MODIFICATION
66 -- Scanning Electron Microscope
- Notice Date
- 8/3/2010
- Notice Type
- Modification/Amendment
- NAICS
- 334516
— Analytical Laboratory Instrument Manufacturing
- Contracting Office
- Department of the Air Force, Air Force Materiel Command, AFNWC/PKO - Kirtland (Operational Contracting Division), AFNWC/PKO Operational Contracting Division, 2000 Wyoming Blvd SE, Bldg 20604, Room B-9, Kirtland AFB, New Mexico, 87117-5606, United States
- ZIP Code
- 87117-5606
- Solicitation Number
- F2KBAB0147A0022
- Archive Date
- 8/25/2010
- Point of Contact
- Heather L. Miller, Phone: 505-853-4467, Brian J. Clark, Phone: 505-846-8146
- E-Mail Address
-
heather.miller@kirtland.af.mil, brian.clark@kirtland.af.mil
(heather.miller@kirtland.af.mil, brian.clark@kirtland.af.mil)
- Small Business Set-Aside
- N/A
- Description
- This is a combined synopsis/ solicitation for commercial items prepared in accordance with the format in FAR subpart 12.6, as supplemented with additional information included in this notice. This announcement constitutes the only solicitation; proposals are being requested and a written solicitation will not be issued. The NAICS Code for this synopsis/solicitation is 334516, Size Standard 500. Solicitation/ Purchase Request number F2KBAB0147A002 is issued as a Request for Quote (RFQ). This document incorporates provisions and clauses that are in effect through Federal Acquisition Circular 2005-42 effective 16 June 2010. The Government intends to award on contract line item number: Description: Scanning Electron Microscope (SEM) CLIN 0001-AA: 1. Variable Pressure SEM with a Large Specimen Chamber - 5 Axis Motorized Computer Stage with an area of at least 75mm x 50mm. - Capable of accommodating at least 8" Diameter Specimens and 3" in Height - 5 Position Objective Stripe Aperture with Auto Aperture Alignment - Turbomolecular pump vacuum system to achieve vacuum of less than 1e-9 Torr - Raster rotation of specimen and Dynamic Focus 2. Computer Requirements - Ethernet connectivity and CD-R/W Drive - 19" or greater Flat Panel LCD Monitor - Digital Beam Control interface - Color printer with maximum resolution of 4800 x1200 dpi. 3. Current calibration devices for SEM - Faraday Cup for current collection - Amp Meter capable of detecting currents as low as a picoAmp 4. Capability to visualize specimen both optically and Infrared wavelengths during scanning 5. Edax EDS WDS System - Capable of detection all elements down to beryllium - Capable of quantifying elements down to and including Boron - Resolution of 131 eV or better, measured at MnK, 100,000CPS - Peak to background signal to noise ratio > 10,000:1. - Capable of handling input count rates up to 850,000 cps and throughput of >350Kcps. - Integrated electron trap/collimator 6. Beam Control Package to provide digital control of the microscope's electron beam and acquisition of up to two simultaneous video signals and enable multiple channels Live Spectrum mapping data collection. 7. Installation of system and initial familiarization training performed on-site by trained service engineer. 8. SEM bulk qualitative and quantitative analysis software capable of: - Spectrum acquisition and display - Automatic and manual peak identification - Continuous spectrum autoscale - Click and drag spectrum manipulation - Automatic or manual energy calibration with resolution calculation - Spectrum labeling with escape Peaks & Absorption edges. - Automatic and manual peak identification 9. Element spectrum id and display capabilities - Shell and Line identification - HPD functionality in Peak ID - Allows deconvolution graphics display - Full digital rate meter function - Spectrum comparison with normalize, add, subtract and multiply functions - Spectrum smooth - Escape peak subtraction - Manual and automatic background modeling - Visual Halographic peak deconvolution - Complete standardless quantification - Light element adjustment factors - Full capability for analysis using pure element standards, compound standards or partial standards - Spectral data import capability. 