SOURCES SOUGHT
66 -- X-ray Scattering Characterization System
- Notice Date
- 11/18/2011
- Notice Type
- Sources Sought
- NAICS
- 334517
— Irradiation Apparatus Manufacturing
- Contracting Office
- Department of the Air Force, Air Force Materiel Command, ASC/PKO, 1940 ALLBROOK DRIVE, WRIGHT-PATTERSON AFB, Ohio, 45433-5309, United States
- ZIP Code
- 45433-5309
- Solicitation Number
- FA8601-12-T-0053(ss)
- Archive Date
- 12/21/2011
- Point of Contact
- Jennifer R. Begg, Phone: 9375222277
- E-Mail Address
-
Jennifer.Begg@wpafb.af.mil
(Jennifer.Begg@wpafb.af.mil)
- Small Business Set-Aside
- N/A
- Description
- SOURCES SOUGHT SYNOPSIS (Not a Notice of Solicitation) The United States Air Force, ASC/Operational Contracting Division, Wright-Patterson AFB, Ohio is seeking potential sources that are capable of providing an x-ray scattering characterization system to quantity morphology of organic-inorganic thin films containing bio and nano materials. Firms responding shall specify that their equipment meets the specifications provided below and provide detailed product information to show clear technical compliance. Additionally, sales history including recent commercial companies sold to should be included to determine commerciality. The specific technical requirements of this system are as follows: • This system must be all-in-one and be able to perform simultaneous in-plane measurements and USAX/SAX functionality (detailed below) • Generator: Cu X-ray generator and beam focusing optics with voltage and current stability of at least 0.01%, which produces a line focus (~0.4 mm x 12 mm) beam greater than 2.0 kW that is switchable between Parallel Beam with multilayer x-ray mirror (computer-controlled incident slit range at least 0.05 - 7.0 mm, with 0.01 mm step) and Bragg-Brentano (computer-controlled variable divergence slit of at least 0.05 - 7.0 mm, with 0.01 mm step) optical configurations for asymmetric and symmetric scanning geometries. • High Resolution Goniometer : High-Resolution Vertical theta/ theta Goniometer with fully automated, independent control of source and detector axis, a measuring range at least -2 - 150o (2 theta), a scan speed range at least 0.02 - 20o/min, and a minimum step resolution of 0.0001o (theta source, theta detector). • Sample Stage: High precision (at least 10mm range, with 0.0005 mm step), automated and universal Z-stage where samples are mounted horizontally for all measurement and sample types without the use of clamps or a vacuum chuck so as to minimize damage or stress to the sample, and allow in-plane and out-of-plane diffraction on liquid/liquid and liquid/solid interfaces. • Simultaneous In-plane measurements: The ability to simultaneously (without realignment or reconfiguration of the system) quantify the in-plane structure (scale of structure from 0.1 to 10 nm; scan in 2 and 2 axes) parallel to sample surface of ultra-thin films (thickness range of at least 10-1000 nm), formed on liquid surfaces, substrates that are transparent to x-rays, depth-profile phase identification, and in-plane texture / preferred orientation by grazing and normal incidence wide angle x-ray scattering (GIWAX and WAX) and x-ray reflectivity (XRR). • USAX / SAX Functionality: The ability to quantify particle size distribution and molecular structure (scale of structure 1-750 nm) of organic-inorganic bulk (suspensions, powders, etc.) and thin films containing bio and nano materials. The system must include with a high resolution parallel beam x-ray optical system for both ultra-small angle (USAX) and small angle x-ray scattering (SAX) without system realignment. For USAX, a Bonse-Hart optical system is required utilizing multilayer x-ray mirror to achieve a length scale up to 750nm. • Multi-Wire Detector Integration: The new system must integrate with the existing Rigaku, 120mm MWPC detector, Model 2D-120-X. The currently owned item description is a 2-dimensional position sensitive multi-wire gas-filled proportional counting x-ray detector with single photon counting capability. • User Control Software: User friendly software and associated hardware that fully automates all processes (e.g. provides automatic system alignment, automatic sample height alignment, suggestion of application-specific optical configurations for different sample types, automatic setting and checking of optics, automatic setting of slits sizes and measuring conditions, and automatic data collection and methods) to enable the full range of x-ray diffraction and scattering measurements and sample types, in one system. • Analysis Software: Analysis software that enables modeling and analysis of USAX, SAX, GIWAX and X-ray reflectivity (XRR) results. USAX and SAX analysis software must be able to determine particle/pore size distribution for spheres, rods, plates, multiple size distributions, core/shell, and cluster scattering for transmission and reflection mode data with fully simulated slit correction. GIWAX analysis software must be able to perform routine XRD data reduction methods, RIR quant, crystallize size and lattice strain, percent crystallinity, cell refinement, and residual stress. X-ray reflectivity analysis software must be able to iterate to an optimal solution between model composition profile of an approximate density range and sample size and experimental spectra to provide density, thickness and roughness of each layer. • Warrantee: Identify standard warranty terms All interested firms shall submit a response demonstrating their capabilities to produce the requested equipment to the Primary Point of Contact listed below. As stipulated in FAR 15.201, responses to this notice are not considered offers and cannot be accepted by the Government to form a binding contract. No solicitation exists; therefore, do not request a copy of the solicitation. The decision to solicit for a contract shall be solely within the Government's discretion. Firms responding should indicate whether they are, or are not, a small business, a socially and economically disadvantaged business, or a woman owned business. The general definition of a small business is one that is independently owned and operated, is not dominant in the field of operation in which it is proposing on Air Force contracts and with its affiliates; and the number of employees does not exceed 500. NAICS Code to be used for this acquisition is 334517. The Government reserves the right to consider a small business set-aside based upon responses hereto for any subsequent acquisition. Respondents are further requested to indicate their status as a Foreign-owned/Foreign-controlled firm and any contemplated use of foreign national employees on this effort. Any information submitted by respondents to this sources sought synopsis is voluntary. This sources sought notice is not to be construed as a commitment by the Government, nor will the Government reimburse any costs associated with the submission of information in response to this notice. Respondents will not individually be notified of the results of any government assessments. The Government's evaluation of the capability statements received will factor into whether any forthcoming solicitation will be conducted as a full and open competition or as a set-aside for small businesses, or any particular small business designation (e.g. SDVOSB, HUBZone, 8(a), SDB, WOSB, VOSB, etc.). Capabilities package: All interested firms shall submit a capabilities package that explicitly demonstrates company capabilities-indicating examples of commercial sales-and product specifications related to this effort. Responses may be submitted electronically to the following e-mail address: Jennifer.Begg@wpafb.af.mil in a Microsoft word compatible format or mailed to ASC/PKOAA POC: Jennifer Begg, 1940 Allbrook Dr., Rm 109, Wright-Patterson AFB, Oh 45433-5309 to be received no later than 2:00 PM Eastern Standard Time, 29 November 2011. Direct all questions concerning this acquisition to Jennifer Begg at Jennifer.Begg@wpafb.af.mil.
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