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FBO DAILY - FEDBIZOPPS ISSUE OF JULY 01, 2018 FBO #6064
MODIFICATION

66 -- Atomic Force Microscope - Solicitation 1

Notice Date
6/29/2018
 
Notice Type
Modification/Amendment
 
NAICS
334516 — Analytical Laboratory Instrument Manufacturing
 
Contracting Office
NASA/Goddard Space Flight Center, Code 210.M, Greenbelt, Maryland, 20771, United States
 
ZIP Code
20771
 
Solicitation Number
80GSFC18R0049
 
Point of Contact
Timothy Lazatin, Phone: 3012869129
 
E-Mail Address
timothyjames.s.lazatin@nasa.gov
(timothyjames.s.lazatin@nasa.gov)
 
Small Business Set-Aside
N/A
 
Description
SOW NASA/GSFC has a requirement for an Atomic Force Microscope (AFM) GSFC Detector Development Laboratory (DDL). The system is used to characterize the geometry and other physical properties of nanoscale structures built in the DDL. The system is suitable for characterizing thin-films on substrates up to 200 mm in diameter. It shall include all necessary software and hardware to enable microscope control and data analysis. The vendor shall provide equipment technical support. NASA/GSFC intends to purchase the items from Bruker Nano, Inc. located at 112 Robin Hill Road, Goleta, CA 93117. Bruker Nano, Inc. is the only known source that can provide an atomic force microscope (Dimension ICON) that meet the technical requirements of the DDL. The Bruker's AFM system is the only system that h as a standard, patented, general purpose AC imaging mode that 1) automatically optimizes critical imaging parameters including setpoint, gains, scan rate and Z limit; 2) automatically optimizes these imaging parameters whether imaging in air or in liquids; 3) does not require that the cantilever resonance be "tuned"; 4) has conventional imaging rates (<10 minutes per image); 5) directly controls the tip-sample imaging force down to at least 50 pN; 6) automatically compensates for drift of the deflection signal. Additionally, only the Dimension ICON offers standard AFM operating modes such as Peak force tapping which controls the peak force of the cantilever tip of under 20 pN, as well as to extract sample parameters such as adhesion force and film modulus (1 MPa- 50 GPa). The Government does not intend to acquire a commercial item using FAR Part 12. Interested organizations may submit their capabilities and qualifications to perform the effort in writing to Timothy Lazatin at Timothyjames.s.lazatin@nasa.gov no later than 2:00 pm EST on July 16, 2018. Such capabilities/qualifications will be evaluated solely for the purpose of determining whether or not to conduct this procurement on a competitive basis. A determination by the Government not to compete this proposed effort on a full and open competition basis, based upon responses to this notice, is solely within the discretion of the government. Oral communications are not acceptable in response to this notice. All responsible sources may submit an offer which shall be considered by the agency. NASA Clause 1852.215-84, Ombudsman, is applicable. The Center Ombudsman for this acquisition can be found at http://prod.nais.nasa.gov/pub/pub_library/Omb.html.
 
Web Link
FBO.gov Permalink
(https://www.fbo.gov/notices/e134105ccd40ca5cf35951181cbeed9f)
 
Record
SN04974715-W 20180701/180629231009-e134105ccd40ca5cf35951181cbeed9f (fbodaily.com)
 
Source
FedBizOpps Link to This Notice
(may not be valid after Archive Date)

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