SOURCES SOUGHT
66 -- Variable Temperature Scanning Tunneling Microscope (VT-STM)
- Notice Date
- 12/28/2017
- Notice Type
- Sources Sought
- NAICS
- #334516
— Analytical Laboratory Instrument Manufacturing
- Contracting Office
- Department of Commerce, National Institute of Standards and Technology (NIST), Acquisition Management Division, 100 Bureau Drive, Building 301, Room B130, Gaithersburg, Maryland, 20899-1410, United States
- ZIP Code
- 20899-1410
- Solicitation Number
- AMD-SS18-04
- Archive Date
- 1/27/2018
- Point of Contact
- January Magyar, Phone: 3019755442
- E-Mail Address
-
january.magyar@nist.gov
(january.magyar@nist.gov)
- Small Business Set-Aside
- N/A
- Description
- Contracting Office Address: Department of Commerce, National Institute of Standards and Technology (NIST), Acquisition Management Division, 100 Bureau Drive, Building 301, Room B117, Mail Stop 1640, Gaithersburg, MD, 20899-1640 Background: The National Institute of Standards and Technology (NIST) seeks information on commercial vendors that are capable of providing a variable temperature scanning tunneling microscope (VT-STM) for use in developing capabilities of fabricating atomic scale devices based on atomically precise lithography and selective dopant placement. The VT-STM is required to perform in-situ device fabrication and characterization with a large scan range, low thermal drift and high tunneling stability. After market research results are obtained and analyzed, minimum requirements specifications for a variable temperature scanning tunneling microscope will be established. NIST may use these established specifications in conducting a competitive procurement and subsequently award a Purchase Order in the future. If a minimum of two (2) qualified small businesses are identified during market research stage, then any resulting competitive procurement may be considered for a small business set-aside. Requirements: NIST is seeking responses from all responsible sources, including large, foreign, and small businesses. Small businesses are defined under the associated NAICS code for this effort, 334516, as those domestic sources with 1,000 employees or less. Please include your company's size classification and socio-economic status in any response to this notice. Product Requirements: • Atomic resolution on Au(111) at all accessible temperatures. Z-resolution <10pm. Thermal drift <10 Angstrom/hour at thermal equilibrium. Must be demonstrated and referenced. • Eddy current damping system for high stability & low sensitivity against environmental effects. • Independent 3D guided tip course positioning of 10mm by 10mm by 10mm, no cross talk between axes. Tip coarse re-approach: <60nm lateral shift for >5 mm coarse travel. • An upgrade for QPlus AFM shall be available. • An upgrade for low temperature STM operation down to 25K shall be available. • Scan range: XYZ=10umx10umx1.5um (300K). • Open stage design for additional cabling and mounting provisions for specific experiments. • Sample reception stage fully compatible and interchangeable with Omicron direct current heating sample holder, Omicron 4 electrical contacts sample holder, and Omicron Standard sample plate. Samples may be electrically connected by wire bonding. • Fully compatible and interchangeable with Omicron STM tip carrier and tip holder. Remote controlled in-situ tip exchange at room temperature. • Optical Access: at least four optical ports with exchangeable IR-blocked quartz windows for optical experiments and in-situ sample/tip handling via CCD camera observation. Includes CCD camera with light source and macro zoom lens for monitoring tip approach. • In-situ evaporation access: at least two front ports for in-situ evaporation. Can be alternatively employed for the use of a long distance optical microscope for micrometer scale probe navigation. 25 degrees incident angle or better. • A piezo inertia drive that allows the same sample area to be relocated and imaged even after the sensor has been retracted during evaporation. • STM chamber: room temperature parking stage for 12 samples/tips. Sample transfer in the STM stage via wobble stick, including port aligner for alignment of the VT STM. • The integrated STM and stage must have bake-out temperature of 145 Celsius or higher. UHV system includes a fast entry chamber with magnetically coupled transporter and gate valves. Fully bakeable. Full Ultra-high vacuum design. • Compatible and interchangeable with Omicron SCALA/Matrix SPM control system is a requirement and a highly weighted factor. • Preamplifier: IV-converter with integrated capacitive compensation. Switchable gain at the first stage of the I/V converter. Software controlled switchable feedback resistor with current ranges of 3nA/330nA. Offset compensation for STM at true current of 1pA. Pre-amplifier noise floor: 5 fA/sqrtHz or lower. • SPM control system: Fully digital SPM control system. Includes full data acquisition and experiment control software. Functionalities include scripting, atom manipulation, and dedicated STS functions. Low noise digital boards for scan generation, regulation and data acquisition. Regulator with true 20-bit resolution over the full z-scanner range without range switching and is monotonic within 1 LSB (Least Significant Bit). Dynamic resolution of 24 bit in z-imaging possible. Minimum of 24 internal plus 6 external measurement channels and external inputs for gap voltage. Can be upgraded for AFM operation. • Complete STM control system; ultra-integrated, user-configurable, fully digital and programmable for field emission lithography patterning and versatile spectroscopy tasks. Data analysis software package: Offline data analysis and processing. Automatic Drift Compensation capability: virtually eliminates sample drift using image correlation techniques. • Digital temperature controller with PID control function, auto-tuning algorithm, IEEE-488 and USB interface and alarm functions. • No modified products or prototype products will be acceptable. • Minimum of 30 installed units with references and proven performance with strong preference give for ease of US technical and marketing support. Instruction to Responders: Companies that are capable of providing this variable temperature scanning tunneling microscope (VT-STM) are requested to email a detailed report describing their abilities to January.magyar@nist.gov no later than the response date for this sources sought notice. The report should include achievable specifications and any other information relevant to your product or capabilities. Also, the following information is requested to be provided as part of the response to this sources sought notice: 1. Name of the company(s) that offer the required supply. In addition, provide a point of contact for the company(s). 2. Indication of number of days, after receipt of order that is typical for delivery. 3. Interested vendors shall address their capability of providing Original Equipment Manufacturer (OEM) parts. 4. Any other relevant information that is not listed above which the Government should consider in developing its minimum specifications and finalizing its market research.
- Web Link
-
FBO.gov Permalink
(https://www.fbo.gov/spg/DOC/NIST/AcAsD/AMD-SS18-04/listing.html)
- Record
- SN04777307-W 20171230/171228230739-f533eb55375db9afffc31be9e6fa3b84 (fbodaily.com)
- Source
-
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