SOURCES SOUGHT
A -- Quantitative Measurements of the Mechanical Properties of Nanostructures
- Notice Date
- 3/30/2011
- Notice Type
- Sources Sought
- NAICS
- 541712
— Research and Development in the Physical, Engineering, and Life Sciences (except Biotechnology)
- Contracting Office
- Department of Commerce, National Institute of Standards and Technology (NIST), Acquisition Management Division, 100 Bureau Drive, Building 301, Room B129, Mail Stop 1640, Gaithersburg, Maryland, 20899-1640
- ZIP Code
- 20899-1640
- Solicitation Number
- NB652090-11-01570
- Archive Date
- 4/28/2011
- Point of Contact
- Maria M. Gray, Phone: (301)975-5577, Patrick K Staines, Phone: (301)975-6335
- E-Mail Address
-
maria.gray@nist.gov, patrick.staines@nist.gov
(maria.gray@nist.gov, patrick.staines@nist.gov)
- Small Business Set-Aside
- Total Small Business
- Description
- THIS IS NOT A FORMAL REQUEST FOR PROPOSAL (RFP) AND DOES NOT COMMIT THE NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY (NIST) TO AWARD A CONTRACT NOW OR IN THE FUTURE This is a SOURCES SOUGHT NOTICE to determine the availability of small businesses (e.g., 8(a), service-disabled veteran owned small business, HUBZone small business, small disadvantaged business, veteran-owned small business, and women-owned small business) under NAICS code, 541712, that have the capability, experience, and expert knowledge in the area of providing technical support to R&D facilities conducting characterization and calibration of a variety of visible and infrared sources and radiometers. The Ceramics Division at the National Institute of Standards and Technology (NIST) provides the nation with calibration and measurement services in the ultraviolet through infrared portion of the electromagnetic spectrum. The Ceramics Division requires Contractor support research on development of measurement techniques for elastic properties of materials and structures at the nanoscale. A. BACKGROUND The National Institute of Standards and Technology (NIST), Ceramics Division, is currently conducting research on development of measurement techniques for elastic properties of materials and structures at the nanoscale, as part of a broader study of nanomechanical properties of materials and structures. Many advanced technology devices use materials and structures at the sub-micrometer length scale. Hence, in order to enable innovation and speed development of such devices, mechanical properties measurements are required at the nano-scale to optimize materials selection, manufacturing processes, and reliability predictions. A fundamental mechanical property underlying all aspects of nanomechanical behavior is the elastic modulus. Nondestructive modulus measurement methods are required for development of components and devices that make use of nanostructures such as ultra-thin films and nanotubes. Such structures have potential uses in advanced micro- and nano-electronic devices and sensor and actuator devices utilizing micro- and nano-electromechanical systems. It has been demonstrated that a dynamic resonance method can be implemented using an atomic force microscope (AFM), a form of scanning probe microscopy (SPM), to measure material elastic properties with great spatial resolution. The method is based on the modulation of the resonance frequencies of an AFM cantilever probe tip through contact with a material surface. The technique is known as contact-resonance atomic force microscopy (CR-AFM). Metrology to ascertain the applicability of this technique to a wide range of structures and entities and to develop standards for AFM and CR-AFM indentation and shear modulus measurement is required. In addition, the exact effects of contact geometries and adhesion between the probe and nano-scale structures and entities on the measurements are unknown, such that material properties cannot be deconvoluted from structural responses at the nano scale. Metrology is required to deconvolve such effects in CR-AFM measurements. Finally, the effects of the large surface area/volume ratios and of potential nano-scale layers on the properties of nano-scale entities are unknown, as are the influences of such surface effects on CR-AFM and related AFM measurements. The objective of this work is to continue NIST development of AFM and CR-AFM metrology to enable adequate and reliable experimental methods for nanoscale elastic mechanical property measurements on nano-scale entities with a range of elastic behavior. To meet this objective, research is required to explore and understand the resonant behavior of AFM cantilever probes in both flexural and torsional modes and the effects of the probe-surface contact geometry, and elastic anisotropy and inhomogeneity effects, in modulating resonance frequencies. Research is also required to establish the relations between elastic properties and other mechanical properties, such as fracture and contact dissipation, and