SOURCES SOUGHT
66 -- Nano-Indentation Measurement System
- Notice Date
- 4/7/2016
- Notice Type
- Sources Sought
- NAICS
- 334515
— Instrument Manufacturing for Measuring and Testing Electricity and Electrical Signals
- Contracting Office
- Department of Commerce, National Institute of Standards and Technology (NIST), Acquisition Management Division, 100 Bureau Drive, Building 301, Room B130, Gaithersburg, Maryland, 20899-1410, United States
- ZIP Code
- 20899-1410
- Solicitation Number
- NB731040-16-02990
- Archive Date
- 4/15/2016
- Point of Contact
- Prateema E. Carvajal, Phone: 301-975-4390, Abdul-Kudus Yahaya, Phone: 3019758497
- E-Mail Address
-
prateema.carvajal@nist.gov, abdul-kudus.yahaya@nist.gov
(prateema.carvajal@nist.gov, abdul-kudus.yahaya@nist.gov)
- Small Business Set-Aside
- N/A
- Description
- This announcement is a Request for Information (RFI) notice. It is not a Request for Quote (RFQ) and does not commit the Government to award a contract now or in the future. No solicitation is available at this time. The Department of Commerce, National Institute of Standards and Technology (NIST) seeks information on commercial vendors that are capable of providing a Nano-Indentation Measuring System. Contracting Office Address The Department of Commerce, National Institute of Standards and Technology (NIST), Acquisition Management Division, 100 Bureau Drive, Building 301, Room B129, Mail Stop 1640, Gaithersburg, MD, 20899-1640 NIST is seeking responses from all responsible sources, including large, and small businesses. This requirement is assigned a NAICS code of 334515 with a size standard of 500 Employees. NIST does not intend to award a contract on the basis of this Notice, or otherwise pay for the information requested. No entitlement or payment of direct or indirect costs or charges by NIST will arise as a result of submission of responses to this Notice and NIST use of such information. NIST recognizes that proprietary components, interfaces and equipment, and clearly mark restricted or proprietary components, interfaces and equipment, and clearly mark restricted or proprietary data and present it as an addendum to the non-restricted/non-proprietary information. In the absence of such identification, NIST will assume to have unlimited rights to all technical data in the information paper. BACKGROUND INFORMATION The NIST Polymeric Materials Group in the Materials and Structural Systems Division is involved in mechanical testing of various polymeric materials and coatings at various scales. This acquisition supports EL's Sustainable Engineered Materials and Net-Zero High Performance buildings programs and is critical for meeting milestones in these two programs as well as other projects. The nanoindentation equipment has to be capable of performing the classical nano-indentation experiments based on instrumented loading and unloading of the indenter tip onto a specimen in order to provide indentation hardness and indentation modulus versus depth at precisely predefined positions on the specimen surface Draft Requirement: Description: Nano-Indentation Measuring System Must meet the following minimum specifications: The Contractor shall provide a nanoindentation measurement system that is capable of measuring force, displacement, and nanoscale image of the indentation. The load frame stiffness of the equipment shall be the minimum 2 x 106 N/m. An anti-vibration table, air table or equivalent shall be used to minimize disturbances from the laboratory surrounding. The contractor shall install the instrument, which includes: Indentation test capability: 1. The following standard indenter types must be mountable on the equipment and selectable in the software: Sphero-conical indenter, Berkovich three-sided pyramid indenter, Vickers four-sided pyramid indenter, Knoop four-sided pyramid indenter. 2. The equipment must provide at least one indentation per 10 second or higher indentation speed at room temperature. 3. The maximum load must be at least 400 mN or higher, and the load resolution shall be at least 100 nN or smaller. 4. The maximum indentation depth must be at least 200 µm or deeper. 5. The indentation displacement resolution must be at least 0.001 nm or smaller. Scratch test capability: 1. The maximum lateral scratch load must be 100 mN or higher. 2. The maximum lateral scratch distance must be must be 50 mm or higher. 3. The lateral scratch speed must include the range between 500 nm/sec and 1 mm/sec. Imaging capability: 1. The optical microscope must provide at least two objective lenses (between 5x and 50x objectives); live imaging and image capture must be possible. 2. The imaging capability must include nanometer-scale information (with at least 50 nm resolution or smaller for depth) for the surface of the sample (with x-y scan range of at least 50 µm x 50 µm or wider) in 3 dimensions and the image must be created in digital. System and software: 1. The equipment must be software controlled for tests execution, data acquisition and data analysis and include the force control, depth control, constant strain rate, and depth image profiling. 2. The equipment must allow opting for a fully automated measurement program and testing parameters selectable by user, including at least: maximum load, number of load and unload segments, holding time period, final unload, delayed starting of a test (up to 5 h), number of indentations and spacing, user defined matrix measurements by defining x, y coordinates or free settings via microscope. 3. The equipment must allow mounting and testing of multiple specimens with different heights on the sample holder. 4. The software must allow the free control of the indentation parameters, the measurement of nanometer scale crack length after indentation, the real time monitoring of indentation curves, the recall of previous test cycles, and the means to generate a measurement report consisting of at least measurement data and indentation curves. 5. The software must be compatible to open and analyze measured data with.mss file extension. 6. Analysis routines of the software must include to calculate indentation data for hardness, stress-strain data, creep, relaxation, 3D mapping and profiling. Documentation: 1. A manual describing all procedures to operate the instrument must be delivered with the equipment. 2. A manual describing the maintenance procedures and removal of all major components must be delivered with the equipment. 3. Instruction manuals of the original equipment manufacturer for all third party components must be delivered with the equipment. 4. Two copies of a manual describing the operation of the data acquisition and analysis software shall be delivered with the equipment. The format of the data in the data files must be fully documented. Requirements for Responding to this RFI: All interested capable contractors may respond to this RFI by submitting a Capability Statement. The statement should include the following: 1) Name, Address, DUNS number, CAGE code, company website URL. and point of contact information of your company. 2) Company size classification and socioeconomic status. 3) Product literature and capability statement. 4) Indication of whether the services described in this notice are currently on one or more GSA Federal Supply Schedule (FSS) contracts or other applicable GWAC and, if so, the applicable contract number(s). 5) Any other relevant information that is not listed above which the Government should consider when finalizing its market research All responses shall be sent to prateema.carvajal@nist.gov by April 14, 2016 @ 8:00 a.m. Eastern Time with the following subject line "Nano-Indentation Measurement System". Point of Contact Prateema Carvajal, Contract Specialist, Phone (301) 975-4390, Email Prateema.carvajal@nist.gov
- Web Link
-
FBO.gov Permalink
(https://www.fbo.gov/spg/DOC/NIST/AcAsD/NB731040-16-02990/listing.html)
- Place of Performance
- Address: NIST, 100 Bureau Drive, Gaithersburg, Maryland, 20899, United States
- Zip Code: 20899
- Zip Code: 20899
- Record
- SN04076698-W 20160409/160407234817-0493c4896337fc5b64d42cfbf2dd0be6 (fbodaily.com)
- Source
-
FedBizOpps Link to This Notice
(may not be valid after Archive Date)
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