MODIFICATION
66 -- Atomic Force-Scanning Electrochemical Microscope-Raman Spectroscopy System
- Notice Date
- 7/16/2010
- Notice Type
- Modification/Amendment
- NAICS
- 334516
— Analytical Laboratory Instrument Manufacturing
- Contracting Office
- Department of Commerce, National Institute of Standards and Technology (NIST), Acquisition Management Division, 100 Bureau Drive, Building 301, Room B129, Mail Stop 1640, Gaithersburg, Maryland, 20899-1640
- ZIP Code
- 20899-1640
- Solicitation Number
- SB1341-10-RQ-0462
- Archive Date
- 9/30/2010
- Point of Contact
- Joni L Laster, Phone: 301-975-8397, Todd D Hill, Phone: 301-975-8802
- E-Mail Address
-
joni.laster@nist.gov, todd.hill@nist.gov
(joni.laster@nist.gov, todd.hill@nist.gov)
- Small Business Set-Aside
- N/A
- Description
- The purpose of this amendment is to address the following vendor questions and answers: Question : NIST requires the capability to scan the stage and the tip. The tip should be placed within an area of 10 um x 10 um without having to move the stage. To clarify: This AFM will scan the Tip in AFM imaging modes up to 10um X 10um and the Stage in AFM imaging modes 100um X 100um? Answer: Yes, that is correct Question: NIST requires co-located AFM/Raman. Does the co-located AFM/Raman have to be simultaneously collected or is a sequential AFM then Raman measurement sufficient? Answer: Simultaneous Raman/AFM acquisition
- Web Link
-
FBO.gov Permalink
(https://www.fbo.gov/spg/DOC/NIST/AcAsD/SB1341-10-RQ-0462/listing.html)
- Place of Performance
- Address: 100 Bureau Drive, Gaithersburg, Maryland, 20899, United States
- Zip Code: 20899
- Zip Code: 20899
- Record
- SN02208337-W 20100718/100716234836-ad7a0d8b744a0a4437ebfa26ea29cc7e (fbodaily.com)
- Source
-
FedBizOpps Link to This Notice
(may not be valid after Archive Date)
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