SOLICITATION NOTICE
66 -- NIST NSLS-II SST Beamline Backbones and NIST NSLS-II BMM Beamline Mirror Systems
- Notice Date
- 3/14/2014
- Notice Type
- Presolicitation
- NAICS
- 334516
— Analytical Laboratory Instrument Manufacturing
- Contracting Office
- Department of Commerce, National Institute of Standards and Technology (NIST), Acquisition Management Division, 100 Bureau Drive, Building 301, Room B130, Gaithersburg, Maryland, 20899-1410, United States
- ZIP Code
- 20899-1410
- Solicitation Number
- SB1341-14-RP-0021
- Archive Date
- 4/22/2014
- Point of Contact
- Kim S Stavish, Phone: 301-975-2672, Andrea A Parekh, Phone: (301)975-6984
- E-Mail Address
-
kim.stavish@nist.gov, andrea.parekh@nist.gov
(kim.stavish@nist.gov, andrea.parekh@nist.gov)
- Small Business Set-Aside
- N/A
- Description
- The National Institute of Standards and Technology (NIST) and the Department of Energy (DOE) have a 30 year ongoing partnership at the National Synchrotron Light Source (building to NSLS-II) developing advanced synchrotron measurement methods and delivering excellence in material science impacting important societal challenges in energy, health, environment, and national security improving our quality of life. The NSLS-II will enable NIST to develop, apply and disseminate synchrotron measurement science and technology to the U.S. industry to measure nanoscale electronic, chemical and spatial structure of advanced materials. These advanced materials include multilayers, nanotubes, nanoparticles and thin films. The partnership between NIST and DOE promotes innovation and enhances US industrial competiveness for inorganic and organic semiconductors, photovoltaics, SAMs, biological and environmental materials, batteries, catalysts, fuel cells, polymers, superconductors, ferroelectrics, and ferromagnets. Located at the NSLS in Upton, NY, the NIST Synchrotron Methods Group of nine operates a suite of three state-of-the-art spectroscopy beamlines (U7A, X24A, and X23A2) that span the entire absorption-edge energy range of the periodic table to establish structure function relationships in advanced materials. More than 200 industry and academic researchers each year use the NIST Beamline Suite to accelerate the development of new materials into devices and systems with advanced functionality for a broad spectrum of industries. Building upon this success, NIST will establish an NSLS-II spectroscopy suite of three state-of-the-art high throughput beamlines (with X-ray Diffraction capability); Soft and Tender X-ray Spectroscopy and Microscopy (SST - 100 eV to 7.5 keV canted sources) and Hard X-ray Absorption Spectroscopy and Diffraction (Beamline for Materials Measurement - BMM - 4.5 keV to 40 keV three-pole wiggler source). Taken together, the NIST NSLS-II Spectroscopy Beamline Suite will be capable of measuring the electronic, chemical, and structural properties of almost any material, often at the nanoscale. The National Institute of Standards and Technology (NIST) is building a pair of NSLS-II spectroscopy beamlines based on two canted undulator sources, one for soft x-rays (100 eV to 2.2 keV) and one for tender x-rays (1 keV to 7.5 keV). The beamlines will have a total of 6 unique world class NEXAFS/XPS experimental stations (2 full field microscopes, 2 automated high-throughput, and 2 insitu high pressure); three will be served by the soft x-ray undulator and three by the tender x-ray undulator, thus a variety of soft and tender spectroscopy experiments can be accomplished simultaneously in this beamline complex. Two of the experimental stations (high-throughput XPS/NEXAFS and the XPS microscope) can utilize the soft and tender X-ray undulators (sequentially or even simultaneously) enabling a continuous selection of X-rays from 100 eV to 7.5 keV (at a common focal point) in a single experiment (unique capability, enhancing depth selectivity in XPS; i.e. in Hard X-ray Photoelectron Spectroscopy - HAXPES). The items to be acquired are the NIST NSLS-II SST Beamline Backbones and NIST NSLS-II BMM Beamline Mirror Systems which transfers and focuses the NSLS-II x-rays for the Large AREA NEXAFS Microscope for NSLS-I/II (and other endstations detailed above) produced by an NSLS-II canted tender (low energy) undulator. This requirement is being procured using acquisition of commercial items and contracting by negotiations under the authority of FAR Parts 12 and 15. The North American Industry Classification System (NAICS) code for this requirement is 334516 with a small business size standard of 500 employees. The competitive Request for Proposals (RFP), specifications, any subsequent amendments, and all questions and answers related to this procurement shall be made available via the Internet at www.fbo.gov under RFP number SB1341-13-RP-0062. The RFP is anticipated for release to the vendor community on or about April 7, 2014 and will only be available via the Internet at the above website. Potential offerors are responsible for accessing the website. Interested parties must respond to the RFP in order to be considered for award of any resultant contract. No written solicitation document is available, telephone requests shall not be honored, and no bidders list shall be maintained. Potential offerors are requested to direct all questions via e-mail to kim.stavish@nist.gov.
- Web Link
-
FBO.gov Permalink
(https://www.fbo.gov/spg/DOC/NIST/AcAsD/SB1341-14-RP-0021/listing.html)
- Place of Performance
- Address: TBD, United States
- Record
- SN03311244-W 20140316/140314234542-77b0cae9b197061cd762688a53b36987 (fbodaily.com)
- Source
-
FedBizOpps Link to This Notice
(may not be valid after Archive Date)
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