AWARD
66 -- RECOVERY: Focused Ion Beam (FIB)/Scanning Electron Microscopy (SEM) Microscope - AWARD
- Notice Date
- 5/25/2010
- Notice Type
- Award Notice
- NAICS
- 334516
— Analytical Laboratory Instrument Manufacturing
- Contracting Office
- Department of Commerce, National Institute of Standards and Technology (NIST), Acquisition Management Division, 100 Bureau Drive, Building 301, Room B129, Mail Stop 1640, Gaithersburg, Maryland, 20899-1640
- ZIP Code
- 20899-1640
- Solicitation Number
- SB1341-10-RQ-0066
- Archive Date
- 6/5/2010
- Point of Contact
- Dennis G. Gagliardi, Phone: 3019756321, Patrick K Staines, Phone: (301)975-6335
- E-Mail Address
-
dennis.gagliardi@nist.gov, patrick.staines@nist.gov
(dennis.gagliardi@nist.gov, patrick.staines@nist.gov)
- Small Business Set-Aside
- N/A
- Award Number
- SB1341-10-SU-0522
- Award Date
- 5/21/2010
- Awardee
- Carl Zeiss SMT Inc., 1 Corporate Way, Peabody, Massachusetts 01960, United States
- Award Amount
- $1,423,700
- Line Number
- 0001, 0002, 0003, 0004
- Description
- Award RECOVERY: This requirement is being funded in whole or in part by the American Recovery and Reinvestment Act of 2009 (ARRA) Public Law 111-5. THIS NOTICE IS PROVIDED FOR INFORMATIONAL PURPOSES ONLY. This award notice is issued in accordance with the guidance for the American Recovery and Reinvestment Act of 2009. The National Institute of Standards and Technology awarded a firm fixed-price contract for a Focused Ion Beam (FIB)/Scanning Electron Microscopy (SEM) Microscope with four (4) years extended warranty including consumable parts. This requirement has been awarded on a competitive basis to Carl Zeiss SMT Inc.
- Web Link
-
FBO.gov Permalink
(https://www.fbo.gov/spg/DOC/NIST/AcAsD/Awards/SB1341-10-SU-0522.html)
- Record
- SN02159699-W 20100527/100525235245-227ef8d18590dfd468795e18cc895e67 (fbodaily.com)
- Source
-
FedBizOpps Link to This Notice
(may not be valid after Archive Date)
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