SOURCES SOUGHT
A -- INTEGRATED INDUSTRIAL X-RAY MICRO-NANO COMPUTED TOMOGRAPHY AND MECH TEST FAC
- Notice Date
- 12/10/2010
- Notice Type
- Sources Sought
- NAICS
- 541711
— Research and Development in Biotechnology
- Contracting Office
- NASA/Glenn Research Center, 21000 Brookpark Road, Cleveland, OH 44135
- ZIP Code
- 44135
- Solicitation Number
- NNC11DEC302010L
- Response Due
- 12/30/2010
- Archive Date
- 12/10/2011
- Point of Contact
- Amparo M Gil, Student Trainee, Phone 216-433-2296, Fax 216-433-2480, Email amparo.m.gil@nasa.gov - Bernadette J. Kan, Contract Specialist, Phone 216-433-2525, Fax 216-433-2480, Email Bernadette.J.Kan@nasa.gov
- E-Mail Address
-
Amparo M Gil
(amparo.m.gil@nasa.gov)
- Small Business Set-Aside
- Total Small Business
- Description
- NASA/GRC is hereby soliciting information about potential sources to develop aninnovative combined micro/nano x-ray computed tomography and mechanical test facility forstructural materials of interest to NASA. In this facility, we would conduct x-raycomputed tomography examinations during interrupted mechanical tests of importantmaterials and structures at NASA. Resolution in the 10 micron or less range is desired. State-of-the-art X-ray CT, with its capability to really see into opaque materials at thetens of microns scale and possibly below, can be used to examine how the materials failin three-dimensional fashion. Materials of interest include ceramic matrix composites,polymer matrix composites, sandwich structures consisting of composite face sheets andvarious core materials (honeycomb, foam, etc.), and structural foam materials.Importantmechanical properties include compression, tension, shear and torsion tests. Theinformation garnered from this system can be fed to life and property modelingspecialists for model verification and fine tuning. We can also use the CT data to buildsolid and FE models so that modelers can use structures with real-life damage in themodeling efforts. Responses to this inquiry should provide a detailed description of thesystem proposed including: 1. Overall system description 2. Detailed Component level descriptions 3.Process/Strategy for performing micro/nano-CT at the interrupted test so that no membersof the mechanical testing facility interfere with the X-ray beam, 4. Resources and timequotation necessary to build such a facility, 5. Previous similar or identical efforts 6.TRL of systems previously produced No solicitation exists; therefore, do not request a copy of the solicitation. If asolicitation is released it will be synopsized in FedBizOpps and on the NASA AcquisitionInternet Service. It is the potential offerors responsibility to monitor these sitesfor the release of any solicitation or synopsis.Vendors having the capabilities necessary to meet or exceed the stated requirements areinvited to submit appropriate documentation, literature, brochures, and references.Please advise if the requirement is considered to be a commercial or commercial-typeproduct. A commercial item is defined in FAR 2.101.This synopsis is for information and planning purposes and is not to be construed as acommitment by the Government nor will the Government pay for information solicited. Respondents will not be notified of the results of the evaluation. Respondents deemedfully qualified will be considered in any resultant solicitation for the requirement. The Government reserves the right to consider a small business or 8(a) set-aside based onresponses hereto. All responses shall be submitted to Amparo Gil no later than Thursday,December 30, 2010. Please reference NNC11DEC302010L in any response. Any referencednotes may be viewed at the following URLs linked below.
- Web Link
-
FBO.gov Permalink
(https://www.fbo.gov/spg/NASA/GRC/OPDC20220/NNC11DEC302010L/listing.html)
- Record
- SN02342134-W 20101212/101210233858-26e069099ff0fe522502c7e6bc164b93 (fbodaily.com)
- Source
-
FedBizOpps Link to This Notice
(may not be valid after Archive Date)
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