surface effects and length scales of nanoscale entities. B. SCOPE OF WORK The Contractor shall use the AFM located in the Nanomechanics Cleanroom Facility of the Advanced Measurement Laboratory (Building 218, Rooms D010 and D012) and, if necessary, other AFMs within the Ceramics Division, to perform AFM and CR-AFM measurements on Si nanowires, Kevlar fibers, thin indium tin oxide (ITO) films and Cu-low-k dielectric interconnection structures, SiGe features epitaxially grown on Si wafers, and other materials supplied by NIST. The AFM cantilever probes will have dimensions and materials suitable for material modulus determination between 1 MegaPascal (MPa) and 1 TeraPascal (TPa) with better than 1 micrometer lateral resolution. The Contractor shall develop measurement methods for elastic, fracture, and dissipative properties at the nanoscale. These methods shall provide for accurate determination of different elastic moduli and dissipation over commensurate areas. The measurements shall be carried out on surfaces of entities and structures possessing nanoscale dimensions, with elastic anisotropy or with coatings. The experimental results shall be analyzed using appropriate theoretical models in order to adequately reflect the nanoscale behavior of the properties. The number of experiments shall be sufficient to derive reliable conclusions. For example, for correlation tests, values of R-squared greater than 0.8 or less than 0.2 will be expected to confirm or refute relationships. For material and device property value determinations, relative standard deviations of less than 0.3 are required. Important functions of the NIST Ceramics Division are dissemination of research results describing development of new measurement methods and standards for advanced materials and outreach with customers and peer developers of such measurement methods. One dissemination and outreach mechanism is the presentation of the results through talks, posters, and discussions with customers and other researchers at technical meetings. Accordingly, the Division requires the Contractor to attend and present a research paper or poster at the Materials Research Society (MRS) meeting in Boston, MA, November 28 - December 2, 2011 in the symposium Functional Imaging of Materials - Advances in Multifrequency and Multispectral Scanning Probe Microscopy and Analysis, or similar or related meetings or symposia. C. APPLICABLE DOCUMENTS 1. NIST Technical Note 1297, "Guidelines for Evaluating and Expressing Uncertainty of NIST Measurement Results" (http://physics.nist.gov/Pubs/guidelines/contents.html). 2. NIST Special Publication 811, "Guide for the Use of the International System of Units (SI)" (http://physics.nist.gov/cuu/pdf/sp811.pdf). D. OBJECTIVES The Contractor shall provide all support for project oversight, administration, and technical execution of this task order. The Contractor is responsible for maintaining accurate records of project activities. The Contractor shall complete the following tasks: Task 1. Study the fracture strength of as-grown, partially oxidized, and fully oxidized Si nanowires as a function of wire diameter. The Contractor shall develop a versatile and reliable AFM-based method for measuring the fracture strength of one dimensional nanostructures. The new method shall be required to be free of invasive attachments on the tested specimens (clamps, solders, etc.) such that the measured parameters reflect the intrinsic properties of the specimens. The Contractor shall develop an analysis that incorporates the distributions of bending stresses and bending moments along the tested nanowires and the evolution of these distributions toward the state of ultimate strength. The Contractor shall compare the values of fracture strength of the tested nanowires with those of thin film and bulk Si and SiO2. Task 2. Develop CR-AFM instrumentation and methodology for simultaneous access of flexural and torsional vibration modes of the AFM cantilever during tip-sample contact mode scanning. The Contractor shall use these types of measurements for out-of-plane and in-plane elastic modulus mapping of flat surfaces. The Contractor shall apply this new measurement development in the quantitative elastic modulus measurements of Kevlar 49 and Kevlar KM2 fibers embedded in an epoxy matrix. The Contractor shall perform out-of-plane CR-AFM point-measurements and mapping to measure the elastic modulus of longitudinal and transversal cross-sections of Kevlar fibers. The epoxy polymer elastic modulus of order 4 GPa to 5 GPa will provide calibration for the measurements. The analysis of the out-of-plane and in-plane CR-AFM measurements shall correlate the values measured on the longitudinal and transverse cross-sections of the two investigated types of Kevlar fibers. The Contractor shall compare the CR-AFM measurement results with those from instrumented indentation measurements on the same or