SOLICITATION NOTICE
66 -- Asylum Cypher Scanning Probe Microscope - BRAND NAME OR EQUAL
- Notice Date
- 11/20/2012
- Notice Type
- Combined Synopsis/Solicitation
- NAICS
- 334516
— Analytical Laboratory Instrument Manufacturing
- Contracting Office
- ACC-APG - Adelphi, ATTN: AMSRD-ACC, 2800 Powder Mill Road, Adelphi, MD 20783-1197
- ZIP Code
- 20783-1197
- Solicitation Number
- W911QX13R0001
- Response Due
- 12/19/2012
- Archive Date
- 1/19/2013
- Point of Contact
- Robin Stoltz, 301-394-3381
- E-Mail Address
-
ACC-APG - Adelphi
(rstoltz@arl.army.mil)
- Small Business Set-Aside
- Total Small Business
- Description
- This is a combined synopsis/solicitation for commercial items prepared in accordance with the format in Subpart 12.6, as supplemented with additional information included in this notice. This announcement constitutes the only solicitation; proposals are being requested and a written solicitation will not be issued. (i) This is a combined synopsis/solicitation for commercial items prepared in accordance with the format in FAR Subpart 12.6, as supplemented with additional information included in this notice. This announcement constitutes the only solicitation; proposals are being requested and a written solicitation will not be issued. (ii) The solicitation number is W911QX-13-R-0001. This acquisition is issued as a Request for Proposal (RFP) (iii) The solicitation document and incorporated provisions and clauses are those in effect through Federal Acquisition Circular 2005-61 (iv) This acquisition is a small business set-aside. The associated NAICS code is 334516. The business size standard is 500. (v) The following is a list of contract line item number(s) and items, quantities and units of measure: CLIN 0001 The Government requires one (1) BRAND NAME OR EQUAL Asylum Cypher Scanning Probe Microscope (SPM) System with Cypher SPM Standard Scanner and Approach Module, Cypher SPM Standard View Module, Cypher SPM MultiLux Standard Source Module, Cypher MultiLux Standard Super Luminescent Diode (SLD) Source Module, Amplitude Modulation/Frequency Modulation (AMFM) High Frequency Cantilever Holder Version 2 Kit, Cypher ORCA Conductive AFM Cantilever Holder Kit, Ztherm Cantilever Holder Kit, STM (Scanning Tunneling Microscopy) Probe Holder, and Air Temperature Control (ATC), in accordance with the following Salient Characteristics. (vi) Specifications / Salient Characteristics / Statement of Work: Precision, accuracy and resolution Instrument resolution The instrument must achieve atomic lattice resolution in air in DYNAMIC mode. The instrument must achieve true atomic resolution (defined as repeated point defect resolution) in liquid in DYNAMIC mode. Instrument geometry The microscope must be a sample scanning system with the cantilever fixed in the laboratory frame. (This also allows the future use of tip-enhanced optical techniques.) The tip-sample mechanical loop must not include the optical lever (laser, optics and detector). System noise STATIC Height Noise must be less than ( less than ) 15picometers (pm) average deviation (ADev) in a 0.1 Hertz (Hz) to 1 kilohertz (kHz) Bandwidth (BW) ( less than 5 pm in quiet environments). STATIC Height Noise is defined here as the apparent movement of a moderately stiff cantilever (Olympus TR800,100 m, k=0.61 Newtons/meter (N/m), or equivalent) in static contact with a hard surface with the Z feedback loop turned down to limit the bandwidth to below 0.1 Hz so that it doesn't affect the measurement. It is not acceptable to make this noise based on the Height signal. DYNAMIC Height Noise must be less than 15pm ADev in a 0.1Hz to 1kHz BW. DYNAMIC Height Noise is analogous to the STATIC Height Noise, by using a very stiff DYNAMIC-mode cantilever (Olympus AC160, 160 m, k = 42 N/m, or equivalent) driven at resonance tapping on a hard surface and measuring the apparent amplitude of the cantilever. Optical lever arm, light sources and photodetector The instrument must allow for the interchange of optical light sources. The light source options must include radio frequency (RF) modulated lasers and super luminescent diodes (SLDs). The instrument's STATIC Detector Noise must be less than 5 pm ADev in a 0.1Hz to 1kHz BW. The STATIC Detector Noise is