SPECIAL NOTICE
66 -- NOTICE OF INTENT TO SOLE SOURCE
- Notice Date
- 2/7/2017
- Notice Type
- Special Notice
- NAICS
- 334516
— Analytical Laboratory Instrument Manufacturing
- Contracting Office
- Department of Commerce, National Institute of Standards and Technology (NIST), Acquisition Management Division, 100 Bureau Drive, Building 301, Room B130, Gaithersburg, Maryland, 20899-1410, United States
- ZIP Code
- 20899-1410
- Solicitation Number
- AMD-17NOI-OPTICFREQ
- Archive Date
- 3/9/2017
- Point of Contact
- Lynda M Horton, Phone: 3019753725, Patrick K Staines, Phone: (301)975-6335
- E-Mail Address
-
Lynda.Horton@nist.gov, patrick.staines@nist.gov
(Lynda.Horton@nist.gov, patrick.staines@nist.gov)
- Small Business Set-Aside
- N/A
- Description
- Notice of Intent The National Institute of Standards and Technology (NIST), Office of Acquisition and Agreements Management (OAAM), Acquisition Management Division (AMD) proposes to enter into a contract on a basis of other than full and open competition for the Physical Measurement Laboratory (PML), Dimensional Metrology Group. NIST intends to negotiate on a sole-source basis with Menlo Systems of Newton, NJ under the statutory authority permitting other than full and open competition, 41 U.S.C. 1901, as implemented by the Federal Acquisition Regulation (FAR) Subpart 13.501, for an Optical Frequency Comb. The mission of the Dimensional Metrology Group is ultra-precise length measurements, the metric for which is interferometry with lasers of known vacuum­ wavelength. An optical frequency comb tied to the global-positioning system allows SI-traceable measurement of vacuum-wavelength for any metrology laser in the range 500 nm to I 050 nm and 1540 nm to 1565 nm. The frequency comb will be used in typical dimensional metrology lab conditions, 20 degC. The comb will typically be used as a reference wavelength to which other metrology lasers can be compared and/or calibrated, ie by using a frequency counter to measure the beat frequency between the comb and the metrology laser Menlo Systems, of Newton, NJ is uniquely qualified to provide the instruments to the PML, Dimensional Metrology Group based upon the following. The optical frequency comb technology and the stabilization thereof are covered by several international patents (e.g. see EU patent EP 1161782, US patent 6,785,303 BI, and Japanese patent JP466842382). Menlo Systems is holding the exclusive rights on the patents. Furthermore, Menlo Systems has, solely in the industry and market, developed an Optical Frequency System that is capable of: a. A high repetition rate (greater than or equal to 250 MHz) is required so that: (I) each tooth of the comb has higher power to sufficient signal-to-noise ratio in the beat frequency measurement, and (2) the integer repetition rate is less ambiguous. If this requirement were not met, additional equipment and setup times would be required to calibrate the vacuum-wavelength of lasers: for example, a wavelength meter or optical spectrum analyzer would be required to resolve the repetition rate ambiguity; to improve the signal-to-noise ratio, a high-power slave laser would have to be side-locked to the laser under test, and then the high-power slave laser would be compared to the comb. Additional equipment and setup times would considerably add to the cost and complexity of performing vacuum-wavelength metrology. b. Emission at 1542 nm wavelength is required so that existing metrology lasers operating at this wavelength (ie, acetylene-stabilized lasers) can be calibrated against the comb. Acetylene-stabilized lasers are an approved method for SI realization of the meter. A large difference in wavelength (as for example, the difference between 1542 nm and 633 nm) is the technical principle behind multiwave­ length interferometers that resolve fringe-order. The Dimensional Metrology Group currently has several measuring instruments that employ multi-wavelength interferometers (such as gage-block and sphere diameter measuring machines). An optical frequency comb that does not have emission at 1542 nm impedes our ability to maintain SI traceability on our measuring machines, and SI traceable measurements of the meter is the core mission of the Dimensional Metrology Group. The North American Industry Classification System (NAICS) code for this acquisition is 334516 with a small business size standard of 1000 employees. A determination by the Government not to compete the proposed acquisition based upon responses to this notice is solely within the discretion of the Government. Information received will be considered solely for the purpose of determining whether to conduct a competitive procurement. No solicitation package will be issued. This notice of intent is not a request for competitive quotations. However, responses received by February 22, 2017 will be considered by the Government.
- Web Link
-
FBO.gov Permalink
(https://www.fbo.gov/spg/DOC/NIST/AcAsD/AMD-17NOI-OPTICFREQ/listing.html)
- Place of Performance
- Address: 100 Bureau Drive, Gaithersburg, Maryland, 20899, United States
- Zip Code: 20899
- Zip Code: 20899
- Record
- SN04394688-W 20170209/170207235810-48d2271e7c7df2ff4b682ed2a7aad9af (fbodaily.com)
- Source
-
FedBizOpps Link to This Notice
(may not be valid after Archive Date)
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