SOLICITATION NOTICE
66 -- Notice of NIST's Intent to Negotiate on Sole Source Basis for microXRF system
- Notice Date
- 7/19/2017
- Notice Type
- Presolicitation
- NAICS
- 334516
— Analytical Laboratory Instrument Manufacturing
- Contracting Office
- Department of Commerce, National Institute of Standards and Technology (NIST), Acquisition Management Division, 100 Bureau Drive, Building 301, Room B130, Gaithersburg, Maryland, 20899-1410, United States
- ZIP Code
- 20899-1410
- Solicitation Number
- SB134117RQ0850
- Archive Date
- 8/15/2017
- Point of Contact
- Grace H. Garrity, Phone: 3019752345
- E-Mail Address
-
grace.garrity@nist.gov
(grace.garrity@nist.gov)
- Small Business Set-Aside
- N/A
- Description
- The National Institute of Standards and Technology (NIST) intends to negotiate on a sole source basis, under the authority of FAR 13.106-1(b) (1), with EDAX. Inc. located at 91 McKee Drive, Mahwah, NJ 07430 to purchase a microbeam X-ray fluorescence (microXRF) spectrometer system The sole source justification is based on the following: NIST requires a microbeam X-ray fluorescence (microXRF) spectrometer system, which is an instrument capable of analyzing X rays fluoresced from a small region of a sample, typically on the order of 10 m to 1 mm across. Each microXRF has five basic components: 1) An X-ray tube (or multiple tubes) 2) A poly-capillary, single capillary optic, or a small collimating optic 3) An X-ray detector (or multiple detectors) 4) A sample stage (X, Y, and Z translation) 5) A magnifying, optical video camera system (for sample positioning and coupling visible images with composition maps). The system shall be able to perform unattended, automated multielement analysis of thousands of programmed locations with high spatial resolution and accuracy, and high sensitivity and repeatability of X-ray detection. Reproducibility of location and sensitivity from sample to sample is also required. The Inorganic Measurement Services Group (646.01) develops test methods for quantitative analyses of a wide range of materials for creation of Standard Reference Materials and for materials research. These test methods are critically evaluated and applied to the needs of stakeholders. One of the primary activities of the group is X-ray fluorescence spectrometry (XRF) for development of standard test methods and certified reference materials, plus research into the fundamental physics of X-ray interactions with matter. To maintain the world-leading capabilities of the group, it is necessary to procure a new spectrometer. The goals of this procurement are to source, procure, install, and qualify a new microXRF spectrometer. Using its current microXRF spectrometer, NIST has qualified dozens of materials and published a number of research papers in support of manufacturing, infrastructure, healthcare, and other endeavors. The Group has developed a measurement process and calculation procedures, including customized software, that rely on specific capabilities of a microXRF spectrometer and operating system software. The cumulative labor required to produce these programs cannot be estimated. The procedures are used on a regular basis for metals, minerals, liquids, polymers, and other materials. It is imperative that NIST acquire a new and reliable microXRF spectrometer and software that will require the minimum amount of revision to existing capabilities, because the staffing level available is not going to increase. NIST requires a microXRF spectrometer to perform homogeneity testing and qualitative elemental analyses of a wide range of materials, both powder and solid forms and having a range of sizes from fraction of a millimeter to tens of centimeters. The spectrometer must consist of a high voltage generator (maximum power output of at least 50 W and also capable of producing stable outputs at voltages settings from 10 kV to 50 kV and current settings from 100 A to 1000 A), rhodium side-window X-ray tube, multiple, interchangeable collimation choices, sample stage subsystem for programmed movements as small as 2 m, a high throughput, semiconductor detector all operated under computer control. The software shall include both spectrometer operations and calibration/calculation capabilities, typically in a database-like environment. NIST Chemical Sciences Division developed its requirements for this microXRF spectrometer from a combination of many years' experience with microXRF and development of novel and unique test procedures for evaluating microscale heterogeneity of and determining recommended minimum sample quantities for certified reference materials. Among the lessons learned are that normal incidence of the primary X-ray beam (that is the exciting X-rays from an X-ray tube) is the optimum arrangement, because it provides the simplest beam shape and the deepest penetration of X rays of a given energy into a given material, and it helps minimize shadowing effects on structures having variegated surface profiles. Related to this is the need to excite with better efficiency, X ray lines having energies greater than 25 keV from higher Z elements such as rare earths, which requires a tube and generator capable of at least 50 kV. Given the very wide range of materials NIST handles and the very wide range of applications for those materials, microXRF beams in the tens of microns size range are necessary, but are sometimes too small. Therefore, 1 mm and 2 mm diameter beams are needed, because benchtop and handheld XRF instruments work at these sizes and may be used on NIST materials. For maximum experimental efficiency, the X-ray beams must be obtained from a single X ray tube to be coaxial, and the beam-producing optical structures must be interchangeable automatically for the best ability to measure a single location with multiple beam sizes. NIST requirements specify one X-ray tube to perform the functions required. Besides the technical reasons above, it