defined here as the apparent movement of a short, moderately stiff cantilever (Olympus TR800,100 m, k=0.61 N/m, or equivalent) not in contact with a surface. The instrument's AC Detector Noise must be less than 25femtometers (fm)/ Hz above 100kHz. This is defined as the noise density above 100 kHz of the apparent motion of a very stiff cantilever (Olympus AC160, 160 m, k = 42N/m, or equivalent) not in contact with a surface. The microscope must have an optical sensing bandwidth of at least STATIC to 7 Megahertz (MHz). Laser spot positioning and photodetector centering must be motorized and controlled through software. Photodetector centering must be automated. The optical lever system must include an RF modulated laser with spot size of 10 m x 30 m. The optical lever system must include an SLD with spot size of 10 m x 30 m. System scanner The scanner must be closed-loop and independently actuated in X, Y and Z. The scanner must provide XY range of 30/40 m (closed/open loop). The Z range must be at least 5/7 m (closed/open loop). X and Y sensor noise must be less than 60pm ADev in a 0.1Hz to 1kHz BW. Z sensor noise must be less than 50pm ADev in a 0.1Hz to 1kHz BW. The instrument must be capable of closed-loop atomic-scale resolution. The microscope must utilize a closed-loop XY scanner that can achieve stable, closed loop scan speeds of at least 5 millimeters (mm)/s. Out of plane motion must be less than 3 nm over the closed-loop scan range. The microscope must provide motorized coarse-positioning of the sample over several millimeters under software control. System optics The instrument must include top-view optics. The resolution of the optics must be diffraction limited ( less than 1 m) and include apochromatic correction. The optics must have software controlled light emitting diode (LED) based Kohler illumination. The optics must include aperture and field diaphragms. The minimum field of view is 690 m x 920 m The optics must include a 3.1 megapixel (or better) complementary metal oxide semiconductor (CMOS) camera with FireWire interface. The software must include digital zoom, pan and capture, as well as balance, shutter speed and binning. Instrument isolation The instrument must include an integrated thermally- and acoustically-isolating enclosure. Enclosure must provide at least 20 decibels (dB) of acoustic isolation. The microscope must have integrated passive vibration isolation. The damping must be sufficient to allow open- and closed-loop atomic-scale imaging resolution in labs with floor accelerations less than 1mm/s2. The integrated enclosure must be actively temperature-controlled to 0.10Celcuis (C). Controller and electronics The AFM control electronics must provide 100% digital operation. The electronics must include digitally-controlled switches for user-defined signal routing. The system must provide thermal tunes of the cantilever up to at least 7MHz. The instrument must allow digital quality (Q)-control in the range 2kHz - 20MHz. The instrument must include software controlled relays for the X, Y and Z high voltage supplies and the laser power. The controller must include the following features: oFloating point digital signal processor (DSP) running at 80MHz and Dual-core NIOS in field programmable gate array (FPGA). oFour (4) Field Programmable Gate Arrays running at up to 667MHz. oTwo (2) dual frequency quadrature lock-in's at up to 20MHz and one dual-frequency quadrature lock-in at 5 MHz. oSixteen (16) proportional-integral gain controllers oThe electronics must provide the user with integrated external access to all input and output signals (e.g., via front- or rear-panel Bayonet Neill-Concelman (BNC) connections). Specific measurement and analysis modes: Operating Modes The microscope must be capable of the following scanning modes, each of which requires at minimum that the signals noted in the corresponding parentheses be recordable simultaneously. Each of these signals must be recorded in both trace and retrace scan directions. Here, auxiliary signals refer to external inputs that are independent of the microscope. a.Contact (lateral force, topography, deflection, feedback error, one (1) auxiliary) b.Dynamic (topography, amplitude, phase, frequency shift, one (1) auxiliary) c.Force vs. displacement (deflection, lateral, two (2) auxiliary) d.Electric Force Microscopy e.Magnetic Force Microscopy f.Surface Potential/Kelvin Probe g.Nanolithography and Nanomanipulation h.Piezoresponse Force Microscopy i.Dual DYNAMIC: Provides multiple frequency drives and analyses for bimodal and harmonic measurements and imaging. j.Scanning Tunneling Microscopy k.Local Thermal Analysis capabilities: The technique must allow a local area of less than 100nm to be heated with the probe to temperatures of over 500oC in order to study the local thermo-mechanical properties of the sample. It must include the ability to measure cantilever deflection as a function of heating ( quote mark constant position quote mark measurements) as well as the Z piezo position that minimizes the tip deflection as a function of heating ( quote mark constant force quote mark measurements). The technique must also include a routine to compensate for bending due to changes in cantilever temperature so that this is not interpreted as sample expansion or melting. Software Control and analysis must be user-programmable natively in an entirely open-source software programming language. The data acquisition system must be capable of recording individual image sizes of 8000x8000 pixels or greater. AFM control software environment must include three dimensional (3D) rendering technology for advanced image display. This feature must allow the user to generate, display and visualize 3D real-time scan images. Must include multiple built-in spring constant calibration methods, including the quote mark thermal noise quote mark and quote mark Sader hydrodynamic quote mark methods. Multi-frequency techniques. The instrument must be capable of driving the cantilever simultaneously at two (2) or more arbitrarily chosen excitation frequencies in DYNAMIC mode, while simultaneously collecting and displaying the amplitude and phase signals and images from each of these frequencies, along with the height or Z-sensor data. The instrument must be capable of tracking the resonance frequency of the cantilever during measurement techniques in which the cantilever is actuated mechanically by the sample. For example, the technique must be demonstrated to track the resonance in either or both Contact Resonance AFM or on-resonance Piezoresponse Force Microscopy. The software must be able to map the drive amplitude, drive phase, resonance frequency and quality factor of the resonance being tracked by the technique above. The contractor shall provide shipping, installation, two (2) day training on site at Aberdeen Proving Ground, MD, and four (4) day advanced training on site at Aberdeen Proving Ground, MD. (vii) Delivery is required within 60 days of award. Acceptance shall be performed at US Army Research Laboratory, Aberdeen Proving Ground, APG MD. The Freight on Board (FOB) point is Destination. (viii) The provision at 52.212-1, Instructions to Offerors - Commercial, applies to this acquisition. The following addenda have been attached to this provision: None (ix) The provision at FAR 52.212-2, Evaluation - Commercial Items is applicable to this acquisition. The specific evaluation criteria is as follows: The Government will award a contract resulting from this solicitation to the responsible offeror whose offer conforms to the solicitation and will be most advantageous to the Government, price and other factors considered. The following factors shall be used to evaluate offers: Technical, Past Performance and Price. The Technical element of the evaluation will be a determination as to whether the proposed product meets the performance characteristics and specifications in the solicitation. The Technical element of the evaluation shall be based solely on information furnished by the vendor. The Government is not responsible for locating or securing any information, which is not identified in the proposal. To ensure sufficient information is available, vendors must furnish as part of their proposal all descriptive material (such as cuts, illustrations, drawings, or other information) necessary for the Government to determine whether the product meets the performance characteristics and specifications of the