similar specimens. Task 3. Extend the capability of CR-AFM and develop new methodology to provide quantitative measurements of dissipation at tip-sample contacts. The Contractor shall investigate the feasibility of adding the dissipation measurement as a byproduct of CR-AFM scanning. The Contractor shall develop an analysis that incorporates the contact resonance frequency and contact resonance amplitude signals acquired during CR-AFM scanning. The Contractor shall demonstrate this capability using composite materials with different elastic moduli and different damping coefficients. The Contractor shall apply this new measurement development to investigate local nanoscale variability of the mechanical properties (elastic modulus and damping coefficient) of thin ITO films and Cu-low-k dielectric interconnects. The spatial resolution shall be limited only by the size of the contact area established during measurements between the AFM probe and the surface investigated. Task 4. Assess the operational concepts, technological mechanisms, and capabilities of various emerging nano-scale mechanical property measurement techniques. The Contractor shall investigate the advantages and disadvantages of inferring the nanoscale elastic response of materials by measuring either the dynamic or quasi-static response of the probe-sample contact. The Contractor shall consider here techniques based on measuring the dynamics of the cantilever during contact mode (e.g., CR-AFM) or the deflection of the cantilever during contact or intermittent contact mode (e.g., techniques using the force-displacement response of the AFM). The Contractor shall investigate suitable microscopically-patterned specimens (e.g., SiGe features epitaxially grown on Si wafers) to assess the measurement sensitivity of such techniques. The versatility and applicability of various techniques shall be considered in point-measurements and mapping regions of interest on different specimens. Task 5. Attend and present a research paper or poster at the MRS meeting in Boston, MA, November 28 - December 2, 2011 in the symposium Functional Imaging of Materials - Advances in Multifrequency and Multispectral Scanning Probe Microscopy and Analysis, or similar or related meetings or symposia. Small businesses that currently possess such capabilities and have prior experience providing services using this expertise are encouraged to respond to this notice by providing the following information: 1. Narrative providing evidence of expertise in the above areas. The narrative should include: (1) description of services that align with the areas noted above; and (2) descriptions of similar projects worked on by your company as a prime contractor or as a significant subcontractor within the past five (5) years, including: (a) dollar amount of the contract; (b) detailed description of the technical AND schedule requirements of that project; (c) a copy of sample reports completed under that project (if releasable to NIST); (d) contract type used on that project; (e) indication of how long the project took/will take to complete from start to finish, and (f) name, address, point of contact, phone number and email address at customer organization for which the work was/is being done 2. Current socioeconomic status of your company including the North American Industrial Classification System (NAICS) code. 3. Indication of whether your company currently has an active registration in the Central Contractor Registration at www.ccr.gov and Online Representations and Certifications Application (ORCA) at https://bpn.orca.gov No telephone requests will be honored. All information provided will become property of NIST and will not be returned. The synopsis is for information and planning purposes and is not to be construed as a commitment by the Government. This is not a solicitation announcement for proposals and no contract will be awarded from this announcement. No reimbursement will be made for any costs associated with providing information in response to this announcement and any follow-up information requests. Respondents will not be notified of the results of the evaluation. All information submitted in response to this announcement must arrive on or before the closing date. All capability statements and information requested above can be submitted via e-mail to maria.gray@nist.gov. Responses must be submitted not later than 5:00PM EST April 13. Responses shall be limited to 15 typed pages, including attachments.
- Web Link
-
FBO.gov Permalink
(https://www.fbo.gov/spg/DOC/NIST/AcAsD/NB652090-11-01570/listing.html)
- Place of Performance
- Address: 100 BUREAU DRIVE, GAITHERSBURG, Maryland, 20899, United States
- Zip Code: 20899
- Zip Code: 20899
- Record
- SN02413266-W 20110401/110330234843-fc6181b8364dffe134d6e6218a17061f (fbodaily.com)
- Source
-
FedBizOpps Link to This Notice
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