SOURCES SOUGHT
65 -- Plasma Cleaner for Electron Microscopy Applications - Sources Sought Documents
- Notice Date
- 8/12/2016
- Notice Type
- Sources Sought
- NAICS
- 334516
— Analytical Laboratory Instrument Manufacturing
- Contracting Office
- Department of the Army, Army Contracting Command, ACC - APG (W911QX) Adelphi, 2800 POWDER MILL RD, ADELPHI, Maryland, 20783-1197, United States
- ZIP Code
- 20783-1197
- Solicitation Number
- PANAPG16P0000082860
- Archive Date
- 9/3/2016
- Point of Contact
- Jamie N White, Phone: 3013941615
- E-Mail Address
-
jamie.n.white2.civ@mail.mil
(jamie.n.white2.civ@mail.mil)
- Small Business Set-Aside
- N/A
- Description
- Sources Sought Synopsis Plasma Cleaner for Electron Microscopy Applications with the following criteria: 1.Oil-free pumping system. 2.Oil-free pumping system capable of evacuating specimen chambers to below 20 mTorr with no gas flowing into the chamber. 3.One port that shall accept sample holders for a JEOL 2100F transmission electron microscope and be able to plasma clean the two holders simultaneously. 4.Capable of plasma cleaning a sample for a scanning electron microscope having the dimensions of equal to or less than 2 inches in diameter and 1.5 inches in height. 5.A minimum of two mass flow controllers to control the flow of gas precisely and reproducibly. 6.Rated for and be able to control the following gases at 100% concentration with the mass flow controllers and be able to be calibrated for their proper control: argon, nitrogen, oxygen, and hydrogen. 7.Operation controlled using either a capacitively or inductively coupled antenna with a tuning system and operating at a frequency of 13.56 MHz. 8.Operate under either a fixed power or variable power mode such that at the recommended power setting for plasma cleaning of non-polymeric materials, such as metal alloys, ceramics, and composite materials, the sample does not heat the sample more than 5°C or affect it composition when run for 5 minutes with the recommended cleaning parameters, i.e. gas composition, power setting, and pressure. 9.Window to observe the plasma discharge while still maintaining the RF shielding. Desired Optional Salient Characteristics: 1.Storage system for at least three JEOL 2100F TEM sample holders in which the sample holders can be maintained under vacuum conditions after cleaning with the vacuum pumping being done by the vacuum system of the PC. 2.Capable of having a third mass flow controller so that three gasses, O2, H2, and Ar can be used independently or mixed using the flow controllers. 3.Ability to bias an FIB sample held on a holder in the plasma either by self-biasing or external biasing to a negative potential in order to accelerate ions from the plasma towards the FIB sample. 4.Two or more ports that shall accept sample holders for a JEOL 2100F transmission electron microscope and be able to plasma clean the two or more holders simultaneously.
- Web Link
-
FBO.gov Permalink
(https://www.fbo.gov/notices/d9079fc5a620b020620c030e435abb4b)
- Place of Performance
- Address: 321 ColleranRd, Aberdeen Proving Ground MD 21005, Aberdeen Proving Ground, Maryland, 21005, United States
- Zip Code: 21005
- Zip Code: 21005
- Record
- SN04221938-W 20160814/160812234929-d9079fc5a620b020620c030e435abb4b (fbodaily.com)
- Source
-
FedBizOpps Link to This Notice
(may not be valid after Archive Date)
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