SOURCES SOUGHT
66 -- Electronically Controlled Dual Rotation Sub-Stage System
- Notice Date
- 6/27/2016
- Notice Type
- Sources Sought
- NAICS
- 334516
— Analytical Laboratory Instrument Manufacturing
- Contracting Office
- Department of Commerce, National Institute of Standards and Technology (NIST), Acquisition Management Division, 100 Bureau Drive, Building 301, Room B130, Gaithersburg, Maryland, 20899-1410, United States
- ZIP Code
- 20899-1410
- Solicitation Number
- AMD-SS16-04397
- Archive Date
- 7/16/2016
- Point of Contact
- Christopher R. McGucken, Phone: 3019758249
- E-Mail Address
-
christopher.mcgucken@nist.gov
(christopher.mcgucken@nist.gov)
- Small Business Set-Aside
- N/A
- Description
- TITLE: Electronically Controlled Dual Rotation Sub-Stage System OPDIV: NIST, Physical Measurement Laboratory (PML) This is a SOURCES SOUGHT NOTICE to determine the availability of potential businesses in accordance with FAR 7.104(d). The potential business will need to demonstrate the capability to perform all facets of the work described below. The sole intent of this Sources Sought Notice is to obtain capabilities for set-aside and procurement planning purposes. This is not an invitation for bid, request for proposal, or other solicitation, and in no way obligates the National Institute of Standards and Technology (NIST) to award a contract. BACKGROUND The National Institute of Standards and Technology's (NIST), Nanoscale Metrology Group (NMG) requires a double rotation sub-stage for secondary electron yield measurements and for three-dimensional (3D) reconstruction of nanometer-scale structures by the scanning electron microscope (SEM). The NMG's existing FEI Helios microscope stage can turn a sample in full 360 degrees along one axis of rotation. However, it has no built-in encoder that would allow for accurate knowledge of the actual angle of rotation, -based on measurement, it only can be instructed to turn in one degree increments. It is known to be unacceptably inaccurate for these measurements. The Government seeks to acquire a sub-stage system for accurate measurements of angle-dependent secondary electron yield and for 3D nanometer-scale dimensional measurements in the FEI Helios scanning electron microscope. CONTRACTOR REQUIREMENTS To meet the purpose and objective of this requirement, the Contractor shall provide documentation demonstrating the capability to provide one (1) electronically controlled dual-rotation sub-stage system. In addition, the offered system shall be capable of meeting or exceeding the salient characteristics below: 1.Overall System Required Capabilities: The system shall be comprised of two (2) motors, two (2) encoders and allow for a sample to be placed on top of the assembly and rotated. The two encoders shall provide accurate readings for the two angles of rotation. The sub-stage shall be driven by a computer-controlled driving circuitry that allows for this system to be a part of a measuring system. In addition, the system shall have the following performance capabilities: a.) Shall have a minimum of 360-degree rotation along the vertical axis. b.) Shall have a minimum of +/- 90-degree rotation along the horizontal axis. c.) Both axes shall have encoders to provide accurate angle of rotation readings. d.) Shall have an absolute rotational accuracy of a minimum of 0.2 degrees. e.) Shall have a minimum of 0.02 degrees of rotational resolution. 2.Sub-Stage Capabilities: a.) Shall fit the main stage of the existing FEI Helios dual-beam SEM size- and weight-wise. b.) Shall be short enough to fit under the objective lens of the SEM with a minimum of 5 mm working distance. c.) Shall have a computer-controlled driver circuitry to be used as part of an automatic measurement system. d.) Shall have vacuum compatibility. e.) Shall not emit magnetic fields strong enough to noticeably disturb the primary electron beam at 500 eV landing energy. Trade and Service 1. Vendors should include information regarding warranty availability, duration and coverage. 2. The vendor should provide information on their ability to provide application engineering support for the instrument demonstrated, inclusive of response times. Capability statements must demonstrate the minimum requirements outlined above. Please address each in the order listed above. Please provide the follow Business information: 1. DUNS Number 2. Company Name 3. Company Address. 4. Company Point of Contact, phone number and email address 5. Type of company under NAICS, as validated via the System for Award Management (SAM). Additional information on NAICS codes can be found at www.sba.gov. Any potential government contract must be registered on the SAM located at http://www.sam.gov/index.asp. 6. Corporate structure (corporation, LLC, sole proprietorship, partnership, limited liability partnership, professional corporation, etc.); 7. Current GSA Schedules appropriate to this Sources Sought 8. Current Government Wide Agency Contracts (GWACs) 9. Point of Contact, phone number and email address of individuals who can verify the demonstrated capabilities identified in the responses. Interested parties having the capabilities necessary to provide the stated requirements may submit capability statements via email or regular mail to the point of contact listed below. Responses shall be limited to 10 pages. Responses must be received not later than 3:00PM Eastern Time, July 5th, 2016. Capability statements will not be returned and will not be accepted after the due date. Documentation should be emailed to: Christopher.McGucken@nist.gov
- Web Link
-
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- Record
- SN04163609-W 20160629/160627235154-8486f8f896a6f3c840edff5fbb6fb0f4 (fbodaily.com)
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