structure such as used for photoanodes, batteries electrodes, solar cells and catalysts in fuel cells. After results of this market research are obtained and analyzed and specifications are developed for AFM-SECM-Raman system that can meet NIST's minimum requirements, NIST may conduct a competitive procurement and subsequently award a Purchase Order. If at least two qualified small businesses are identified during this market research stage, then any competitive procurement that resulted would be conducted as a small business set-aside. NIST has a need for a measurement system that would meet the following functional requirements: The main purpose of the system is to enable spectro-electrochemical characterization of electrocatalytic processes in liquid media with high spatial and chemical resolution. The AFM-SECM-Raman System shall consist of an AFM capable of imaging surface morphology in liquid and air environment using contact and tapping modes; capable of measuring the local electrochemical activity on surfaces and mapping this activity as a function of position and correlating such maps to morphology and chemical composition as determined with Raman spectroscopy; capable of collecting current-voltage characteristics at select locations on dry specimens and mapping the local conductivity as a function of location, correlating the conductivity to morphology, and to composition as determined by Raman spectroscopy; capable of collecting Raman or photoluminescence spectra at arbitrary locations, as well as mapping select peaks as a functions of position The AFM-SECM-Raman System shall be equipped with the following capabilities: a. Atomic force microscopy in liquid and air. b. Scanning electrochemical microscopy with integrated potentiostat, liquid cell, counter and reference electrodes c. Raman microscopy/spectroscopy with three laser excitation lines (532 nm, 633 nm, 785 nm) and high resolution spectrometer/camera NIST is seeking responses from all responsible sources, including large, foreign, and small businesses. Small businesses are defined under the associated NAICS code for this effort, 334516, as those domestic sources having 500 employees or less. Please include your company’s size classification in any response to this notice. Companies that manufacture such systems are requested to email a detailed report describing their abilities to todd.hill@nist.gov no later than the response date for this sources sought notice. The report should include achievable specifications and any other information relevant to your product or capabilities. Also, the following information is requested to be provided as part of the response to this sources sought notice: 1. Name of the company that manufactures the system components for which specifications are provided. 2. Name of company(ies) that are authorized to sell the system components, their addresses, and a point of contact for the company (name, phone number, fax number and email address). 3. Indication of number of days, after receipt of order that is typical for delivery of such systems. 4. Indication of whether each instrument for which specifications are sent to todd.hill@nist.gov are currently on one or more GSA Federal Supply Schedule contracts and, if so, the GSA FSS contract number(s). 5. Any other relevant information that is not listed above which the Government should consider in developing its minimum specifications and finalizing its market research. Point of Contact Todd Hill, Contracting Officer, Phone (301) 975-8802, Email todd.hill@nist.gov
- Web Link
-
FBO.gov Permalink
(https://www.fbo.gov/spg/DOC/NIST/AcAsD/AMD-10-SS45/listing.html)
- Place of Performance
- Address: NIST, Gaithersburg, Maryland, 20899, United States
- Zip Code: 20899
- Zip Code: 20899
- Record
- SN02056839-W 20100205/100203235238-67099524c90d32d3b846509d74b50396 (fbodaily.com)
- Source
-
FedBizOpps Link to This Notice
(may not be valid after Archive Date)
| FSG Index | This Issue's Index | Today's FBO Daily Index Page |