SPECIAL NOTICE
66 -- Energy Dispersive Microanalysis X-ray Spectrometer
- Notice Date
- 12/13/2011
- Notice Type
- Special Notice
- NAICS
- 334516
— Analytical Laboratory Instrument Manufacturing
- Contracting Office
- ACC-APG SCRT - Natick (SPS), ATTN: AMSRD-ACC-N, Natick Contracting Division (R and BaseOPS), Building 1, Kansas Street, Natick, MA 01760-5011
- ZIP Code
- 01760-5011
- Solicitation Number
- W911QY13DEC11
- Archive Date
- 12/12/2012
- Point of Contact
- Pearl Yip, 508-233-4449
- E-Mail Address
-
ACC-APG SCRT - Natick (SPS)
(pearl.yip@us.army.mil)
- Small Business Set-Aside
- N/A
- Description
- The Natick Soldier Research Development and Engineering Center (NSRDEC) is seeking technical information for an energy dispersive microanalysis of X-ray spectrometer (EDS). This energy dispersive X-ray Microanalysis system should include the following at a minmum: (1) It should include a comprehensive hardware and software tools to acquire x-ray data, perform qualitative and quantitative analysis, image capture, image centric analysis, x-ray spectral mapping, and report results. This EDS system should include technologies that are able to acquire and process data in seconds and give almost real-time elemental identification and composition determination. It should include algorithm for removing x-ray background from the spectrum, and perform peak ID and calculate peak areas automatically without user set up. (2)It should include a complete hardware chain approach to determing precise position, resolution and shapes of all element peak profiles to enable standardless quantitative analysis even for peaks with overlapping signals from different elements. (3)It should include a liquid nitrogen-free X-act Silicon Drift Detector (SDD) with Pental FET Precision -10mm2 active area. Resolution guaranteed on Mn K-133eV at 20,000 cps. It shall include a SATW window for detection of element from Beryllium. (4)It shall include a MicsF+ Microscope image capture system, and an Xtream2 microanalytical pulse processor. (5)It shall include data processing software that are compatible with data files captured previously on an INCA system. (6)This system should enable user to acquire, analyze, and report data simultaneously. (7)It shall have the ability to acquire image up to 8Kx8K pixel resolution. (8)It shall have the ability to acquire multiple images from the microscope, and it shall has the ability to acquire images simultaneous from the secondary electron and backscattering electron detectors. It shall be able to overlay images from different sites of interests. (9)This system shall be able to do multiple point spectrum acquisitions and be able to queue the multiple acquisitions. It shall be able to acquire spectrum from different shapes areas, e.g. circular, rectangular, elliptical, or freehand areas. (10) This system shall have the ability to acquire 4Kx4K x-ray spectral maps.
- Web Link
-
FBO.gov Permalink
(https://www.fbo.gov/notices/b32e6b31f5f4dadaaacf5ad8ac329f13)
- Record
- SN02638125-W 20111215/111213234312-b32e6b31f5f4dadaaacf5ad8ac329f13 (fbodaily.com)
- Source
-
FedBizOpps Link to This Notice
(may not be valid after Archive Date)
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