represents significant added expense and complexity to maintain two X-ray tubes. Market research, which included the posting of Sources Sought notice NIST-17-MML-SS19 to FBO.gov, has shown that EDAX, Inc. is the only source reasonably available to provide commercial items meeting the requirements of the (below) Statement of Work. The resulting purchase order will be a Firm Fixed Price purchase order. The NAICS Code is 334516 with a size standard of 1,000 employees. No solicitation package will be issued. This notice of intent is not a request for competitive quotations; however, interested parties who regard themselves as capable of fulfilling these requirements are invited to submit responses to the Government for consideration. Responses received by 10:00 AM ET on Monday, July 31, 2017, will be considered by the Government. A determination by the Government not to compete the proposed acquisition based upon responses to this notice is solely within the discretion of the Government. Information received will normally be considered solely for the purpose of determining whether to conduct a competitive procurement. NIST's technical requirements are provided below: SCOPE OF WORK The Contractor shall 1.provide one (1) microXRF spectrometer system that meets the following minimum technical requirements, 2.install the system and any options and accessories at NIST Gaithersburg site in building 227, room A326, 3.provide training in all operation aspects of the spectrometer and any installed options and accessories at NIST Gaithersburg for up to three persons. REQUIRED SPECIFICATIONS Section 1: X-ray Tube and Optics - Minimum specifications The instrument must be designed to use one X-ray tube with selectable optics for three different beam sizes within the instrument housing. 1.The system must have a single rhodium X-ray tube capable of continuous operation at settings up to and including 50 kV and 1 mA for full power operation at 50 W. 2.The generator for X-ray power must be capable of operating at 50 W continuous power with voltage and current settings from 10 kV and 100 microamps to 50 kV and 1 mA. 3.The system must be equipped with three optical components to define measured spot sizes: •one poly-capillary optic providing an X-ray beam diameter at the sample surface of nominally 60 micrometers or smaller, •one collimator optic providing an X-ray beam diameter at the sample surface of 1 mm diameter, and •one collimator optic providing an X-ray beam diameter at the sample surface of 2 mm diameter. a.The polycapillary beam spot must be co-aligned within < 5 m to the cross hair of the coupled optical magnifying camera. b.The X-ray optic arrangement must provide for normal incidence of the X-ray beam on the surface of a flat specimen mounted on the stage table. Normal incidence is defined in the typical manner as being incident on the plane of the surface at a 90° angle regardless of the direction along the plane in which the angle is measured. c.The X-ray optics must be automatically positioned by software control in front of the X ray tube. The interchange of polycapillary and collimator optics shall not require the user to remove or install any optics components. There must be no observable change in the analysis spot size and X-ray flux density with one optic (polycapillary or collimator) before and after switching to another optic and back to the original optic. 4.The optical subsystem shall include a set of five or more interchangeable filters for modification of the X-ray tube output spectrum before it enters the polycapillary or a collimator. The filter set must include one filter specifically chosen for removing the Rh L series characteristic lines from the X-ray tube while minimizing absorption of X-rays from the tube spectral output at energies > 3 keV. Section 2: Stage, Cabinet and Vacuum System 1.The user must be fully shielded from all radiation produced by the X-ray tube or the sample. The chamber must be interlocked such that the X-ray tube is shuttered whenever the chamber is open. 2.The system must provide a vacuum pump for evacuating air from the sample chamber to pressures below 100 Pa. The system must be capable of analyses in both air and vacuum conditions. 3.The motorized stage must be movable in three dimensions with complete software control. The stage must have a travelling distance of at least 100 mm in each of the two horizontal directions (X & Y), and at least 60 mm in the vertical direction (Z). 4.Stage and any mounted sample must be viewable from top down through the instrument software using live color video with at least 2 magnification levels, one at low magnification for navigating across samples and one high magnification view for precise positioning on sample. The video system must have the capability of storing still photos taken from the video cameras plus a video output port for external recording using equipment and/or software supplied by the user. 5.The stage and high magnification video must work in concert with provided software to automatically set, using an autofocus or similar method, the correct vertical height of a sample location to ensure the correct spot X-ray beam size illuminates the sample location. 6.The sample chamber must be equipped with a window for viewing the sample(s) on the stage. 7.The stage must have precision of ± 2 micrometers in the X and Y directions and < ±10 micrometers in the Z direction. 8.Sample chamber and stage must be designed to automatically recognize the presence of a sample close to the x-ray optics and detection system and prevent its impact and damage of such components through some sort of ‘crash protection' system inside the unit. Section 3: X-ray detector hardware 1.The system must be equipped with an energy dispersive X-ray detector aligned to detect fluoresced X rays from the irradiated location of the sample. a.The X-ray detector must be a silicon drift detector (SDD). b.The detector must have 50 mm2 or higher active area. c.When counting at an output count rate of 100,000 counts per second, full width at half maximum (FWHM) of the Mn Kα peak must be 145 eV or better. d.The equipment must include the necessary software and sample(s) to perform energy calibrations of the multichannel analyzer. 