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FBO#3435

66 - Instruments and Laboratory Equipment

SOURCES SOUGHT - April 21, 2011


  • W15QKN-11-X-F016 - Sources Sought
    DUAL-BEAM FIELD EMISSION SCANNING ELECTRON MICROSCOPE AND FOCUSED ION BEAM INSTR
    Department of the Army, Army Contracting Command, JM&L Contracting Center (JM&L-CC)
     

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