SOURCES SOUGHT
66 -- Mechanical Sample Preparation System
- Notice Date
- 1/7/2014
- Notice Type
- Sources Sought
- NAICS
- 334516
— Analytical Laboratory Instrument Manufacturing
- Contracting Office
- Department of Commerce, National Institute of Standards and Technology (NIST), Acquisition Management Division, 100 Bureau Drive, Building 301, Room B130, Gaithersburg, Maryland, 20899-1410, United States
- ZIP Code
- 20899-1410
- Solicitation Number
- AMD-SS-06
- Archive Date
- 1/29/2014
- Point of Contact
- Paula Wilkison, Phone: 301-975-8448, Donald Graham, Phone: (301) 975-8567
- E-Mail Address
-
paula.wilkison@nist.gov, donald.graham@nist.gov
(paula.wilkison@nist.gov, donald.graham@nist.gov)
- Small Business Set-Aside
- N/A
- Description
- The National Institute of Standards & Technology (NIST) seeks information on commercial vendors that are capable of providing a mechanical sample preparation system to support the Center for Nanoscale Science and Technology (CNST), NIST's nanotechnology user facility. After results of this market research are obtained and analyzed, and specifications are developed, NIST may conduct a competitive procurement and subsequently award a Purchase Order for a mechanical sample preparation system. If at least two qualified small businesses are identified during this market research stage, then any competitive procurement that resulted would be conducted as a small business set-aside. The required mechanical sample preparation system allows flexible and precise mechanical sawing, grinding and polishing of crystalline microchips containing micro and nanofabricated devices while under observation through an optical microscope. The system shall be suitable for mechanical machining of centimeter scale semiconductor chips with micrometer resolution. The required mechanical sample preparation system meets the following minimum requirements: 1. Ability to mechanically saw, grind and polish centimeter-scale crystalline microchip samples made of Si as well as other inorganic materials a. Disk saw and polisher speed selectable over the range of at least 16.7 Hz to 333 Hz (1000 rpm to 20000 rpm) b. Selection of coarse and fine grinding and polishing paper to grind several mm of material and finish to produce optically smooth surfaces c. Ability to operate with and without water lubrication d. Safety cover and waste collection and filtering 2. Ability to hold and manipulate the sample to machine and observe at different angles a. Selecting and varying the cutting or polishing angle with respect to the chip surface in the range of -5 degrees to more than 45 degrees. b. Ability to pause the polishing operation, change the tilt angle, observe the sample and resume operation with the same or new angle setting. The angle change should be accomplished with a simple control (such as a lever) that can be operated over the full range in less than 5 seconds with precision better than 2 degrees. c. Ability to manually adjust the sample angles along the other two axes by more than 5 degrees without re-mounting the sample. d. Ability to manually adjust the sample position by more than 2 mm without re-mounting the sample. 3. Ability to machine automatically in precise increments a. Ability to advance the saw automatically along the cut at preset speed b. Ability to manually or automatically advance the polishing tool normal to the polished surface in selected controlled increments of 1 micrometer to over 10 micrometer c. Ability to manually or automatically scan the polishing tool in the direction parallel to the polished surface for uniform polishing 4. An integrated stereo zoom microscope for alignment and in-situ observation (Leica M80, 0.8x objective, 16x eyepieces or equivalent) a. Magnification range from 10x to 75x b. Integrated optical port (c-mount, for ½" camera sensor size) for mounting a camera (actual camera is not required) c. Ability to pan the microscope field of view smoothly over at least 2 mm in both directions (e.g. movable objective adaptor or equivalent means) d. Sample illuminator NIST is seeking responses from all responsible sources, including large, foreign, and small businesses. Small businesses are defined under the associated NAICS code for this effort, 334516, as those domestic sources having 500 employees or less. Please include your company's size classification and socio-economic status in any response to this notice. Companies that manufacture mechanical sample preparation systems are requested to email a detailed report describing their abilities to paula.wilkison@nist.gov no later than the response date for this sources sought notice. The report should include achievable specifications and any other information relevant to your product or capabilities. Also, the following information is requested to be provided as part of the response to this sources sought notice: 1. Name of the company that manufactures the system components for which specifications are provided. 2. Name of company(s) that are authorized to sell the system components, their addresses, and a point of contact for the company (name, phone number, fax number and email address). 3. Indication of number of days, after receipt of order that is typical for delivery of such systems. 4. Indication of whether each instrument for which specifications are sent to paula.wilkison@nist.gov is currently on one or more GSA Federal Supply Schedule contracts and, if so, the GSA FSS contract number(s). 5. Any other relevant information that is not listed above which the Government should consider in developing its minimum specifications and finalizing its market research. Point of Contact Paula Wilkison, Contract Specialist, Phone (301) 975-8448, email paula.wilkison@nist.gov
- Web Link
-
FBO.gov Permalink
(https://www.fbo.gov/spg/DOC/NIST/AcAsD/AMD-SS-06/listing.html)
- Place of Performance
- Address: TBD, United States
- Record
- SN03262862-W 20140109/140108000129-64a5e5dd64920f94b1a61027940bf0a4 (fbodaily.com)
- Source
-
FedBizOpps Link to This Notice
(may not be valid after Archive Date)
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