requirement. If the offeror proposes to modify a product so as to conform to the requirement of this solicitation, the offeror shall include a clear description of such proposed modifications and clearly mark any descriptive materials to show modifications. Past performance will be evaluated based on information provided by the offeror as to actual sales of the proposed product to industry or Government agencies. Past performance will consider the ability of the offeror to meet technical specifications, delivery schedules (with warranty fulfillment and maintenance reputation included as applicable). Offerors shall include three (3) relevant records of past sales from the previous twelve (12) months. Offerors shall identify a point of contact for each sale by providing a name and telephone number. Price will be evaluated based on the total proposed price. Technical and past performance are of equal importance and when combined are significantly more important than price. The Government reserves the right to award to other than the lowest price and to award without discussions. (x) Offerors shall include a completed copy of the provision at FAR 52.212-3, Offeror Representations and Certifications - Commercial Items, and DFARS 252.212-7000, Offeror Representations and Certifications -Commercial Items, with its offer. (xi) The clause at 52.212-4, Contract Terms and Conditions - Commercial Items, applies to this acquisition. The following addenda have been attached to this clause: None (xii) The clause at 52.212-5, Contract Terms and Conditions Required to Implement Statutes or Executive Orders - Commercial Items and DFARS 252.212-7001, Contract Terms and Conditions Required to Implement Statutes or Executive Orders Applicable to Defense Acquisitions of Commercial Items, applies to this acquisition. The following additional FAR/DFARS clauses cited in this clause are applicable: 52.203-3, 52.203-6 Alt1, 52.204-4, 52.204-10, 52.209-6, 52.209-10, 52.219-6, 52.219-8, 52.219-14, 52.219-28, 52.222-3, 52.222-19, 52.222-21, 52.222-26, 52.222-35, 52.222-36, 52.222-37, 52.222-40, 52.222-50, 52.223-18, 52.225-13, 52.225-25, 52.232-33, 52.233-3, 52.233-4, 252.203-7000, 252.211-7003, 252.211-7003 Alt 1, 252.225-7012, 252.225-7001, 252.232-7003, 252.243-7002, 252.247-7023. (xiii) The following additional contract requirement(s) or terms and conditions apply: 52.004-4409 ACC - APG Point of Contact (Apr 2011) 52.004-4411 TECHNICAL POINT OF CONTACT (DEC 2002) 52.016-4407 Type of Contract (SEP 1999); 52.046-4400 Government Inspection and Acceptance (Sep 1999); 52.032-4418 Tax Exemption Certification (Sep 1999); ACC-APG 5152.232-4901 WIDE AREA WORKFLOW (WAWF) INFORMATION AND INSTRUCTIONS - For Firm Fixed Price Contracts and/or CLINs (Jun 2012): 52.005-4401 Release of Information by Manufacturers, Research Organizations, Educational Institutions, and Other Commercial Entities Holding Army Contracts (Aug 2006); 52.011-4401 Receiving Room Requirements - APG Alternate I (JAN 2003); AMC-Level Protest Program (Jul 2011); and US Army Contracting Command (ACC-APG) - Adelphi Contracting Division Website. A copy of the full text provisions will be made available upon request. (xiv) This acquisition is rated under the Defense Priorities and Allocations System (DPAS) as N/A. (xv) The following notes apply to this announcement: Numbered Note 1 - The proposed contract is 100% set aside for small business concerns. (xvi) Offers are due on 19 December 2012 0900, at Army Contracting Command - Aberdeen Proving Ground, Adelphi Contracting Division. Proposals, as well as any questions, should be emailed to Ms. Stoltz at robin.e.stoltz.civ@mail.mil. Please be advised that.zip and.exe files cannot be accepted. (xvii) For information regarding this solicitation, please contact Ms. Stoltz; Email: robin.e.stoltz.civ@mail.mil. quote mark NO TELEPHONE REQUESTS WILL BE HONORED quote mark.
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- Place of Performance
- Address: ACC-APG - Adelphi ATTN: AMSRD-ACC, 2800 Powder Mill Road Adelphi MD
- Zip Code: 20783-1197
- Zip Code: 20783-1197
- Record
- SN02935305-W 20121122/121120235325-0b1ba1eae5d0c32bfd89202a09343d87 (fbodaily.com)
- Source
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