2.The system must be equipped with pulse processor electronics paired to the X-ray detector. Section 4: X-ray detector software (single point analysis) 1.The system must include a data analysis and acquisition software package capable of collecting individual X-ray spectra. Additionally, the user must be able to: a.Set the time of the acquisition in live time or real time seconds. The software must be able to adjust the x-ray tube power to achieve a target percent deadtime. b.Identify spectral peaks using an automated algorithm or manually. c.Correct for background effects. d.Save the collected spectra in a format that can be opened in Microsoft Excel. 2.The system must be capable of automating individual point spectrum acquisitions. The user must be able to: a.Manually select up to 20,000 individual stage locations (rather than designating boundaries of an area of interest containing 20,000 locations), store them to a table and perform analyses at selected locations. b.Import up to 20,000 stage locations from a file for automatic analysis. c.Measure and save the data for multiple elements manually or as part of an automated, unattended run. i.At least 16 analytes must identifiable and measurable simultaneously. Analytes consist of different elements or different peaks of the same element ii.A summary/report must be generated after automated runs. Reports must be able to provide the cps, %, etc. for each location, for all elements/peaks analyzed and the X,Y location of those points in a tab delimited text file or a comma separated variable file. Data for each location will be present as a separate row in the file. iii.Spectra generated during an automated run must be able to be saved in raw or processed form, with an example of processing being background fitting. Saving of spectra during automated run should require no user input. iv.Previously measured spectra must be able to be reprocessed, for example adding background fitting or fitting of a different number of analyte peaks than originally identified. Section 5: X-ray detector software (imaging) 1.The system must be capable of collecting a hyperspectral X-ray image. a.A full spectrum (all energy channels) must be saved at each (X,Y) target point. b.The user must be able to select the spectral range stored in the database. c.The user must be able to manually select the scan range dimensions and pixel spacing used to collect the hyperspectral image. d.The software must save the hyperspectral image to disk periodically (after every collection point) so that partial images can be recovered (and resumed) if the system loses power. e.The file output for a hyperspectral x-ray image must be available in a nonproprietary format. 2.The system must be able to save an X-ray map in an image format (.bmp,.jpg,.tiff, etc.) for each element measured. In the case of multiple X-ray lines being measured for a given element, a map must be saved for each measured line. Section 6: Quantitative analysis software 1.The software must be able to convert net elemental counts in an X-ray spectrum into compositional values. The user must be able to select the method used to determine the compositional values, and those methods must include: a.A standardless "Fundamental Parameters" method b.A single standard scaling method c.Multiple standards based quantitative analysis (i.e. calibration curve methods, e.g. polynomial fit). d.Software shall allow analytes to be defined as elements or as user-defined compounds. Unanalyzed elements and compounds shall be accommodated. Section 7: Computer The computer running the software and controlling the spectrometer shall be a desktop design running Windows 7 or a newer (Windows 7 preferred) Microsoft operating system. The computer shall be equipped with the following attributes and accessories (at a minimum): a.3 GHz or faster processor with a minimum of 4 cores and 8 MB cache b.16 GB or more installed RAM c.1 TB or larger primary hard drive d.2 TB or larger secondary hard drive for backups of data and XRF software, may be external drive e.standalone discrete video card with a minimum of 1 GB of onboard memory f.one 21" or larger color monitor g.multiple USB 2.0 and 3.0 ports h.multiple display ports i.RJ45 network port j.keyboard and mouse, prefer wired versions k.color inkjet (or similar) printer capable of photo quality output Contractor may supersede the above computer specifications due to software or spectrometer technical requirements. Section 8: Other requirements 1.In instances where proprietary file types are used to store X-ray data or instrumental parameters, the Contractor must provide either: a.adequate documentation (such as a pdf or word document describing the data encoding structure) to enable NIST to produce a program capable of reading the file and recovering all data and metadata contained therein, or b.software to convert or use file types that are open source (such as tab-delimited text or comma separated variable) or documented by common trade organizations (such as the NIST Lispix Raw format or the MSA file format) Documentation provided as part of this requirement must not require any NIST employee to sign a non-disclosure agreement of any kind. 2.Software upgrades must be provided free of charge if any new versions are introduced within 365 days of placing the order for the spectrometer. 3.The system must include an operations and maintenance manual (hard copy and/or electronic (pdf) file format) covering proper operation, routine maintenance, and troubleshooting for the instrument and controlling software. A service manual shall be provided, if available. 