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FBO DAILY - FEDBIZOPPS ISSUE OF AUGUST 10, 2016 FBO #5374
SOLICITATION NOTICE

66 -- Field Emission Scanning Electron Microscope - Attachment C - Past Performance Questionnaire - Package #2 - Attachment F - Pricing Schedule - Attachment D - RFQ Question-Inquiry Submittal Form - SB1341-16-RQ-0652

Notice Date

8/8/2016
 

Notice Type

Combined Synopsis/Solicitation
 

NAICS

334516 — Analytical Laboratory Instrument Manufacturing
 

Contracting Office

Department of Commerce, National Institute of Standards and Technology (NIST), NIST AMD Boulder, 325 Broadway, Boulder, Colorado, 80305, United States
 

ZIP Code

80305
 

Solicitation Number

SB1341-16-RQ-0652
 

Archive Date

9/30/2016
 

Point of Contact

Aron R. Krischel, Phone: 303-497-3032, Chendra Conklin, Phone: 303-497-5628
 

E-Mail Address

aron.krischel@nist.gov, chendra.conklin@nist.gov
(aron.krischel@nist.gov, chendra.conklin@nist.gov)
 

Small Business Set-Aside

N/A
 

Description

SB1341-16-RQ-0652 RFQ for Scanning Electron Microscope Attachment D - RFQ Question/Inquiry Submittal Form Attachment F - Pricing Schedule Attachment B - Experience Project Data Sheet Attachment C - Past Performance Questionnaire The NIST Applied Chemicals and Materials Division (ACMD) houses three Groups whose primary work addresses improving the utility and reliability of engineering materials for varied applications ranging from massive load-bearing structures to high-performance semiconductor components. Critical to that work is the ability to measure the surface topography, internal microscopic structure (microstructure), and elemental make-up of materials over length scales ranging from centimeters to nanometers; the measurements must be performed under conditions ranging from high vacuum to humid environments. Within this context, the Nanoscale Reliability Group develops microscopy methods to advance the broad field of material characterization, including methods based on the measurement foundation of a scanning electron microscope (SEM). NIST has a requirement for one (1) high-resolution, variable pressure field-emission scanning electron microscope (FE-SEM). All quotes are due to Aron Krischel at aron.krischel@nist.gov no later than August 31, 2016 at 3:00 PM (Mountain Standard Time).
 

Web Link

FBO.gov Permalink
(https://www.fbo.gov/notices/ad33ad213976a7924e47fafa6c36ea85)
 

Place of Performance

Address: Manufacture of SEM will be at contractor's facility. Delivery and installation will be at the National Institute of Technology Boulder, CO site., Boulder, Colorado, 80305-2238, United States

Zip Code: 80305-2238
 

Record

SN04213727-W 20160810/160808235201-ad33ad213976a7924e47fafa6c36ea85 (fbodaily.com)
 

Source

FedBizOpps Link to This Notice
(may not be valid after Archive Date)

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