SOLICITATION NOTICE
66 -- X-Ray Fluorescence Spectrometer
- Notice Date
- 9/27/2016
- Notice Type
- Presolicitation
- NAICS
- 334516
— Analytical Laboratory Instrument Manufacturing
- Contracting Office
- NASA Stennis Space Center, Office of Procurement, Mail Stop DA00, Stennis Space Center, Mississippi, 39529-6000, United States
- ZIP Code
- 39529-6000
- Solicitation Number
- NNS16594803Q
- Archive Date
- 11/4/2016
- Point of Contact
- Melissa R. Wagner, Phone: 2286881065, Gerald L. Norris, Phone: 2286881718
- E-Mail Address
-
melissa.r.wagner@nasa.gov, gerald.l.norris@nasa.gov
(melissa.r.wagner@nasa.gov, gerald.l.norris@nasa.gov)
- Small Business Set-Aside
- N/A
- Description
- The NASA/SSC Office of Procurement intends to issue a Request for Quote (RFQ) for an Energy Dispersive X-Ray Fluorescence Analyzer equipped with a forced air cooled X-Ray tube containing two anode targets. The analyzer must be capable of providing simultaneous polarized and direct excitation. The analyzer should include a silicon drift detector (SDD) with an active area of 30 mm² or larger. It should also meet all the salient features requested (below). The government intends to issue the RFQ under Simplified Acquisition Procedure of Commercial Items in accordance with Federal Acquisition Regulation (FAR) Parts 12 and 13 and any resulting award will be made in the form of a Firm Fixed Price (FFP) Contract. It is anticipated that only one award will be made for this requirement. The total estimated period of performance or lead-time for delivery for this project is not to exceed 15 weeks after receipt of order (ARO). FOB is destination. It is anticipated that this action will be issued as unrestricted. The NAICS Code and Size Standard are 334516 and 1000 employees respectively. All responsible business sources may submit a proposal, which shall be considered by this agency. The salient characteristics are as followed: SYSTEM PERFORMANCE PARAMETERS • Minimum detection limits (MDL) for iron in oil is 0.5ppm, and the MDL for chlorine and sulfur in oil, < 1ppm; • The ability to analyze and quantify S, Si, Al, Mg, Ti, Cr, V, Mn, Fe, Co, Ni, Cu, Zn, Sn, Mo, Nb, Sn and Pb in various aluminum alloys, stainless steels, nickel or cobalt based alloys and brass/bronze alloys; • X-Ray tube must be combined with an acceptable crystal for monochromatization and polarization of the primary tube spectrum. In addition, direct excitation using multiple anodes in the x-ray tube to optimize excitation conditions is required to maximize sensitivity; • System must be configured with safety devices / interlocks to prevent radiation exposure. The system should allow changing the sample without having to turn off the X-Ray detector; • The optics should be fixed and inverted (samples sits above the X-ray tube and detector); • Sample handling requirements: 12 positions for 32/40mm dia. including any adapters, 52 mm sample plate, sample spinner and sample tray for 40mm samples; • Silicon drift detector with Peltier cooling, spectral resolution < 130 ev for Mn K alpha. Bandpass filter/s are required for improved sensitivity for the elements from potassium to manganese; • PC controlled workstation with flat screen monitor and printer. System should include Windows and an intuitive menu based software to de-convolute or correct for overlapping elemental peaks, material matching, and to perform qualitative and quantitative analysis. The software must be able to control/set the operating and measurement parameters. All IT software and hardware shall be IPv6 compatible; • Software and spectrometer should be able to screen unknown samples for elements from sodium to uranium, also the system shall display overlaid spectra, line markers, regions of interest with statistics, automatic line identification, linear, logarithmic and square root scaling. The system must provide a searchable database with sample data, measurement parameters and with the ability to display/print/export analysis reports; • Spectrometer must be capable of performing measurements in air, vacuum or with a helium purge. Helium purge of the sample chamber is required for excitation and detection of elements that produce low energy (soft) x-rays (sodium, magnesium, aluminum, etc.); • Onsite installation and training /calibration of test methods (4 days minimum); and • Input power 110VAC @ 60 Hz. It is anticipated that Solicitation No. NNS16594803Q will be issued via the Federal Business Opportunities (FedBizOpps) website https://www.fbo.gov on or about October 11, 2016 with responses due NLT 3:00 p.m. on or about October 21, 2016. All questions regarding this acquisition shall be submitted in writing to the Contract Specialist at melissa.r.wagner@nasa.gov (cc: gerald.l.norris@nasa.gov) and not later than 3:00 pm CST on October 7, 2016. An ombudsman has been appointed; the installation Ombudsman is Mr. Kenneth R. Human at ken.r.human@nasa.gov.
- Web Link
-
FBO.gov Permalink
(https://www.fbo.gov/spg/NASA/SSC/OPDC20220/NNS16594803Q/listing.html)
- Place of Performance
- Address: John C. Stennis Space Center, Stennis Space Center, Mississippi, 39529, United States
- Zip Code: 39529
- Zip Code: 39529
- Record
- SN04290207-W 20160929/160927235945-c14f35dc7288b63d64bfb05b525104dc (fbodaily.com)
- Source
-
FedBizOpps Link to This Notice
(may not be valid after Archive Date)
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