4.Equipment should include a supply of consumable items sufficient for operation and preventative maintenance during the warranty period. 5.All equipment must be new. Used or remanufactured equipment is not acceptable. 6.NIST requires that the system be supplied ready for use with United States standard electrical power. If transformers are required for operation with U.S. standard electrical power, such transformers and line conditioners shall be included with the system. Option Line Items The following are option line items. Quoters must provide a firm-fixed price for all option line items. The Government may exercise one or more of the option line items, at its discretion, at the time of award and/or at any time within 12 months from the date of award of the initial contract or of a prior option, in the case of maintenance agreements. Section 9: Optional maintenance agreements Contractor shall specify maintenance agreement choices and prices for up to three years beyond warranty expiration. 9.1 Option for purchase of one-year maintenance agreement covering spectrometer and any installed options and support equipment at end of warranty period. 9.2 Option for purchase of one-year maintenance agreement covering spectrometer and any installed options and support equipment upon expiration of item 9.1. 9.3 Option for purchase of one-year maintenance agreement covering spectrometer and any installed options and support equipment upon expiration of item 9.2. Section 10: Additional Optional Line Items 10.1 Additional Software Licenses: The contractor shall supply a minimum of two software licenses (with dongles, if required) for NIST staff to use the software of the microXRF on other computers. Installation The Contractor shall install the instrument in Building 227, room A326 at NIST Gaithersburg, MD. Installation shall include, at a minimum, uncrating/unpacking of all equipment, set-up and hook-up of all equipment, start-up, demonstration of specifications, and removal of all trash. The instrument must meet all required specifications identified above upon completion of installation. Qualified personnel shall install the system and perform all activities necessary to ensure the system is fully functional and meets all required specifications and performance metrics (see Acceptance Testing). Installation must take place during normal business hours, between 8:30 am and 5:00 pm Eastern Time, Monday through Friday except Federal Holidays, and must be coordinated with the NIST Technical Point of Contact (TPOC). Training The Contractor shall schedule and facilitate training for three (3) NIST personnel, on-site at NIST Gaithersburg. The training shall provide a thorough demonstration of all equipment functions, equipment operation and basic troubleshooting. The training may be completed on-site at NIST immediately after successful completion of installation and demonstration of specifications, but no later than 45 days after completion of installation. Warranty The Contractor shall provide, at a minimum, a one-year warranty that must include unlimited telephone/e-mail support for questions regarding operation. This warranty must cover non-consumable parts and travel/labor on-site, should this become necessary within the warranty period. The warranty shall commence upon successful completion of delivery, installation, training and demonstration of all required specifications. The warranty must cover all defects in materials and workmanship for a period of one year from the date of final acceptance by the Government. Acceptance Testing/Inspection The following qualification measurements and analysis must be provided and performed by contractor representatives during the acceptance process onsite at NIST following installation: 1.Resolution as calculated at the Mn Kα peak shall be determined using contractor supplied artifact and shall be equal to or better than contractor specifications. 2.Spectrometer stability shall be demonstrated by the collection of at least 1000 measurements of a single location on a glass SRM 610 sample provided by NIST, using the polycapillary optic. Stability shall be deemed acceptable if the relative standard deviations of net count rates from major and minor elements are less than or equal to two times the relative counting statistical errors. 3.X-ray beam spot-sizes (polycapillary and collimators) shall be measured at NIST using an imaging reference artifact, provided by NIST or the contractor and demonstrated to be as specified. This artifact will also be used to show the X-ray beam and video cameras are coaligned. 4.Repeatability of measurement with each optic after repositioning, using a fixed location on a sample of SRM 610. Repeatability shall be deemed acceptable if the relative standard deviation of 10 measurements is no more than 10 % greater than the value of repeatability standard deviation from step 2 above. 5.A full, hyperspectral X-ray image will be acquired and the subsequent data will be saved in an open source format. 6.Fundamental parameters method operation shall be successfully demonstrated by analysis of a NIST provided glass SRM for major and minor constituents. PERIOD OF PERFORMANCE Delivery, installation and training shall be completed not later than 165 days from the date of award. PLACE OF PERFORMANCE All work shall be completed at the Contractor's facility. Installation of the instrument and training shall be accomplished at NIST, Gaithersburg, Maryland.
- Web Link
-
FBO.gov Permalink
(https://www.fbo.gov/spg/DOC/NIST/AcAsD/SB134117RQ0850/listing.html)
- Place of Performance
- Address: 100 Bureau Drive, Gaithersburg, Maryland, 20899, United States
- Zip Code: 20899
- Zip Code: 20899
- Record
- SN04586069-W 20170721/170719235107-b97f4d5aae2203045396374d4d1cf805 (fbodaily.com)
- Source
-
FedBizOpps Link to This Notice
(may not be valid after Archive Date)
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