SOLICITATION NOTICE
66 -- CMOS Based Camera - Combined Synopsis/Solicitation
- Notice Date
- 7/22/2016
- Notice Type
- Combined Synopsis/Solicitation
- NAICS
- 334516
— Analytical Laboratory Instrument Manufacturing
- Contracting Office
- Department of Commerce, National Institute of Standards and Technology (NIST), Acquisition Management Division, 100 Bureau Drive, Building 301, Room B130, Gaithersburg, Maryland, 20899-1410, United States
- ZIP Code
- 20899-1410
- Solicitation Number
- SB1341-16-RQ-0423
- Archive Date
- 8/20/2016
- Point of Contact
- Christopher R. McGucken, Phone: (301)975-8249, Lynda,
- E-Mail Address
-
christopher.mcgucken@nist.gov, lynda.roark@nist.gov
(christopher.mcgucken@nist.gov, lynda.roark@nist.gov)
- Small Business Set-Aside
- N/A
- Description
- Combined Synopsis/Solicitation: CMOS-Based Imaging Camera THIS IS A COMBINED SYNOPSIS/SOLICITATION FOR COMMERCIAL ITEMS PREPARED IN ACCORDANCE WITH THE FORMAT IN FAR SUBPART 12.6-STREAMLINED PROCEDURES FOR EVALUATION AND SOLICITATION FOR COMMERCIAL ITEMS-AS SUPPLEMENTED WITH ADDITIONAL INFORMATION INCLUDED IN THIS NOTICE. THIS ANNOUNCEMENT CONSTITUTES THE ONLY SOLICITATION; QUOTATIONS ARE BEING REQUESTED, AND A SEPARATE WRITTEN SOLICITATION DOCUMENT WILL NOT BE ISSUED. THE SOLICITATION IS BEING ISSUED USING SIMPLIFIED ACQUISITION PROCEDURES UNDER THE AUTHORITY OF FAR PART 13.5 TEST PROGRAM FOR CERTAINCOMMERCIAL ITEMS. This solicitation is a Request for Quotation (RFQ). The solicitation document and incorporated provisions and clauses are those in effect through Federal Acquisition Circular (FAC) 2005-89. BACKGROUND The National Institute of Standards & Technology (NIST) intends to procure a Complementary Metal-Oxide Semiconductor (CMOS)-based imaging camera for an existing FEI Titan transmission electron microscope (TEM). The TEM is located in the Center for Nanoscale Science and Technology (CNST)- NIST's nanotechnology user facility. The TEM currently supports nanofabrication and nanoscale materials research and development conducted by researchers from industry, academia, NIST, and other Government agencies. The TEM is an essential tool to NanoFab users and there is an increasing demand for high resolution imaging, especially at lower electron dose, and for video capture capability. To meet these requirements, a CMOS-based TEM imaging camera is necessary in order to increase NIST's capacity to serve NanoFab users and provide state-of-the-art technical capabilities for acquiring images and diffraction data. The camera will be used to provide higher quality TEM imaging and movie-making for specimens such as those requiring low electron dose, in situ heating experiments, and/or electron diffraction studies. Please see attached document "SB1341-16-RQ-0423.pdf" for full details/description.
- Web Link
-
FBO.gov Permalink
(https://www.fbo.gov/spg/DOC/NIST/AcAsD/SB1341-16-RQ-0423/listing.html)
- Record
- SN04192718-W 20160724/160722234201-61406fc018cbfa57e4c47e18da3d1282 (fbodaily.com)
- Source
-
FedBizOpps Link to This Notice
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