10. EDX Imaging/Mapping Software Including: - Comprehensive software package for collection and display of video and/or X-ray signal data. - An automatic spectrum collection routine that allows the user to select points and/or shapes from an image to collect spectrum. - Fast Mapping for extended range of selectable EDS pulse processing times from 1.6 to 102.4 microseconds. - The ability to overlay images comparison. - The availability of Quant functions and image scaling - EDX High speed software to allow for each pixel data in a multi element X-ray map to be processed to background corrected k-ratio or fully matrix corrected results that can be done on a pixel-by-pixel basis or within a user defined area. - Fast digital X-ray mapping module allowing acquisition of X-ray maps up to 2048x1600 resolution - Complete Data Recall and Review capability 11. High Resolution Live Spectral Mapping that: - Reviewed and processed at any time after the sample is analyzed. - Fast, user determined map collection times - Review spectra from a particular area or phase of interest - Build additional maps including quantitative maps 12. Material chemical phase analysis capabilities that are: -Capable of Determining the chemical phases with a sample, where every channel of spectral data is used for phase determination so that no prior knowledge of sample chemistry is needed. - Capable of clustering similar pixels to create a phase map, where colors are based on phase assignment and quality fit. 13. Low Energy X-ray Spectrometer specifically designed for low energy x-ray analysis to provide very high-count rates, Peak-to-Background ratios and better than 20 eV energy resolution for x-ray energies below 2.5 KeV. -- Either user specified energy range or element(s) - Allow X-ray line profiles to be acquired from any orientation on the sample whereby both intensity and semi-quantitative data can be acquired and graphically displayed on the monitor. - Selectable Dwell time at each energy, allowing for either fast scans or slower scans. - Capable of scans covering the entire energy range from 100-2400 eV at user selected resolution -capable of measuring only energies corresponding to known spectral peaks for a faster scan - Capable of peak and background scans for a selection of elements such that, the system will measure a background position for each element, on either side of the spectral peak, and the peak position allowing very fast analysis of elements when the constituency is known or suspected. - Capacity of up to 5 crystals 14. WDS Software with an integrated software interface for the LambdaSpec. - Capable of multiple views with combinations of WDS spectra, EDS spectra, and SEM Images. - EDS/WDS overlay possible while collecting simultaneous data, - Ability to overlay previously collected data and to display WDS being collected previously - Automated collection of EDS/WDS data for qualitative or quantitative data with the ability to save stage locations in a table. UNIT OF MEASURE: EA DESIRED DELIVERY DATE: 60 ADC Inspection and Acceptance: DESTINATION. The following provisions and clauses apply to this procurement: 52.211-6; FAR 52.212-1, Instructions to Offerors - Commercial Items; FAR 52.212-3 Offerors Representation and Certification- Commercial Items (all offerors shall include a completed copy of this provision with their proposal); FAR 52.212-4 Contract Terms and Conditions- Commercial Items; FAR 52.212-5 Contract Terms and Conditions Required to Implement Statutes or Executive Orders- Commercial Items. [in paragraphs (b) and (c) the following clauses apply 52.203-6, 52.219-6, 52.219-28, 52.219-8, 52.219-14, 52.222-3, 52.222-19, 52.222-21, 52.222-26, 52.222-35, 52.222-36; 52.222-37; 52.232-33; FAR 52.204-4; FAR 52.252-1, 52.252-2 clauses and provisions may be accessed in full text at http://farsite.hill.af.mil; DFAR 252.212-7000 Offeror Representation and Certification-Commercial items; DFAR 252.204-7004 Alt A, 252.209-7001, 252.211-7003, DFAR 252.212-7001, 52.203-3, 252.225-7002, 252.225-7012, 252.243-7002, 252.247-7023, 252.232-7003. All payments are to be paid via the Internet through the Wide Area WorkFlow (WAWF) system. WAWF may be accessed at https://wawf.eb.mil. WAWF training may be accessed online at http://www/wawftraining.com. Payment information may be accessed using the DFAS website at https://www.dfas.mil. Your purchase order/ contract number or invoice will be required to inquire status of your payment All offers are due no later than 12PM MST (Mountain Standard Time) 10 Aug 2010. Offers may be emailed (preferred) to heather.miller@kirtland.af.mil, faxed to (505) 846-8925 ATTN: Ms. Heather Miller, or mailed to 377 CONS/LGCA, ATTN: Ms. Heather Miller, 2000 Wyoming Blvd SE, Bldg 20604, Room B-22. ADDITIONAL INFORMATION: Be advised that all interested parties must be registered in the Central Contractor Registration (CCR) Database in order to receive an award. If you are not registered, you may request an application at (888) 227-2423 or through the CCCR website at http://www.ccr.gov.
- Web Link
-
FBO.gov Permalink
(https://www.fbo.gov/spg/USAF/AFMC/377CONSKOC/F2KBAB0147A0022/listing.html)
- Place of Performance
- Address: Kirtland, New Mexico, 87117, United States
- Zip Code: 87117
- Zip Code: 87117
- Record
- SN02226990-W 20100805/100803235500-e30822c4aaf418d05f709dcf08b1a4c1 (fbodaily.com)
- Source
-
FedBizOpps Link to This Notice
(may not be valid after Archive Date)
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